Morphological Properties of Hyperbranched Compound Containing Pyrrole Units

2015 ◽  
Vol 1767 ◽  
pp. 107-111
Author(s):  
Lioudmila Fomina ◽  
Jorge Godínez Sánchez ◽  
José A. Olivares ◽  
Fabio L. Cuppo Sant´Anna ◽  
Luis E. Sansores ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Optical Microscopy ◽  
Crystalline Structure ◽  
Morphological Properties ◽  
Soluble Phase ◽  
One Step ◽  
Two Phases ◽  
Step Polymerization ◽  
Scanning Electron

ABSTRACTHyperbranched structures containing pyrrole units were obtained from ortho-, meta- and para-diaminodiphenyldiacetylenes as AB2 type monomers by one-step polymerization.The para-hyperbranched compound was observed by optical microscopy and scanning electron microscopy.Microscopy studies identify two phases. The first is the insoluble one which gives origin to flake type structures. The second is acetone soluble phase, which generated crystalline structure manifesting in optic anisotropy and rhomboids and triangles dendrimeric structures.

Digital imaging: When should one take the plunge?

1996 ◽  
Vol 54 ◽  
pp. 602-603
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Optical Microscopy ◽  
Digital Imaging ◽  
Storage Devices ◽  
Major Benefit ◽  
Transmission Electron ◽  
New Instrument ◽  
Scanning Electron

The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quaity positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and extremely compact storage (removable 5.25” storage devices which now can hold up to several gigabytes of data).The problem for many researchers, however, is that they have perfectly serviceable microscopes that they routinely use that have no digital imaging capabilities with little hope of purchasing a new instrument.

Photoelectric Response of Self Assembled Films of Bacterio-Rhodopsin Purple Membrane Integrated on Silicon

2003 ◽  
Vol 774 ◽  
Author(s):  
D. Ricceri ◽  
G. Scicolone ◽  
O. Di Marco ◽  
S. Conoci ◽  
B. Pignataro ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Light Exposure ◽  
Scanning Force Microscopy ◽  
Purple Membrane ◽  
Morphological Properties ◽  
Force Microscopy ◽  
Scanning Force ◽  
Scanning Electron ◽  
Tungsten Lamp

AbstractBacterio-rhodopsin purple membrane (PM) thin films have been prepared by selfassembling (SA) technique. Morphological properties of the layers were inspected by Scanning Electron Microscopy (SEM) and Scanning Force Microscopy (SFM) highlighting the presence of densely packed PM films. Reflectance Uv-vis spectra on these films revealed the typical bR absorption at 570 nm. By using a tungsten lamp illuminations (250-350 mW) chopped at 0.5Hz, photoelectric responses were detected. Differential (light-on and light-off) photocurrent signals of up to 1 μA/cm2 were obtained upon light exposure.

Investigation of Die Tilting of Packages with Single and Multi-chips

2018 ◽  
Author(s):  
Lo Chea Wee ◽  
Tan Sze Yee ◽  
Gan Sue Yin ◽  
Goh Cin Sheng
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Beam ◽  
Optical Microscopy ◽  
Device Performance ◽  
Electronic Components ◽  
Area Of Interest ◽  
On Chip ◽  
Scanning Electron

Abstract Advanced package technology often includes multi-chips in one package to accommodate the technology demand on size & functionality. Die tilting leads to poor device performance for all kinds of multi-chip packages such as chip by chip (CbC), chip on chip (CoC), and the package with both CbC and CoC. Traditional die tilting measured by optical microscopy and scanning electron microscopy has capability issue due to wave or electron beam blocking at area of interest by electronic components nearby. In this paper, the feasibility of using profilemeter to investigate die tilting in single and multi-chips is demonstrated. Our results validate that the profilemeter is the most profound metrology for die tilting analysis especially on multi-chip packages, and can achieve an accuracy of <2μm comparable to SEM.

