Properties of Gainasp Alloys Investigated by Optically Detected Macnetic Resonance Techniques

1990 ◽  
Vol 216 ◽  
Author(s):  
C. Wetzel ◽  
B.K. Meyer ◽  
D. Grützmacher ◽  
P. Omling

The quaternary GaxIn1−xAsyP1−y semiconductor alloy system has considerable importance for present day optoelectronic and microwave device applications. For state of the art high mobility samples grown by metal organic chemical vapor deposition (MOVPE) there are few experimental techniques which both can asess band structure related properties (effective mass m*, g-values of free electrons) and impurity related properties (luminescence, mobility and lifetimes). In this paper we compare optical and transport properties of the quaternary compound GaxIn1−xAsyP1−y, (x=0.47,y-l; x=0.42,y=0.92; x=0.28,y=0.61; x=0.12,y=0.34) lattice matched to*{nP by optically detected magnetic resonance techniques.

1988 ◽  
Vol 144 ◽  
Author(s):  
G. A. Hebner ◽  
R. M. Biefeld ◽  
K. P. Killeen

ABSTRACTSeveral properties of InSb such as high mobility and narrow bandgap make it an attractive candidate for many unique devices. We have examined the metalorganic chemical vapor deposition (MOCVD) of InSb on GaAs and InSb substrates under a variety of conditions using trimethylindium and trimethylantimony sources. The absolute metal-organic partial pressures above the susceptor were monitored using in-situ Ultraviolet (UV) absorption spectroscopy. X-ray studies of the homoepitaxial growth of InSb on InSb substrates (100) indicate good crystalline epitaxial growth while the x-ray peak for the InSb grown on GaAs (100) is broadened due to defects. Room-temperature Hall mobility measurements performed on the heteroepitaxial InSb layer on GaAs substrates indicates that the mobility of the InSb increases with increasing layer thickness. Mobilities range from 12,000 cm2/V sec for 0.8 micron layers to 38,000 cm2/V sec for 7.4 micron layers. The carrier concentrations are relatively constant (2 to 4 × 1016 cm−3 ) for the n type InSb deposited layers.


2020 ◽  
Vol 993 ◽  
pp. 869-875
Author(s):  
Lin An He ◽  
Cai Na Luan ◽  
Di Wang ◽  
Yong Le ◽  
Jin Ma

Metal organic chemical vapor deposition (MOCVD) was employed for the preparation of niobium (Nb)-doped SnO2 films on SiO2 glass substrates. The structure, optical and electrical properties of the Nb-doped SnO2 films were systemically studied. The X-ray diffraction results indicated that the polycrystalline rutile SnO2 films were obtained with a preferred SnO2 [110] growth direction. Among which, the 5.4 at.% Nb-doped SnO2 film showed the lowest resistivity of 1.0×10-3 Ω∙cm and the highest Hall mobility of 74 cm2∙V-1∙s-1. The average visible light transmittance of the 5.4 at.% Nb-doped SnO2 sample was more than 79%. The obtained Nb-doped SnO2 films exhibited low resistivity, high Hall mobility and good transparency, which might have wide applications in electric and photoelectric devices.


2004 ◽  
Vol 829 ◽  
Author(s):  
K. Stewart ◽  
S. Barik ◽  
M. Buda ◽  
H. H. Tan ◽  
C. Jagadish

ABSTRACTIn this paper we discuss the growth of self-assembled InAs quantum dots (QDs) on both GaAs and InP substrates by low pressure Metal Organic Chemical Vapor Deposition. The influence of various growth parameters, such as the deposition time, the QD overlayer growth temperature, the V/III ratio and the group III and/or group V interdiffusion on QD formation are discussed and compared for the two systems. Stacking issues and preliminary results for an InAs/GaAs QD laser are also presented.


2000 ◽  
Vol 39 (Part 1, No. 3A) ◽  
pp. 1035-1038 ◽  
Author(s):  
Guang Yuan Zhao ◽  
Hiroyasu Ishikawa ◽  
Takashi Egawa ◽  
Takashi Jimbo ◽  
Masayoshi Umeno

1992 ◽  
Vol 282 ◽  
Author(s):  
R. M. Biefeld

ABSTRACTIn metal organic chemical vapor deposition (MOCVD), the most commonly used sources are the trimethyls of Al, Ga, In, and Sb, and PH3 and ASH3. New organometallic sources are being developed as the understanding of the deposition process improvesand allows for the determination of the effects of source type and growth condition on the properties of the grown films. These new sources are safer and allow for the growth of higher purity materials using more favorable growth conditions. InSb and AlSb prepared using these trimethyl-sources are not of high enough quality to be used in many current device applications. Alternate organometallic Sb sources are being investigated to improve the materials characteristics of InSb grown by MOCVD.InSb grown using trimethylindium (TMIn) and trimethylantimony (TMSb) or triethylantimony (TESb) yielded similar quality materials under similar growth conditions. InSb grown using triethylindium (TEIn) and TESb under similar growth conditions yielded very poor quality n-type material. Three new organometallic Sb sources, triisopropylantimony (TIPSb), tris(dimethylamino)antimony (TDMASb), and tertiarybutyldimethylantimony (TBDMSb) are being investigated. The growth of InSb using TIPSb, TDMASb, or TBDMSb and TMIn was investigated over a temperature range of 350 to 475 °C. InSb grown from TDMASb had similar properties to InSb grown from TMIn and TMSbwhen using a similar temperature and V/III ratio range. The growth rates of InSb using TMIn and either TIPSb or TBDMSb at temperatures <= 425 °C were proportional to both the TMIn flow rate and the temperature. The surface morphology of InSb grown using eitherTIPSb or TBDMSb was very rough for growth temperatures <=425 °C. This may be due to the complex decomposition mechanisms involved and the presence of methyl groups on the surface. The InSb with the highest mobility was grown at 400 °C and a V/III ratioof 3 using TIPSb. It was n-type with a carrier concentration of 2.5 × 1015 cm−3 and a mobility of 78,160 cm2/Vs at 77 K. Both n- and p-type InSb were grown using TBDMSb with mobilities up to 67,530 and 7773 cm2/Vs, respectively at 77 K. The mobility for InSb using either TIPSb or TBDMSb was optimized by going to lower temperatures, pressures and V/III ratios. The opposite was truefor surface morphology which improved with higher temperature, pressure, and V/III ratio. The growth of high mobility InSb with smooth surfaces at T<=425 °C was not achieved with TIPSb or TBDMSb and TMIn under the conditions investigated in this work.


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