scholarly journals Characterization of the Morphology of Faceted Particles by Transmission Electron Microscopy

2001 ◽  
Vol 703 ◽  
Author(s):  
Shirley Turner ◽  
David S. Bright
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Sample Holder ◽  
Transmission Electron ◽  
Complete Determination ◽  
Faceted Particles ◽  
Microscopy Images

ABSTRACTFaceting in a polyhedral rutile particle was modeled from transmission electron microscopy images. A double-tilt, rotate transmission electron microscope (TEM) sample holder was used to manipulate the particle. Using this holder, it was possible to align the c axis of the particle along one of the axes of the sample holder. This alignment allowed images to be obtained of the particle in several orientations around its c axis. Comparison of dimensions and angles obtained to those obtained for hypothetical models of the particle gives information about its likely prismatic and pyramidal faceting. This approach to facet modeling is useful for more complete determination of the faceting in individual euhedral particles using transmission electron microscopy.

Characterization of submicrometer fluid Inclusions in minerals by Analytical/Transmission Electron Microscopy and electron diffraction

1990 ◽  
Vol 48 (4) ◽  
pp. 424-424
Author(s):  
George Guthrie ◽  
David Veblen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Light Microscopy ◽  
Fluid Inclusions ◽  
Energy Dispersive Spectrometer ◽  
Analytical Transmission Electron Microscopy ◽  
Transmission Electron

The nature of a geologic fluid can often be inferred from fluid-filled cavities (generally <100 μm in size) that are trapped during the growth of a mineral. A variety of techniques enables the fluids and daughter crystals (any solid precipitated from the trapped fluid) to be identified from cavities greater than a few micrometers. Many minerals, however, contain fluid inclusions smaller than a micrometer. Though inclusions this small are difficult or impossible to study by conventional techniques, they are ideally suited for study by analytical/ transmission electron microscopy (A/TEM) and electron diffraction. We have used this technique to study fluid inclusions and daughter crystals in diamond and feldspar.Inclusion-rich samples of diamond and feldspar were ion-thinned to electron transparency and examined with a Philips 420T electron microscope (120 keV) equipped with an EDAX beryllium-windowed energy dispersive spectrometer. Thin edges of the sample were perforated in areas that appeared in light microscopy to be populated densely with inclusions. In a few cases, the perforations were bound polygonal sides to which crystals (structurally and compositionally different from the host mineral) were attached (Figure 1).

Determination of Nanocluster Sizes from Dark-Field Scanning Transmission Electron Microscopy Images

2008 ◽  
Vol 112 (6) ◽  
pp. 1759-1763 ◽  
Author(s):  
Norihiko L. Okamoto ◽  
Bryan W. Reed ◽  
Shareghe Mehraeen ◽  
Apoorva Kulkarni ◽  
David Gene Morgan ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Dark Field ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Microscopy Images

Preparation and Characterization of Monodisperse Ceria Microspheres

2010 ◽  
Vol 434-435 ◽  
pp. 850-852
Author(s):  
Qi Wang ◽  
Bo Yin ◽  
Zhen Wang ◽  
Gen Li Shen ◽  
Yun Fa Chen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Particle Size ◽  
Electron Microscope ◽  
Crystalline Form ◽  
X Ray ◽  
Transmission Electron ◽  
Particle Size Analyzer ◽  
Scanning Electron

In present work, ceria microspheres were synthesized by template hydrothermal method. Crystalline form of the as-synthesized ceria microspheres was defined by X-ray powder diffraction (XRD) and high resolution transmission electron microscopy (HRTEM). Dispersibility of ceria microspheres was comprehensively characterized using scanning electron microscope (SEM) observation and laser particle size analyzer. Furthermore, the ultraviolet light absorption performances of ceria microspheres with several different sizes were compared by ultraviolet visible spectrophotometer. The results showed that ceria microspheres presented excellent UV absorbent property and the size influence was remarkable.

Characterization of the ZnSe/GaAs Interface Layer by Tem and Spectroscopic Ellipsometry

1992 ◽  
Vol 280 ◽  
Author(s):  
R. Dahmani ◽  
L. Salamanca-Riba ◽  
D. P. Beesabathina ◽  
N. V. Nguyen ◽  
D. Chandler-Horowitz ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Spectroscopic Ellipsometry ◽  
Interface Layer ◽  
Transmission Electron ◽  
Three Phase ◽  
Znse Thin Films ◽  
Microscopy Images

ABSTRACTThe interface between ZnSe thin films and GaAs substrates is characterized by High Resolution Transmission Electron Microscopy and room temperature Spectroscopic Ellipsometry. The films were grown on (001) GaAs by Molecular Beam Epitaxy. A three-phase model is used in the reduction of the ellipsometric data, from which the presence of a transition layer of Ga2Se3, with a thickness of less than 1 nm, is confirmed. These results corroborate the high resolution transmission electron microscopy images obtained from the same samples.

Characterization of Magnetic Nanoparticles Using Energy-Selected Transmission Electron Microscopy

2002 ◽  
Vol 8 (5) ◽  
pp. 403-411 ◽  
Author(s):  
María J. Sayagués ◽  
Teresa C. Rojas ◽  
Asunción Fernández ◽  
Rafal E. Dunin-Borkowski ◽  
Ron C. Doole ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Magnetic Nanoparticles ◽  
Inert Gas ◽  
Sonochemical Method ◽  
Nano Composite ◽  
Transmission Electron ◽  
Metal Oxide Layer

Fe, Co, and Ni magnetic nanoparticles have been characterized using energy-selected imaging in a high-resolution transmission electron microscope. The samples comprised Fe/FeOx and Co/CoOx nanoparticles synthesized by inert gas evaporation and a Ni/C nano-composite prepared by a sonochemical method. All of the particles examined were found to be between 5 and 30 nm in size, with the Fe and Co crystals coated in 5–10 nm of metal oxide layer and the Ni metallic crystallites embedded in an amorphous carbon spherical matrix.

A new method for determining the normals to planar structures and their trace directions in transmission electron microscopy

1994 ◽  
Vol 27 (5) ◽  
pp. 762-766 ◽  
Author(s):  
Q. Liu
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
New Method ◽  
Planar Structures ◽  
Transmission Electron

With aid of a transmission-electron-microscope (TEM) double-tilt holder, a method for determining the normals to planar structures and their traces in a TEM is developed. This method is considered to be simple and convenient when compared with other methods. The accuracy of the method for the determination of both the normals to planar structures and their traces is within 2°.

scholarly journals Highly Coherent Femtosecond Electron Pulses for Ultrafast Transmission Electron Microscopy

2019 ◽  
Vol 205 ◽  
pp. 08014
Author(s):  
Nora Bach ◽  
Armin Feist ◽  
Till Domrose ◽  
Thomas Danz ◽  
Marcel Möller ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
High Resolution ◽  
Detailed Characterization ◽  
Transmission Electron ◽  
Electron Imaging ◽  
Femtosecond Electron Pulses ◽  
Electron Pulses

We describe the implementation and detailed characterization of a laser-triggered field-emitter electron source integrated into a modified transmission electron microscope. Highly coherent electron pulses enable high resolution ultrafast electron imaging and diffraction.

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