Crystallographic Mapping in Scanning and Transmission Electron Micrsocopy with Application to Semiconductor Materials

1998 ◽  
Vol 523 ◽  
Author(s):  
D. J. Dingley ◽  
S. I. Wright ◽  
D. J. Dingley
Keyword(s):  
Electron Microscope ◽  
Electron Backscatter Diffraction ◽  
Orientation Imaging Microscopy ◽  
Lattice Parameter ◽  
Dark Field ◽  
Polycrystalline Materials ◽  
Orientation Imaging ◽  
Transmission Electron ◽  
Dark Field Microscopy ◽  
Backscatter Diffraction

AbstractThe two sister techniques, Electron Backscatter Diffraction and Orientation Imaging Microscopy which operate in a scanning electron microscope, are well established tools for the characterization of polycrystalline materials. Experiment has shown that the limiting resolution for mapping is the order of 0.1 microns. The basic techniques have been extended to include multiphase mapping. Whereas it has been possible to distinguish between phases of different crystal systems easily, it has not been possible to distinguish between phases that differ in lattice parameter by less than 5 %.An equivalent transmission electron microscope procedure has been developed. The technique couples standard hollow cone microscopy procedures with dark field microscopy. All possible dark field images that can be produced by tilting the electron beam are scanned to detect under what settings each crystal is brought into a diffracting condition. Subsequent analysis permits determination of both crystal phase and orientation.

scholarly journals New Capabilities for the TEM: Automatic Orientation Measurement and Nanocrystal Grain Maps

1999 ◽  
Vol 7 (6) ◽  
pp. 12-15 ◽  
Author(s):  
S.I. Wright ◽  
D.J. Dingley ◽  
P.R. Mainwaring
Keyword(s):  
Electron Microscope ◽  
Electron Backscatter Diffraction ◽  
Orientation Imaging Microscopy ◽  
Polycrystalline Sample ◽  
Polycrystalline Materials ◽  
Structure Property ◽  
Orientation Measurement ◽  
Orientation Imaging ◽  
Structure Property Relationships ◽  
Submicron Structures

Orientation Imaging Microscopy (OIM) is a rapid and spatially specific technique for automatically measuring individual crystallographic orientations in a polycrystalline sample. The technique is based on electron backscatter diffraction in the scanning electron microscope (SEM). While the OIM technique has seen many applications to the investigation of structure/ property relationships in polycrystalline materials, with grain sizes ranging from millimeters to submicron, it is not easily applied to the characterization of microstructures at the nanometer scale due to the inherent resolution limitations of the SEM. Thus, a complementary technique for the transmission electron microscope (TEM) would be advantageous for the study of local orientation in submicron structures such as those that exist in nanocrystalline materials and deformed materials.

EDS Assisted Phase Differentiation in Orientation Imaging Microscopy

2006 ◽  
Vol 509 ◽  
pp. 11-16 ◽  
Author(s):  
Stuart I. Wright ◽  
Matthew M. Nowell
Keyword(s):  
Electron Backscatter Diffraction ◽  
Orientation Imaging Microscopy ◽  
Polycrystalline Materials ◽  
Crystallographic Structure ◽  
Orientation Relationships ◽  
Multiphase Materials ◽  
Orientation Imaging ◽  
Ebsd Data ◽  
Phase Differentiation ◽  
Backscatter Diffraction

Automated Electron Backscatter Diffraction (EBSD) or Orientation Imaging Microscopy (OIM) has proven to be a viable technique for investigating microtexture in polycrystalline materials. It is particularly useful for investigating orientation relationships between phases in multiphase materials. However, when phases do not significantly vary in crystallographic structure, OIM is limited in its capability to reliably differentiate between phases. Through simultaneous collection of EBSD data and chemical data via X-Ray Energy Dispersive Spectroscopy (EDS) it is possible to dramatically improve upon the phase differentiation capabilities of either technique individually. This presentation will introduce a methodology for combining the two techniques as well as show a few example applications.

