Growth of Cu-Ni-Sn Alloys in Pb Free CuSnAg Solder/Au-Ni Metallization Reactions
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ABSTRACTDiffusion and phase formation were monitored in solder joints consisting of flip chips with Ni(V) under-bump metallizations bumped with Ag3.8Cu1.85Sn94.35 (atomic percentage) solder reflowed on printed circuit boards with Cu/Ni/Au metallizations. A ternary alloy, (CuNi)6Sn5, was observed to form during reflow at solder/Ni interfaces in these Ag3.8Cu1.85Sn94.35/Au/Ni solder joints. After extended thermal aging at 150 oC, a second ternary compound, (CuNi)3Sn4 forms at the Ni/(CuNi)6Sn5 interface. The growth of these alloys depletes the solder of essentially all Cu, changing its mechanical properties and melting temperature.
2011 ◽
Vol 19
(9)
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pp. 2154-2162
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2012 ◽
Vol 48
(3)
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pp. 325-330
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