The External Morphology of the Eggs of Culex (Culex) saltanensis (Diptera: Culicidae) Under Scanning Electron Microscopy

2020 ◽  
Author(s):  
J R Santos-Mallet ◽  
T D Balthazar ◽  
A A Oliveira ◽  
W A Marques ◽  
A Q Bastos ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Optical Microscopy ◽  
Osmium Tetroxide ◽  
Neotropical Region ◽  
External Morphology ◽  
Metal Supports ◽  
Scanning Electron

Abstract The aim of the present study was to describe the morphology of the eggs of Culex (Culex) saltanensis Dyar that occurs in the Neotropical region. Eggs of the Cx. (Cux.) saltanensis were collected at the Mata Atlântica FIOCRUZ campus, fixed in 1% osmium tetroxide, prepared for mounting on metal supports, observed under a scanning electron microscope, and described morphologically. The eggs had a coniform shape with a length of approximately 0.5 mm (505–510 µm) and a width in the median portion of 117 µm (113–123 µm). Upper portion is lined with tubers of irregular shape and varying sizes (0.64–1.31 µm), located on a cross-linked matrix forming bands observed under optical microscopy. The micropyle is encased in a necklace of approximately 6.6-µm plates arranged in a flower-like shape. Comparing Cx. (Cux.) saltanensis eggs with several species of different genera, important divergent characteristics can be observed. However, this study points to the need for new descriptions of eggs of species belonging to the same subgenus in order to analyze if there will be differences between them. Culex (Cux.) saltanensis eggs have particular characteristics not observed in eggs of other Culicidae genera.

Damage Analysis of Heat Resistant Steels

2007 ◽  
Vol 537-538 ◽  
pp. 303-306
Author(s):  
Tamás Bíró ◽  
László Dévényi
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Optical Microscopy ◽  
Damage Analysis ◽  
Resistant Steel ◽  
Heat Resistant Steel ◽  
Advantages And Disadvantages ◽  
Heat Resistant ◽  
Heat Resistant Steels ◽  
Scanning Electron

This paper shows the result of some metallographical examinations that have been carried out on low-alloyed Cr-Mo-V heat resistant steel. The aim of this research is to present and compare the advantages and disadvantages of the mainly applied metallographical methods. These techniques are optical microscopy, scanning electron microscopy, replica method and special applications of these methods. We have proved that using the investigated methods together gives much more information about the lifetime of the specimen than using these techniques particularly.

Effects of Delta - Ferrite Content on the Integrity of Reactor Vessel Cladding

2010 ◽  
Author(s):  
Ho-Sang Shin ◽  
Jin-Ki Hong ◽  
Koo-Kab Chung ◽  
Hae-Dong Chung ◽  
Gwang-Yil Kim ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Reactor Vessel ◽  
Bending Test ◽  
Ferrite Content ◽  
Delta Ferrite ◽  
Bending Tests ◽  
Asme Code ◽  
Two Phases ◽  
Scanning Electron

As the design life of new nuclear power plant increases, the austenitic stainless cladding integrity of reactor vessel becomes one of the new concerns. Since 1970’s, there have been some specific recommendations on delta ferrite content of austenitic cladding of reactor vessels and welds. It has been known that the delta ferrite is beneficial for reducing micro-fissure in welds, though the high delta ferrite content increases the probability of embrittlment of welds. In this study, the mechanical and microstructural properties of austenitic weld metals with the limit values of the recommended range (5 ∼ 18 FN) of the delta ferrite control on low alloy steels were characterized by using bending test and scanning electron microscopy. The base metal was ASME Code Sec. II specification SA 508 Gr. 3 Cl. 1 plate and weld materials were EQ308L and EQ309L strips. Four kinds of cladding were deposited with submerged arc welding process on SA508 cl.3 plates. The bending tests were performed through ASME code Sec. IX and the microstructure of fractured surfaces was analyzed by scanning electron microscopy (SEM). In bending tests, there were no fractures except the highest delta ferrite content specimens (28FN). From the SEM observation of fractured surfaces, cracks initiated from the interface between austenite and ferrites phases in the cladding layer and propagated through the continuous interfaces between two phases. For specimens without continuous interfaces of two phases, though the cracks were observed in the interface of phases, the propagation of cracks was not observed. From the test results, continuous interfaces between austenite matrix and ferrite phase provide the path for crack propagation. And the delta ferrite content affects the integrity of cladding of reactor vessel.

scholarly journals Digital Imaging: When Should One Take The Plunge?

1997 ◽  
Vol 5 (4) ◽  
pp. 14-15
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Optical Microscopy ◽  
Digital Imaging ◽  
High Quality ◽  
Storage Devices ◽  
Major Benefit ◽  
Transmission Electron ◽  
Scanning Electron

The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quality positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and extremely compact storage (removable 5.25” storage devices which now can hold up to several gigabytes of data).

