Study of Band Alignment at the Interface between CBD-CdS and CIGS grown by H2O-introduced co-evaporation

2007 ◽  
Vol 1012 ◽  
Author(s):  
Norio Terada ◽  
Hirotake Kashiwabara ◽  
Kazuya Kikunaga ◽  
Shimpei Teshima ◽  
Tetsuji Okuda ◽  
...  

AbstractFor understanding the origin of the improvements of properties in the CIGS-based cells, of which the CIGS absorber has been fabricated by H2O-introduced co-evaporation [CIGS-H2O], band alignment at the interfaces between chemical bath deposited CdS and CIGS-H2O with Ga substitution ratio ~ 40 % has been studied by photoemission and inverse photoemission spectroscopy. The CdS layer over the CIGS-H2O showed an identical electronic structure with that of CdS on the conventionally grown CIGS; band gap energy of 2.3 ~ 2.4 and a location of conduction band minimum (CBM) and valence band maximum (VBM) relative to Fermi level were + 0.75 eV and -1.6 ~ -1.7 eV, respectively. In the interface region, decreases of CBM and a rise of VBM were observed. Total amount of the decrease of CBM over the interface was 0.2 ~ 0.3 eV. XPS measurements of the core-level signals over the interface showed a small upward bend bending of 0.1 ~ 0.2 eV. Consequently, the conduction band offset (CBO) and valence bad offset (VBO) at the CBD-interface over the CIGS-H2O (Ga~40%) are about +0.1, and 0.9 ~ 1.1 eV, respectively. This positive CBO is contrast with a slightly negative CBO at the interface between CBD-CdS/conventionally grown CIGS with Ga ~ 40 % measured previously. These results indicate that the H2O introduction is effective to extend the upper limit of the Ga substitution ratio where the Type-I conduction band alignment is maintained. The observed band alignments are consistent with the rise of Voc and efficiency in the CIGS-H2O based cells.

2007 ◽  
Vol 1012 ◽  
Author(s):  
Shimpei Teshima ◽  
Hirotake Kashiwabara ◽  
Keimei Masamoto ◽  
Kazuya Kikunaga ◽  
Kazunori Takeshita ◽  
...  

AbstractDependence of band alignments at interfaces between CdS by chemical bath deposition and Cu(In1-xGax)Se2 by conventional 3-stage co-evaporation on Ga substitution ratio x from 0.2 to 1.0 has been systematically studied by means of photoemission spectroscopy (PES) and inverse photoemission spectroscopy (IPES). For the specimens of the In-rich CIGS, conduction band minimum (CBM) by CIGS was lower than that of CdS. Conduction band offset of them was positive about +0.3 ~ +0.4 eV. Almost flat conduction band alignment was realized at x = 0.4 ~ 0.5. On the other hand, at the interfaces over the Ga-rich CIGS, CBM of CIGS was higher than that of CdS, and CBO became negative. The present study reveals that the decrease of CBO with a rise of x presents over the wide rage of x, which results in the sign change of CBO around 0.4 ~ 0.45. In the Ga-rich interfaces, the minimum of band gap energy, which corresponded to energy spacing between CBM of CdS and valence band maximum of CIGS, was almost identical against the change of band gap energy of CIGS. Additionally, local accumulation of oxygen related impurities was observed at the Ga-rich samples, which might cause the local rise of band edges in central region of the interface.


2006 ◽  
Vol 527-529 ◽  
pp. 1071-1074 ◽  
Author(s):  
Carey M. Tanner ◽  
Jong Woo Choi ◽  
Jane P. Chang

The electronic properties of HfO2 films on 4H-SiC were investigated to determine their suitability as high-κ dielectrics in SiC power MOS devices. The band alignment at the HfO2/4HSiC interface was determined by X-ray photoelectron spectroscopy (XPS) and supported by density functional theory (DFT) calculations. For the experimental study, HfO2 films were deposited on ntype 4H-SiC by atomic layer deposition (ALD). XPS analysis yielded valence and conduction band offsets of 1.69 eV and 0.75 eV, respectively. DFT predictions based on two monoclinic HfO2/4HSiC (0001) structures agree well with this result. The small conduction band offset suggests the potential need for further interface engineering and/or a buffer layer to minimize electron injection into the gate oxide.