Extension of Orientation Mapping to the Transmission Electron Microscope

2005 ◽  
Vol 495-497 ◽  
pp. 225-230 ◽  
Author(s):  
David J. Dingley
Keyword(s):  
Electron Microscope ◽  
Spatial Resolution ◽  
Transmission Electron Microscope ◽  
Orientation Imaging Microscopy ◽  
Dark Field ◽  
Orientation Imaging ◽  
Microscopy Technique ◽  
Transmission Electron ◽  
Orientation Mapping ◽  
Dark Field Micrographs

This paper describes progress in improving the spatial resolution of the well-established Orientation Imaging Microscopy technique, OIM, by developing an analogous procedure for the transmission electron microscope. The transmission orientation micrographs are obtained by recording a large series of dark field micrographs taken from the chosen area in the specimen. This area is selected so that it contains all of the grains of interest and is imaged at sufficiently high magnification to yield the spatial resolution required. The changing intensity of each pixel in different dark field micrographs permits the equivalent of a diffraction pattern for that pixel to be constructed. This enables determination of the lattice orientation of small volumes in the sample corresponding to that imaged in each individual pixel. Experimentation has shown that problems arise however, that decrease the fraction of correctly measured points due to ambiguities in determining the index of higher order reflections, especially when the total number of reflections observed is small. The solution has been to both modify the indexing procedure and to sum the diffraction vectors observed within a single grain. The paper concentrates on a detailed analysis of a heavily deformed aluminium sample, chosen because of the fragmentation of the structure.

Reduced Unit Cell Determination From Unindexed EBSD Patterns

2000 ◽  
Vol 6 (S2) ◽  
pp. 946-947 ◽  
Author(s):  
J. R. Michael ◽  
R. P. Goehner
Keyword(s):  
Electron Microscope ◽  
Electron Backscatter Diffraction ◽  
Unit Cell ◽  
Phase Identification ◽  
High Quality ◽  
Charge Coupled Device ◽  
Transmission Electron ◽  
Single Pattern ◽  
Backscatter Diffraction

Electron backscatter diffraction (EBSD) is a technique that can provide identification of unknown crystalline phases while exploiting the excellent imaging capabilities of the scanning electron microscope (SEM). Phase identification using EBSD has now progressed to the point that it is commercially available. Phase identification in the SEM requires high quality EBSD patterns that can only be collected using either film or charge coupled device (CCD)-based cameras. High quality EBSD patterns obtained in this manner show many diffraction features that are useful in the determination of the unit cell of the sample.’ This paper will discuss the features in the EBSD patterns and the procedure used to determine the reduced unit cell of the sample.One of the major advantages of EBSD over electron diffraction in the transmission electron microscope is the remarkable field of view that is routinely attained. The large angular view of the diffraction pattern permits many zone axes and their associated symmetries to be viewed in a single pattern or at most a few patterns.

scholarly journals Randomly oriented twin domains in electrodeposited silver dendrites

2015 ◽  
Vol 80 (1) ◽  
pp. 107-113 ◽  
Author(s):  
Evica Ivanovic ◽  
Nebojsa Nikolic ◽  
Velimir Radmilovic
Keyword(s):  
Electron Microscopy ◽  
Orientation Imaging Microscopy ◽  
Dark Field ◽  
High Angle ◽  
Orientation Imaging ◽  
Transmission Electron ◽  
Annular Dark Field ◽  
Silver Dendrites ◽  
Z Contrast ◽  
Scanning Electron

Silver dendrites were prepared by electrochemical deposition. The structures of Ag dendrites, the type of twins and their distribution were investigated by scanning electron microscopy (SEM), Z-contrast high angle annular dark field transmission electron microscopy (HAADF), and crystallografically sensitive orientation imaging microscopy (OIM). The results revealed that silver dendrites are characterized by the presence of randomly distributed 180? rotational twin domains. The broad surface of dendrites was of the {111} type. Growth directions of the main dendrite stem and all branches were of <112> type.

scholarly journals Fast Orientation Imaging Microscropy

2002 ◽  
Vol 10 (3) ◽  
pp. 10-14 ◽  
Author(s):  
David J. Dingley ◽  
Stuart Wright ◽  
Mathew Nowell
Keyword(s):  
Electron Backscatter Diffraction ◽  
Orientation Imaging Microscopy ◽  
Orientation Imaging ◽  
Electron Backscatter ◽  
Original Works ◽  
The Subject ◽  
Backscatter Diffraction

