scholarly journals Scanning X-Ray Diffraction: A Technique With High Compositional Resolution for Studying Phase Formation in Co-Deposited Thin Films

1994 ◽  
Vol 343 ◽  
Author(s):  
T.I. Selinder ◽  
D.J. Miller ◽  
K.E. Gray ◽  
M.A. Beno ◽  
G.S. Knapp
Keyword(s):  
Thin Films ◽  
Phase Formation ◽  
Structural Information ◽  
Metastable Phase ◽  
Ternary Systems ◽  
Composition Gradient ◽  
X Ray Diffraction ◽  
X Ray ◽  
Analysis Technique ◽  
Position Sensitive

ABSTRACTInvestigation of the formation of new metastable phases in alloy thin films requires ways of quickly determining the crystalline structure of samples with different compositions. We report a novel technique for acquiring structural information from films intentionally grown with a composition gradient. For example, binary metal alloy films were deposited using a phase-spread sputtering method. In this way essentially the entire composition range could be grown in a single deposition. By using a narrow incident x-ray beam and a translating sample stage combined with a position sensitive x-ray detector technique, detailed information of the metastable phase diagram can be obtained rapidly. Compositional resolution of the order of ±0.2% can be achieved, and is limited by the brightness of the x-ray source. Initial results from studies of phase formation in Zr-Ta alloys will be presented. Extensions of the analysis technique to ternary systems will be discussed.

Determining the C60 molecular arrangement in thin films by means of X-ray diffraction

2011 ◽  
Vol 44 (5) ◽  
pp. 983-990 ◽  
Author(s):  
Chris Elschner ◽  
Alexandr A. Levin ◽  
Lutz Wilde ◽  
Jörg Grenzer ◽  
Christian Schroer ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Information ◽  
Grazing Incidence ◽  
Test Material ◽  
C60 Fullerene ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Molecular Arrangement ◽  
Diffraction Patterns

The electrical and optical properties of molecular thin films are widely used, for instance in organic electronics, and depend strongly on the molecular arrangement of the organic layers. It is shown here how atomic structural information can be obtained from molecular films without further knowledge of the single-crystal structure. C60 fullerene was chosen as a representative test material. A 250 nm C60 film was investigated by grazing-incidence X-ray diffraction and the data compared with a Bragg–Brentano X-ray diffraction measurement of the corresponding C60 powder. The diffraction patterns of both powder and film were used to calculate the pair distribution function (PDF), which allowed an investigation of the short-range order of the structures. With the help of the PDF, a structure model for the C60 molecular arrangement was determined for both C60 powder and thin film. The results agree very well with a classical whole-pattern fitting approach for the C60 diffraction patterns.

Enhancement of Aurivillius Phase Formation Kinetics in SBT Thin Films using Nanoparticle Seeding

2003 ◽  
Vol 784 ◽  
Author(s):  
Yun-Mo Sung ◽  
Woo-Chul Kwak ◽  
Se-Yon Jung ◽  
Seung-Joon Hwang
Keyword(s):  
Thin Films ◽  
Activation Energy ◽  
Phase Transformation ◽  
Phase Formation ◽  
X Ray Diffraction ◽  
Aurivillius Phase ◽  
X Ray ◽  
Si Substrates ◽  
Formation Kinetics ◽  
Kinetics Of

ABSTRACTPt/Ti/SiO2/Si substrates seeded by SBT nanoparticles (∼60–80 nm) were used to enhance the phase formation kinetics of Sr0.7Bi2.4Ta2O9 (SBT) thin films. The volume fractions of Aurivillius phase formation obtained through quantitative x-ray diffraction (Q-XRD) analyses showed highly enhanced kinetics in seeded SBT thin films. The Avrami exponents were determined as ∼1.4 and ∼0.9 for unseeded and seeded SBT films, respectively, which reveals different nucleation modes. By using Arrhenius–type plots the activation energy values for the phase transformation of unseeded and seeded SBT thin films were determined to be ∼264 and ∼168 kJ/mol, respectively. This gives a key reason to the enhanced kinetics in seeded films. Microstructural analyses on unseeded SBT thin films showed formation of randomly oriented needle-like crystals, while those on seeded ones showed formation of domains comprised of directionally grown worm-like crystals.