2012 ◽  
Vol 717-720 ◽  
pp. 721-724 ◽  
Author(s):  
Takuji Hosoi ◽  
Takashi Kirino ◽  
Atthawut Chanthaphan ◽  
Yusuke Uenishi ◽  
Daisuke Ikeguchi ◽  
...  

The change in energy band alignment of thermally grown SiO2/4H-SiC(0001) structures due to an interface defect passivation treatment was investigated by means of synchrotron radiation photoelectron spectroscopy (SR-PES) and electrical characterization. Although both negative fixed charge and interface state density in SiO2/SiC structures were effectively reduced by high-temparature hydrogen gas annealing (FGA), the conduction band offset (ΔEc) at the SiO2/SiC interface was found to be decreased by about 0.1 eV after FGA. In addition, a subsequent vacuum annealing to induce hydrogen desorption from the interface resulted in not only a slight degradation in interface property but also a partial recovery of ΔEc value. These results indicate that the hydrogen passivation of negatively charged defects near the thermally grown SiO2/SiC interface causes the reduction in conduction band offset. Therefore, the tradeoff between interface quality and conduction band offset for thermally grown SiO2/SiC MOS structure needs to be considered for developing SiC MOS devices.


2005 ◽  
Vol 865 ◽  
Author(s):  
S.H. Kong ◽  
H. kashiwabara ◽  
K. Ohki ◽  
K. Itoh ◽  
T. Okuda ◽  
...  

AbstractDirect characterization of band alignment at chemical bath deposition (CBD)-CdS/Cu0.93 (In1-xGax)Se2 has been carried out by photoemission spectroscopy (PES) and inverse photoemission spectroscopy (IPES). Ar ion beam etching at the condition of the low ion kinetic energy of 350 eV yields a removal of surface contamination as well as successful measurement of the intrinsic properties of each layer and the interfaces. Especially interior regions of the wide gap CIGS layers with a band gap of 1.4 ∼ 1.6 eV were successfully exposed. IPES spectra revealed that the conduction band offset (CBO) at the interface region of the wide gap CIGS with x = 0.60 and 0.75 was negative, where the conduction band minimum of CdS was lower than that of CIGS. It was also observed that the energy spacing between conduction band minimum (CBM) of CdS layer and valence band maximum (VBM) of Cu0.93(In0.25Ga0.75)Se2 layer at interface region was no wider than that of the interface over the Cu0.93(In0.60Ga0.40)Se2 layer.


2018 ◽  
Vol 7 (1) ◽  
pp. 35-41
Author(s):  
Garima Bhardwaj ◽  
Sandhya K. ◽  
Richa Dolia ◽  
M. Abu-Samak ◽  
Shalendra Kumar ◽  
...  

In this paper, we have configured InGaAsP QW (quantum well) heterostructures of type-I and type-II band alignments and simulated their optical characteristics by solving 6 x 6 Kohn-Luttinger Hamiltonian Matrix. According to the simulation results, the InGaAsP QW heterostructure of type-I band alignment has been found to show peak optical gain (TE mode) of the order of~3600/cm at the transition wavelength~1.40 µm; while of type-II band alignment has achieved the peak gain (TE mode) of the order of~7800/cm at the wavelength of~1.85 µm (eye safe region). Thus, both of the heterostructures can be utilized in designing of opto-or photonic devices for the emission of radiations in NIR (near infrared region) but form the high gain point of view, the InGaAsP of type-II band alignment can be more preferred.