Identification of Nd163 phase in melt-textured NdBa2Cu3O7−δ bulk samples

2003 ◽  
Vol 18 (9) ◽  
pp. 2050-2054 ◽  
Author(s):  
Marcello Gombos ◽  
Vicente Gomis ◽  
Anna Esther Carrillo ◽  
Antonio Vecchione ◽  
Sandro Pace ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Optical Microscopy ◽  
Room Temperature ◽  
Polarized Light ◽  
Energy Dispersive ◽  
X Ray ◽  
Spontaneous Formation ◽  
The Stability ◽  
Scanning Electron

In this work, we report on the observation of Nd1Ba6Cu3O10,5 (Nd163) phase of the NdBaCuO system in melt-textured Nd123 bulk samples grown from a mixture of Nd123 and Nd210 phase powders. The observation was performed with polarized light optical microscopy and scanning electron microscopy–energy dispersive x-ray analyses. Images of the identified phase crystals show an aspect quite different from Nd422 crystals. Unexpectedly, Nd163 was individuated, even in “pure” Nd123 samples. Moreover, after long exposure to air, Nd163 disappeared completely in samples synthesized from powders containing Nd210. Thermogravimetry analyses of powders show that the stability of this phase in air is limited to temperatures higher than 900 °C, so Nd163 is unstable and highly reactive at room temperature. Moreover, an explanation of the observation of Nd163 in Nd210 free samples, based on the spontaneous formation of Nd163 phase in a Nd123 melt, is proposed.

Determination of cotton fiber maturity and linear density (fineness) by examination of fiber cross-sections. Part 2: A comparison optical and scanning electron microscopy

2014 ◽  
Vol 84 (18) ◽  
pp. 1939-1947 ◽  
Author(s):  
Geoffrey RS Naylor ◽  
Margaret Pate ◽  
Graham J Higgerson
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Cell Wall ◽  
Optical Microscopy ◽  
Cross Sections ◽  
Linear Density ◽  
Wall Area ◽  
Density Values ◽  
Fiber Maturity ◽  
Scanning Electron

Previous researchers established a set of reference cottons with known fiber maturity and linear density (fineness) values based on the analysis of a large number of individual transverse fiber cross-sections viewed under the optical microscope. Part 1 identified that the limited optical resolution of the captured images may be the source of a significant systematic error in the assigned values of cell wall area and hence fiber maturity and linear density values. In this paper the optical microscopy technique was implemented. Individual cross-sections were measured using this approach and also higher resolution and higher magnification images were obtained using scanning electron microscopy. It was found that the data obtained from optical microscopy were similar to the SEM data, with the perimeter being 2% smaller, the cell wall area being 6% larger and the maturity ratio values being 8% higher. It was concluded that the combined approach of utilizing SEM in conjunction with optical imaging is a useful approach for verifying and perhaps correcting the data obtained from optical imaging. Further the SEM images highlighted that the current experimental protocol does not adequately address the challenge of ensuring that the fibers are mounted normal to the plane of cutting the transverse cross-section. Modeling demonstrated that while maturity ratio values are relatively insensitive to this misalignment, measured cell wall area values and hence fiber linear density values will be overestimated. This may be the major source of error associated with the technique and warrants further attention in future studies.

Effect of KBF4 Addition on the Microstructure of Mg-6Zn-1Si Alloy

2012 ◽  
Vol 535-537 ◽  
pp. 996-999 ◽  
Author(s):  
Bao Feng Zhang ◽  
Qi Chen ◽  
Xiao Wei Chen ◽  
Hong Liang Zhao
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Optical Microscopy ◽  
Energy Dispersive Spectrometer ◽  
Energy Dispersive ◽  
Chinese Script ◽  
Mg2si Phase ◽  
Small Block ◽  
Average Size ◽  
Scanning Electron

In this study, the effect of KBF4 addition on the microstructure of the Mg-6Zn-1Si alloy has been investigated by Optical Microscopy (OM), Scanning Electron Microscopy (SEM) with Energy Dispersive Spectrometer(EDS). At 1.5wt% KBF4 addition, the morphology of Mg2Si phase completely changed from Chinese script type into uniformly, dispersedly distributed graininess or small block, with the average size of the Mg-6Zn-1Si alloy decreasing from 135μm to 82μm.

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