Inhomogeneity and Microstructure in e-Beam Evaporated ZrO2 Films

1990 ◽  
Vol 208 ◽  
Author(s):  
M. Bellotto ◽  
C. Cremnonesi ◽  
F. Parmigiani ◽  
M. Scagliotti ◽  
S. Beretta
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Oxygen Partial Pressure ◽  
Zirconium Dioxide ◽  
Oxygen Stoichiometry ◽  
Composition Gradient ◽  
X Ray Diffraction ◽  
X Ray ◽  
Partial Pressures ◽  
Microstructure Of The Material

ABSTRACTThin films of zirconium dioxide are deposited by e-beam evaporation on optically polished borosilicate crown glass. Two different oxygen partial pressures in the chamber are used. The optical properties of the films are characterized by ellipsometry. The influence of oxygen stoichiometry on the composition and microstructure of the material is investigated by polycrystalline X-ray diffraction for different film thicknesses. The films are found to be inhomogeneous, and a composition gradient (i.e. amorphous ⇔ tetragonal ⇔ monoclinic) is observed from the substrate to the surface. The oxygen partial pressure influences the growth of the films.

Monitoring the Phase Formation of Coevaporated Lead Halide Perovskite Thin Films by in Situ X-ray Diffraction

2014 ◽  
Vol 5 (19) ◽  
pp. 3308-3312 ◽  
Author(s):  
Paul Pistor ◽  
Juliane Borchert ◽  
Wolfgang Fränzel ◽  
René Csuk ◽  
Roland Scheer
Keyword(s):  
Thin Films ◽  
Phase Formation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Halide Perovskite ◽  
Lead Halide

Sequence Of Phase Formation In Ni/Ai Contrasted With Ni/Si

1985 ◽  
Vol 54 ◽  
Author(s):  
E. G. Colgan ◽  
J. W. Mayer
Keyword(s):  
Thin Films ◽  
Phase Formation ◽  
Intermetallic Phases ◽  
X Ray Diffraction ◽  
X Ray ◽  
Layer Deposition

ABSTRACTWe have investigated the interactions of Al/Ni, NiAl3/Ni, and Ni2Al3/Ni thin films between 350 and 500°C. Sequential layer deposition and coevaporation were used to prepare the films which were then vacuum annealed and analyzed by Rutherford backseat tering and X-ray diffraction. Initially, NiAl3 is formed, followed by the more Ni-rich phases. All four intermetallic phases were formed.

Interdiffusion in Fe/Pt Multilayer Thin Films

2006 ◽  
Vol 258-260 ◽  
pp. 199-206 ◽  
Author(s):  
Se Young O ◽  
Dan Phuong Nguyen ◽  
Chan Gyu Lee ◽  
Bon Heun Koo ◽  
Byeong Seon Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Annealing Time ◽  
Composition Gradient ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
Multilayer Systems ◽  
X Ray ◽  
Peak Intensity ◽  
Straight Line ◽  
Interdiffusion Coefficients

Interdiffusion in Fe/Pt multilayer thin films has been studied. [Fe(1nm)/Pt(1.5nm)]20 multilayers were prepared by DC magnetron sputtering technique and subsequently annealed at temperatures of 543 - 633K in vacuum lower than 10-6 torr. X-ray diffraction (XRD) studies on these multilayer systems revealed the interdiffusion coefficients from slope of the best straight line fit of first peak intensity versus annealing time. The temperature dependence of interdiffusion in the range of 543 - 633K can be described by D=4.98×10-24 exp (0.88eV/kT) m2S-1. The coercivity, measured by Vibrating Sample Magnetometer, of the multilayer with annealing time at 603K increased, which is believed to the increase of surface roughness by interdiffusion at the interfaces of Fe and Pt multilayers, enhancement of composition gradient; and/or formation of Fe-Pt reaction phase at the interface of Fe and Pt.