MRS Advances ◽  
2017 ◽  
Vol 2 (53) ◽  
pp. 3157-3162 ◽  
Author(s):  
Takehiko Nagai ◽  
Shinho Kim ◽  
Hitoshi Tampo ◽  
Kang Min Kim ◽  
Hajime Shibata ◽  
...  

ABSTRACTWe determined that the conduction band offset (CBO) and the valence band offset (VBO) at the CdS/ Cu2ZnSnSe4 (CZTSe) heterointerface are +0.56 and +0.89eV, respectively, by using X-ray photoemission spectroscopy (XPS), ultraviolet photoemission spectroscopy (UPS) and inversed photoemission spectroscopy (IPES). A positive CBO value, so-called “spike” structure, means that the position of conduction band becomes higher than that of absorber layer. The evaluated CBO of +0.56 eV suggests that the conduction band alignment at CdS/CZTSe interface is enough to become an electron barrier. Despite such a large spike structure in the conduction band at the interface, a conversion efficiency of 8.7 % could be obtained for the CdS/CZTSe heterojunction solar cells.


2005 ◽  
Vol 865 ◽  
Author(s):  
A. Kanevce ◽  
M. Gloeckler ◽  
A.O. Pudov ◽  
J.R. Sites

AbstractA type-I (“spike”) conduction-band offset (CBO) greater than a few tenths of an eV at the n/p interface of a solar cell can lead to significant distortion of the current-voltage (J-V) curve. Such distortion has been observed in CdS/CIS cells, low-gallium CdS/CIGS cells, and CIGS cells with alternative windows that increase the CBO. The basic feature is reduced current collection in forward bias. The distortion is mitigated by photoconductivity in the CdS or other window layer, and it is therefore more severe if the illumination contains no photons with energies greater than the band gap of the window layer. The device-physics analysis of such distortion is numerical simulation incorporating a three-layer [TCO/CdS/CI(G)S] approximation for the solar cell. The parameters that influence the barrier height, and hence the distortion, are the magnitude of the CBO, the doping of the p- and n- layers, the defect density of the CdS, and the thicknesses of the CdS and TCO layers. The key value, however, is the energy difference between the quasi-Fermi level for electrons and the conduction band at the CdS/CIS interface. Thermionic emission across the interface will limit the current collection, if the difference exceeds approximately 0.48 eV at 300 K and one-sun illumination. This constraint is consistent with experiment, and strategies to satisfy the 0.48-eV rule when designing solar cells are enumerated.


2021 ◽  
Vol 34 (3) ◽  
pp. 323-332
Author(s):  
Rajan Singh ◽  
Trupti Lenka ◽  
Hieu Nguyen

Apart from other factors, band alignment led conduction band offset (CBO) largely affects the two dimensional electron gas (2DEG) density ns in wide bandgap semiconductor based high electron mobility transistors (HEMTs). In the context of assessing various performance metrics of HEMTs, rational estimation of CBO and maximum achievable 2DEG density is critical. Here, we present an analytical study on the effect of different energy band parameters-energy bandgap and electron affinity of heterostructure constituents, and lattice temperature on CBO and estimated 2DEG density in quantum triangular-well. It is found that at thermal equilibrium, ns increases linearly with ?EC at a fixed Schottky barrier potential, but decreases linearly with increasing gate-metal work function even at fixed ?EC, due to increased Schottky barrier heights. Furthermore, it is also observed that poor thermal conductivity led to higher lattice temperature which results in lower energy bandgap, and hence affects ?EC and ns at higher output currents.


2020 ◽  
Vol 8 (36) ◽  
pp. 12615-12622
Author(s):  
Christopher H. Don ◽  
Huw Shiel ◽  
Theodore D. C. Hobson ◽  
Christopher N. Savory ◽  
Jack E. N. Swallow ◽  
...  

Lone pair Sb 5s orbitals are identified at the valence band maximum of Sb2Se3 bulk crystals using photoemission and density functional theory. The resulting band alignments are determined and implications for solar cell applications are discussed.


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