Lattice Relaxation Effects in Si and GaAs Nanocrystals

1994 ◽  
Vol 358 ◽  
Author(s):  
X. S. Zhao ◽  
Y. R. Ge ◽  
J. Schroeder ◽  
P. D. Persans
Keyword(s):  
Gallium Arsenide ◽  
Optical Properties ◽  
Porous Silicon ◽  
Raman Scattering ◽  
Lattice Relaxation ◽  
Experimental Results ◽  
Vibrational Modes ◽  
Strain Effects ◽  
Relaxation Effects ◽  
Almost All

ABSTRACTRaman scattering results on porous silicon, and silicon and gallium arsenide nanocrystals show that almost all vibrational modes become Raman active and remarkably soft in these nanocrystal systems. The experimental results further demonstrate that the carrier-induced strain effects play an important role on the optical properties of such nanocrystal systems.

Microstructural Characterization of Photoluminescent Porous Silicon

1991 ◽  
Vol 256 ◽  
Author(s):  
J. M. Macaulay ◽  
F. M. Ross ◽  
P. C. Searson ◽  
S. K. Sputz ◽  
R. People ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Optical Properties ◽  
Porous Silicon ◽  
Microstructural Characterization ◽  
Photoluminescence Spectroscopy ◽  
Experimental Results ◽  
Visible Luminescence ◽  
Wide Range ◽  
The Impact

ABSTRACTWe have used electron microscopy to examine the microstructure of porous silicon films over a wide range of doping levels, and photoluminescence spectroscopy to study their optical properties. We discuss the impact of our experimental results on models from the literature which were proposed to explain visible luminescence from porous silicon.

Characterization of Porous Silicon Layers by Reflectance Spectroscopy

1992 ◽  
Vol 283 ◽  
Author(s):  
W. Theiβ ◽  
P. Grosse ◽  
H. Münder ◽  
H. Lüth ◽  
R. Herino ◽  
...  
Keyword(s):  
Optical Properties ◽  
Porous Silicon ◽  
Reflectance Spectroscopy ◽  
Experimental Results ◽  
Porous System ◽  
Optical Reflectance

ABSTRACTThe characterization of porous silicon layers by optical reflectance spectroscopy in the infrared, visible and UV is presented. A fit of simulated to measured spectra is used to interprete the experimental results. We stress that the microgeometry of the porous system determines the optical properties to a large extent and must be taken into account in a correct way in order to achieve reliable results.

scholarly journals Transparent TiO2/Cu/TiO2 Multilayer for Electrothermal Application

Materials ◽  
2021 ◽  
Vol 14 (4) ◽  
pp. 1024
Author(s):  
Jingjing Peng ◽  
Changshan Hao ◽  
Hongyan Liu ◽  
Yue Yan
Keyword(s):  
Optical Properties ◽  
Heating Rate ◽  
Figure Of Merit ◽  
Annealing Temperature ◽  
Critical Thickness ◽  
Experimental Results ◽  
Tio2 Layer ◽  
Electrical And Optical Properties ◽  
Partial Crystallization

Highly transparent indium-free multilayers of TiO2/Cu/TiO2 were obtained by means of annealing. The effects of Cu thickness and annealing temperature on the electrical and optical properties were investigated. The critical thickness of Cu mid-layer with optimal electrical and optical properties was 10 nm, with the figure of merit reaching as high as 5 × 10−3 Ω−1. Partial crystallization of the TiO2 layer enhanced the electrical and optical properties upon annealing. Electrothermal experiments showed that temperatures of more than 100 °C can be reached at a heating rate of 2 °C/s without any damage to the multilayers. The experimental results indicate that reliable transparent TiO2/Cu/TiO2 multilayers can be used for electrothermal application.

Anisotropic and polarization effects in Raman scattering in porous silicon

1995 ◽  
Vol 255 (1-2) ◽  
pp. 139-142 ◽  
Author(s):  
I. Gregora ◽  
B. Champagnon ◽  
L. Saviot ◽  
Y. Monin
Keyword(s):  
Porous Silicon ◽  
Raman Scattering ◽  
Polarization Effects

Variation of the optical properties of porous silicon as a result of thermal annealing in vacuum

1997 ◽  
Vol 31 (7) ◽  
pp. 704-706 ◽  
Author(s):  
V. A. Kiselev ◽  
S. V. Polisadin ◽  
A. V. Postnikov
Keyword(s):  
Optical Properties ◽  
Porous Silicon ◽  
Thermal Annealing

Non-linear optical properties of poly(phenylene vinylene) in porous silicon substrates

2005 ◽  
Vol 2 (9) ◽  
pp. 3222-3226 ◽  
Author(s):  
T. P. Nguyen ◽  
P. Le Rendu ◽  
C. Simos ◽  
P. X. Nguyen ◽  
V. Skarka ◽  
...  
Keyword(s):  
Optical Properties ◽  
Porous Silicon ◽  
Phenylene Vinylene ◽  
Silicon Substrates ◽  
Non Linear ◽  
Linear Optical Properties ◽  
Linear Optical

Experimental Study of Ductile Fracture for Non-Aligned Multiple Flaws in a Plate

2009 ◽  
Author(s):  
Katsumasa Miyazaki ◽  
Kunio Hasegawa ◽  
Koichi Saito ◽  
Bostjan Bezensek
Keyword(s):  
Experimental Study ◽  
Ductile Fracture ◽  
Estimation Procedure ◽  
Maximum Load ◽  
Experimental Results ◽  
Collapse Load ◽  
Plate Specimen ◽  
Fracture Tests ◽  
Almost All

The fitness-for-service code requires the characterization of non-aligned multiple flaws for the flaw evaluation, which is performed using a flaw proximity rule. Worldwide almost all codes provide own proximity rule, often with unclear technical bases of the application of proximity rule to ductile fracture. To clarify the appropriate proximity rule for non-aligned multiple flaws in fully plastic fracture, fracture tests on flat plate specimen with non-aligned multiple through wall flaws were conducted at ambient temperature. The emphasis of this study was put on the flaw alignment rule, which determines whether non-aligned flaws are treated as independent or aligned onto the same plane for the purpose of flaw evaluations. The effects of the flaw separation and flaw size on the maximum load were investigated. The experimental results were compared with the estimations of the collapse load using the alignment rules in the ASME Section XI, BS7910 and API 579-1 codes. A new estimation procedure specific to the fully plastic fracture was proposed and compared with the comparison with the experimental results.

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