Icosahedral phase formation in rapidly quenched aluminum-ruthenium alloys

1988 ◽  
Vol 3 (3) ◽  
pp. 421-425 ◽  
Author(s):  
Steven M. Anlage ◽  
Brent Fultz ◽  
Kannan M. Krishnan
Keyword(s):  
Electron Microscopy ◽  
Phase Diagram ◽  
Rapid Solidification ◽  
Phase Formation ◽  
Metastable Phase ◽  
Icosahedral Phase ◽  
Rapid Quenching ◽  
Metastable Phase Diagram ◽  
X Ray Diffraction ◽  
X Ray

Systematic rapid quenching experiments on the icosahedral phase-forming system Al1 − xRux were performed for × < 20 at. %. The solidified alloys have been studied by electron microscopy and x-ray diffraction to determine their composition, constituent phases, and phase morphology. It has been determined that the icosahedral phase must form directly from the liquid and, at these quench rates, is always found in the presence of second or third phases. The results have been summarized in a metastable phase diagram appropriate for rapid solidification of Al1 − xRux at piston and anvil quench rates. This metastable phase diagram describes the results for Ru concentrations less than 14 at. %.

High Resolution X-Ray Microanalysis of Nb/Al Multilayer Thin Films

1997 ◽  
Vol 3 (S2) ◽  
pp. 967-968
Author(s):  
G. Lucadamo ◽  
M. Watanabe ◽  
K. Barmak ◽  
D. B. Williams
Keyword(s):  
Thin Films ◽  
Phase Formation ◽  
Driving Forces ◽  
Interfacial Region ◽  
Specimen Preparation ◽  
X Ray Diffraction ◽  
Cross Sectional ◽  
Growth Step ◽  
X Ray ◽  
Deposition Processes

A study of reactive phase formation in thin films requires the understanding of the thermodynamics and kinetics of the reactions. Previous investigations of phase formation in Nb/Al multilayers using calorimetry and x-ray diffraction have observed that despite the presence of rather large driving forces for phase formation, a pronounced nucleation event occurs. This behavior has been reported in other systems including Ti/Al and Ni/Al. The initial nature of the interface can affect the nucleation, therefore careful studies of the structure and composition of the initial interfacial region may explain the reason for a kinetically separated nucleation and lateral growth step preceding normal phase growth. In addition, examination of the interface may also lend insight into the effects of different deposition processes and can provide evidence for the formation of solid solutions or compounds that can lower driving forces available for phase formation. Finally, the cross-sectional multilayer sample provides a means of characterizing spatial resolution and isolating specimen preparation artifacts.

scholarly journals Energy Dispersive X-Ray Diffraction Imaging

2013 ◽  
Vol 772 ◽  
pp. 21-25 ◽  
Author(s):  
Jörn Donges ◽  
André Rothkirch ◽  
Thomas Wroblewski ◽  
Aniouar Bjeoumikhov ◽  
Oliver Scharf ◽  
...  
Keyword(s):  
Spatial Information ◽  
Structural Information ◽  
Reciprocal Space ◽  
Energy Dispersive ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Area Detector ◽  
Diffraction Imaging ◽  
Position Sensitive

Position resolved structural information from polycrystalline materials is usually obtained via micro beam techniques illuminating only a single spot of the specimen. Multiplexing in reciprocal space is achieved either by the use of an area detector or an energy dispersive device. Alternatively spatial information may be obtained simultaneously from a large part of the sample by using an array of parallel collimators between the sample and a position sensitive detector which suppresses crossfire of radiation scattered at different positions in the sample. With the introduction of an X-ray camera based on an energy resolving area detector (pnCCD) we could combine this with multiplexing in reciprocal space.

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