White Light Luminescence from Nano-ZnS Doped Porous Silicon

2001 ◽  
Vol 686 ◽  
Author(s):  
K. W. Cheah ◽  
Ling Xu ◽  
Xinfan Huang

Nano-ZnS was deposited into porous silicon. By varying the concentration of Zn2+ ion solution during nano-ZnS formation, the amount of nano-ZnS in porous silicon host can be controlled. The doped porous silicon exhibited a gradual shift in its photoluminescence peak from red to blue as a function of the nano-ZnS coverage. At an optimum doping, white light photoluminescence was obtained. A study in the luminescence lifetime showed that the radiative recombination at the blue end of the visible spectrum was due to nano-ZnS, whereas, luminescence emission at the red end of the visible spectrum came from porous silicon. The latter luminescence was due to in part tunneling of excited electrons from nanoZnS into porous silicon and in part direct excitation of porous silicon layer. Time-resolved photoluminescence also showed that radiative recombination was effectively dominated by the nano-ZnS. Photoluminescence excitation result revealed the presence of two excitation levels; one belonged to nano-ZnS at near uv region, and another at about 520 nm from the surface states of porous silicon and nano-ZnS. The doping of nano-ZnS into porous silicon demonstrates that luminescence color tuning is possible when an appropriate functional material is introduced into porous silicon.

1996 ◽  
Vol 452 ◽  
Author(s):  
L. Pavesi ◽  
M. Cazzanelli ◽  
O. Bisi

AbstractThe emission properties of a porous silicon layer placed in an optical microcavity is investigated by photoluminescence and time resolved photoluminescence measurements. The microcavity is formed by an all porous silicon Fabry-Perot filter made by two distributed Bragg reflectors separated by a λ or λ/2 porous silicon layer. Our main findings are that the spontaneous emission spectrum is drastically modified: the linewidth is narrowed, the time decay of the emission is shortened by a factor of about 2/3 at room temperature and the peak emission intensity is increased by a factor of more than 10. These facts are caused by the redistribution of the optical modes in the microcavity due to the presence of the optical resonator and to the variation of the dielectric environment.


1996 ◽  
Vol 03 (02) ◽  
pp. 1235-1239
Author(s):  
K. W. CHEAH ◽  
T. Y. LEUNG ◽  
M. H. CHAN ◽  
S. K. SO

Porous silicon is a material with a coral-like structure which has a fractal surface. To study these aspects of porous silicon and its relationship with the luminescence property, we have used atomic force microscopy (AFM). Samples were prepared using either pure HF or HF diluted with ethanol. From the results of AFM, distinct structural difference was observed from samples prepared by these two etchants. If we relate the structures to their respective photoluminescence spectra, it appears that finer structure produced shorter wavelength peak photoluminescence. However, the columns of the samples were too large for one to attribute the luminescence to quantum confinement only. Hence, an alternative model may be required to explain the luminescence mechanism. We have also observed that the composition of the etchant can also affect the evolution of the fractal dimension with respect to etching time. Probing of the surfcace electron states was performed using photothermal deflection spectroscopy (PDS). In order to ensure that only porous silicon layer was probed, free-standing films of various porosity were produced for the PDS measurement. The probe energy range was from 0.56 eV to 2.5 eV so that both the bulk states and the surface states were probed. The results showed that there is a clear blueshift of the energy band gap with respect to porosity, and the absorption coefficient decreases with porosity increase at a fixed photon energy. Overtones of hydrides and fluorides of silicon were also observed.


2020 ◽  
Vol 12 (4) ◽  
pp. 04020-1-04020-5
Author(s):  
A. P. Oksanich ◽  
◽  
S. E. Pritchin ◽  
M. A. Mashchenko ◽  
A. Yu. Bobryshev ◽  
...  

2017 ◽  
Vol 68 (7) ◽  
pp. 53-57 ◽  
Author(s):  
Martin Kopani ◽  
Milan Mikula ◽  
Daniel Kosnac ◽  
Jan Gregus ◽  
Emil Pincik

AbstractThe morphology and chemical bods of p-type and n-type porous Si was compared. The surface of n-type sample is smooth, homogenous without any features. The surface of p-type sample reveals micrometer-sized islands. FTIR investigation reveals various distribution of SiOxHycomplexes in both p-and n-type samples. From the conditions leading to porous silicon layer formation (the presence of holes) we suggest both SiOxHyand SiFxHycomplexes in the layer.


2020 ◽  
Vol 8 (32) ◽  
pp. 11201-11208
Author(s):  
Yang Mi ◽  
Yaoyao Wu ◽  
Jinchun Shi ◽  
Sheng-Nian Luo

We have achieved single-mode whispering-gallery-mode lasing in CdS microflakes with sharp linewidth (∼0.12 nm) and high quality factor (∼4200). Such lasers are superior to previous CdS lasers in these lasing parameters. Through time-resolved photoluminescence measurements, electron–hole plasma recombination is established to be the lasing mechanism. The radiative recombination rate of CdS microflakes is enhanced by a factor of ∼4.7 due to the Purcell effect.


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