Monochromators for High-Energy Synchrotron Radiation

2001 ◽  
Vol 215 (11) ◽  
Author(s):  
P. Suortti ◽  
T. Buslaps ◽  
V. Honkimäki ◽  
M. Kretzschmer ◽  
M. Renier ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Permanent Magnet ◽  
Energy Band ◽  
High Energy ◽  
Energy Distributions ◽  
X Ray ◽  
Wavelength Shifter ◽  
X Ray Scattering ◽  
Radiation Sources ◽  
Ray Scattering

Several monochromators, which are based on the use of cylindrically bent perfect Si crystals, have been constructed at the High Energy X-ray Scattering beamlines of the ESRF. The monochromators provide different focusing conditions, and the energy band-passes are optimized for the needs of different experiments. Formulas are given for calculation of the focal distances, reflectivity curves, and energy distributions. The lay-out of the beamlines follows the Troika concept, where the radiation fan is either split in 3 beams, or the central beam is utilized successively by semi-transparent monochromators to serve three experimental stations simultaneously. The radiation sources are a 7-period permanent magnet asymmetric wiggler and a superconducting wavelength shifter. The critical energies are 45 keV and 96 keV, respectively. The lowest operation energy is 30 keV, and transmission type monochromators have been used up to 1 MeV photon energies. Typical X-ray flux at the sample is 10

Cyclic topology effects on the morphology of biocompatible and environment-friendly poly(ε-caprolactone) under nanoscale film confinement

2020 ◽  
Vol 11 (28) ◽  
pp. 4630-4638 ◽  
Author(s):  
Li Xiang ◽  
Wonyeong Ryu ◽  
Jehan Kim ◽  
Moonhor Ree
Keyword(s):  
Synchrotron Radiation ◽  
Grazing Incidence ◽  
Film Morphology ◽  
Environment Friendly ◽  
X Ray ◽  
X Ray Scattering ◽  
Radiation Sources ◽  
First Time ◽  
Ray Scattering

Quantitative grazing incidence X-ray scattering analysis combined with X-ray reflectivity using synchrotron radiation sources was explored for the first time cyclic topology effects on the nanoscale film morphology of poly(ε-caprolactone).

X-Ray Scattering from Nonideal Czochralski Silicon Crystals for High Energy Synchrotron Radiation

1997 ◽  
Vol 36 (Part 1, No. 5A) ◽  
pp. 2792-2799 ◽  
Author(s):  
Hitoshi Yamaoka ◽  
Shunji Goto ◽  
Yoshiki Kohmura ◽  
Tomoya Uruga ◽  
Masahisa Ito
Keyword(s):  
Synchrotron Radiation ◽  
High Energy ◽  
X Ray ◽  
Czochralski Silicon ◽  
Silicon Crystals ◽  
X Ray Scattering ◽  
Ray Scattering

Time-Resolved Small-Angle X-ray Scattering Combined with Wide-Angle X-ray Scattering

1997 ◽  
Vol 30 (5) ◽  
pp. 816-821 ◽  
Author(s):  
W. Bras ◽  
A. J. Ryan
Keyword(s):  
Synchrotron Radiation ◽  
Small Angle ◽  
Beam Quality ◽  
Third Generation ◽  
Wide Angle ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Radiation Sources ◽  
Ray Scattering

The high X-ray intensity of synchrotron radiation (SR) beamlines makes it possible to perform time-resolved small-angle X-ray scattering (SAXS) experiments. The information that can be obtained by collecting the wide-angle diffraction pattern simultaneously not only increases the information content of an experiment but also increases the reliability of the time-correlations between SAXS and WAXS (wide-angle X-ray scattering) patterns. This is a great advantage for experiments with a time resolution below the level of 1 s per frame. With appropriate instrumentation, this is a time domain that is routinely accessible for a large group of research fields. This has had a considerable impact upon the understanding of fundamental aspects of phase transformations. Not only fundamental processes but also more applied fields have benefited from these developments. In polymer research this has led to a situation in which it has become possible to simulate materials processing techniques on-line. With the advent of third-generation synchrotron-radiation sources (e.g. ESRF, APS, Spring8), it has become possible to develop SAXS/WAXS beamlines that will open up new research opportunities by utilizing the higher intensity, the tuneability and the higher collimation offered by these SR sources. However, some of the instrumentation limits in detector and sample environments that have become apparent in research on second-generation synchrotron-radiation sources still have not been appropriately addressed, which means that in some fields it will not be possible to take full advantage of the superior X-ray beam quality that third-generation synchrotrons can offer. A way in which these instrumentation limits can be overcome is discussed, and the instrumentation for a new bending-magnet beamline at the ESRF is used as an example.

Mirror to measure small angle x-ray scattering signal in high energy density experiments

2020 ◽  
Vol 91 (12) ◽  
pp. 123501
Author(s):  
M. Šmíd ◽  
C. Baehtz ◽  
A. Pelka ◽  
A. Laso García ◽  
S. Göde ◽  
...  
Keyword(s):  
Energy Density ◽  
Small Angle ◽  
High Energy ◽  
High Energy Density ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Signal ◽  
Ray Scattering

scholarly journals Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Synchrotron Radiation ◽  
Small Angle ◽  
Polymer Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Nondestructive Characterization ◽  
Ray Scattering

A multi-length-scale USAXS/SAXS facility: 10–50 keV small-angle X-ray scattering instrument

2013 ◽  
Vol 46 (5) ◽  
pp. 1508-1512 ◽  
Author(s):  
Byron Freelon ◽  
Kamlesh Suthar ◽  
Jan Ilavsky
Keyword(s):  
Small Angle ◽  
Soft Matter ◽  
High Energy ◽  
X Rays ◽  
X Ray ◽  
X Ray Scattering ◽  
Wide Range ◽  
And Performance ◽  
New Facility ◽  
Ray Scattering

Coupling small-angle X-ray scattering (SAXS) and ultra-small-angle X-ray scattering (USAXS) provides a powerful system of techniques for determining the structural organization of nanostructured materials that exhibit a wide range of characteristic length scales. A new facility that combines high-energy (HE) SAXS and USAXS has been developed at the Advanced Photon Source (APS). The application of X-rays across a range of energies, from 10 to 50 keV, offers opportunities to probe structural behavior at the nano- and microscale. An X-ray setup that can characterize both soft matter or hard matter and high-Zsamples in the solid or solution forms is described. Recent upgrades to the Sector 15ID beamline allow an extension of the X-ray energy range and improved beam intensity. The function and performance of the dedicated USAXS/HE-SAXS ChemMatCARS-APS facility is described.

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