Orientation Imaging Microscopy is currently the most rapidly growing combined metallographic and crystallographic technique today. The first OIM was recorded by Wright in 1991, and published soon after, Adams et al. (1993). The technique is based on the original works on Electron Backscatter Diffraction (EBSD) by Venables and Hariand (1973), and Dingiey (1984, 1987). By 1994 some number of papers on the subject had been published. At the time of writing the authors are aware of over 600 publications that have utilized the technique and there are in excess of 400 systems in use worldwide.

scholarly journals Cryogenic Deformation Behavior and Microstructural Characteristics of 2195 Alloy

Metals ◽  
2021 ◽  
Vol 11 (9) ◽  
pp. 1406
Author(s):  
Jin Zhang ◽  
Wenfu Tan ◽  
Cheng Wang ◽  
Chunnan Zhu ◽  
Youping Yi
Keyword(s):  
Electron Microscope ◽  
Electron Backscatter Diffraction ◽  
Underlying Mechanism ◽  
Optical Microscope ◽  
W State ◽  
Grain Structure ◽  
Cryogenic Deformation ◽  
Transmission Electron ◽  
Strength And Plasticity ◽  
Backscatter Diffraction

Cryogenic deformation can improve the strength and plasticity of Al–Li alloy, although the underlying mechanism is still not yet well understood. The effects of cryogenic temperature on the tensile properties and microstructure of an Al–Cu–Li alloy were investigated by means of tensile property test, roughness measurement, scanning electron microscope (SEM), optical microscope (OM), electron backscatter diffraction (EBSD), and transmission electron microscope (TEM). The results indicated that the strength and elongation of the as-annealed (O-state) and solution-treated (W-state) alloys increased with the decrease in deformation temperature, where the increasing trend of elongation of the W-state alloy was more significant than that of the O-state alloy. In addition, a temperature range was observed at approximately 178 K that caused the strength of the W-state alloy to slightly decrease. The decrease in temperature inhibited the dynamic recovery of the Al–Cu–Li alloy, which increased the dislocation density and the degree of work hardening, thus improving the strength of the alloy. At cryogenic temperatures, the internal grain structure was more involved in the deformation and the overall deformation was more uniform, which caused the alloy to have higher plasticity. This study provides a theoretical basis for the cryogenic forming of Al–Li alloy.

scholarly journals Characterization of the Interface Between α and β Titanium Alloys in the Diffusion Couple

2020 ◽  
Vol 51 (12) ◽  
pp. 6584-6591
Author(s):  
Maciej Motyka ◽  
Wojciech J. Nowak ◽  
Bartek Wierzba ◽  
Witold Chrominski
Keyword(s):  
Electron Microscope ◽  
Diffusion Couple ◽  
Titanium Alloys ◽  
Solid Solutions ◽  
Electron Backscatter Diffraction ◽  
Inert Atmosphere ◽  
Microstructural Changes ◽  
Transmission Electron ◽  
Titanium Grade ◽  
Backscatter Diffraction

AbstractThe aim of the research was to investigate the microstructural changes caused by diffusion through interface between α and β titanium solid solutions. For this purpose, a diffusion couple composed of two single-phase titanium alloys—α type commercially pure (CP) titanium Grade 2 and near-β Ti-15V-3Al-3Cr-3Sn—was made by annealing at a temperature of 850 °C in an inert atmosphere. The performed heat treatment caused partial diffusion bonding (DB) where the α/β-interface was clearly visible. Based on the results of microscopic (light microscope (LM), scanning electron microscope/electron backscatter diffraction (SEM/EBSD), and transmission electron microscope (TEM)) examination, a significant microstructure evolution of near-β alloy in the region near the interface (diffusion-affected zone) was revealed. It was found that needlelike phases were formed both in α and β solid solutions. Moreover, in the near-β titanium alloy, pores aligned in the Frenkel plane were found. The latter finding indicated that the diffusion of alloying elements of near-β alloy is the most probable reason for the observed microstructural changes. Additionally, the “grooving” phenomenon at the α/β interface was found and it was correlated with faster diffusion through grain boundaries, rather than volume diffusion. Finally, the pore size was measured and numerically modeled. The calculated values were in good agreement with the experimental ones.

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