Characterization of Porous SiC Substrates and of the Epilayer Structures Grown on Them

2002 ◽  
Vol 742 ◽  
Author(s):  
Balaji Raghothamachar ◽  
Jie Bai ◽  
William M. Vetter ◽  
Perena Gouma ◽  
Michael Dudley ◽  
...  
Keyword(s):  
Dislocation Density ◽  
Optical Microscopy ◽  
Epitaxial Growth ◽  
Screw Dislocation ◽  
Pore Morphology ◽  
Porous Substrate ◽  
X Ray ◽  
Porous Sic ◽  
Screw Dislocation Density

ABSTRACTPorous 6H-SiC and 4H-SiC wafers formed by anodization have been characterized in this study prior to and following the CVD deposition of SiC epitaxial layers, using a combination of synchrotron white beam x-ray topography (SWBXT), SEM, TEM and optical microscopy. Under the high temperatures employed during epitaxial growth, a significant change in pore morphology occurs. While no evidence of reduced screw dislocation density in the epilayers is obtained, a small tilt of the epilayers with respect to the porous substrate observed on x-ray topographs could play a role in limiting penetration of defects from the substrate.

SEM Characterization of Silicon Layers Grown on Carbon Foil

2009 ◽  
Vol 156-158 ◽  
pp. 473-476 ◽  
Author(s):  
Sergei K. Brantov ◽  
A.V. Eltzov ◽  
Olga V. Feklisova ◽  
Eugene B. Yakimov
Keyword(s):  
Dislocation Density ◽  
Defect Structure ◽  
Growth Direction ◽  
Carbon Foil ◽  
Twin Boundaries ◽  
X Ray ◽  
Electron Backscattering Diffraction ◽  
Silicon Ribbon ◽  
Selective Chemical

Characterization of defect structure in silicon ribbon grown on carbon foil has been carried out. The structure of grown Si layers and a dislocation density in these layers have been studied using selective chemical etching and the Electron Backscattering Diffraction. It is observed that the layers consist of rather large grains, the majority of which is elongated along the growth direction with a similar surface orientation and with a misorientation angle between neighboring grains of 60º. This means that such grains are separated by the (111) twin boundaries. The dislocation density in different grains is found to vary from 102 to 107cm-2. The energy dispersive X-Ray microanalysis has shown that some twin boundaries are enriched with carbon.

Atomic scale characterization of organometallic vapor phase epitaxial growth using in-situ grazing incidence X-ray scattering

1992 ◽  
Vol 124 (1-4) ◽  
pp. 1-9 ◽  
Author(s):  
D.W. Kisker ◽  
G.B. Stephenson ◽  
P.H. Fuoss ◽  
F.J. Lamelas ◽  
S. Brennan ◽  
...  
Keyword(s):  
Epitaxial Growth ◽  
Vapor Phase ◽  
Grazing Incidence ◽  
Atomic Scale ◽  
X Ray ◽  
X Ray Scattering ◽  
Scale Characterization ◽  
Ray Scattering

scholarly journals Microstructural characterization of snow, firn and ice

2019 ◽  
Vol 377 (2146) ◽  
pp. 20180162 ◽  
Author(s):  
Ian Baker
Keyword(s):  
Optical Microscopy ◽  
Microstructural Characterization ◽  
Theme Issue ◽  
Thin Sections ◽  
X Ray ◽  
The Future ◽  
Microscopy Techniques

This paper provides an overview of techniques used to characterize the microstructure of snow, firn and ice. These range from traditional optical microscopy techniques such as examining thin sections between crossed polarizers to various electron-optical and X-ray techniques. Techniques that could have an impact on microstructural characterization of snow, firn and ice in the future are briefly outlined. This article is part of the theme issue ‘The physics and chemistry of ice: scaffolding across scales, from the viability of life to the formation of planets’.

Characterization of edge dislocation density through X-ray diffraction rocking curves

2020 ◽  
Vol 551 ◽  
pp. 125893
Author(s):  
Yangfeng Li ◽  
Shen Yan ◽  
Xiaotao Hu ◽  
Yimeng Song ◽  
Zhen Deng ◽  
...  
Keyword(s):  
Dislocation Density ◽  
Edge Dislocation ◽  
X Ray Diffraction ◽  
X Ray

Characterization of Inherent Materials of San Antonio Altarpiece in San Roque Church, Campeche

2014 ◽  
Vol 1618 ◽  
pp. 153-160
Author(s):  
Leticia Jiménez ◽  
Diana E. Arano ◽  
José L. Ruvalcaba ◽  
Fanny Unikel
Keyword(s):  
Seventeenth Century ◽  
Optical Microscopy ◽  
San Francisco ◽  
San Antonio ◽  
X Ray ◽  
Analysis Techniques ◽  
Metal Sheets ◽  
Golden Color ◽  
The City

ABSTRACTThe altarpiece dedicated to San Antonio de Padua was made of wood assembled and self-supporting structure attached to the wall. It is a straight plant altarpiece designed to withstand sculptures. This master piece belongs to the a set of Baroque altarpieces preserved in the state of Campeche and is located in San Roque Church in the City of San Francisco de Campeche, Mexico. This altarpiece was decorated following the traditional technique of the seventeenth century in Mexico, a technique derived from Spain. According to literature sources we know that the strata are the wood, the imprimatura, the pictorial strata and metal sheets that make the golden color and corladuras. The characterization of the constituent materials was of great importance for the interpretation of the constructions system and manufacture of the decoration. The present study shows the results of analysis techniques such as optical microscopy, Particle Induce X Ray Emission (PIXE), and X Ray Florescence Spectroscopy (XRF) and interpretation of the different layers constituting the altarpiece of San Antonio.

Correlation of threading screw dislocation density to GaN 2‐DEG mobility

2014 ◽  
Vol 50 (23) ◽  
pp. 1722-1724 ◽  
Author(s):  
J.K. Hite ◽  
P. Gaddipati ◽  
D.J. Meyer ◽  
M.A. Mastro ◽  
C.R. Eddy
Keyword(s):  
Dislocation Density ◽  
Screw Dislocation ◽  
Screw Dislocation Density

Study of Dislocation Densities of Thick GaN Films

2014 ◽  
Vol 989-994 ◽  
pp. 387-390
Author(s):  
Yon Gan Li ◽  
Xiang Qian Xiu ◽  
Xue Mei Hua ◽  
Shi Ying Zhang ◽  
Shi Pu Gu ◽  
...  
Keyword(s):  
High Resolution ◽  
Dislocation Density ◽  
Screw Dislocation ◽  
Edge Dislocation ◽  
Thick Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Dislocation Densities ◽  
Edge Dislocations

The dislocation density of GaN thick films has been measured by high-resolution X-ray diffraction. The results show that both the edge dislocations and the screw dislocation reduce with increasing the GaN thickness. And the edge dislocations have a larger fraction of the total dislocation densities, and the densities for the edge dislocation with increasing thickness reduce less in contrast with those for the screw dislocation.

Advanced Micro-chemical Investigation of Golden Threads from Romanian Byzantine Embroideries by Micro-Particle Induced X-ray Emission (micro-PIXE)

2019 ◽  
Vol 70 (6) ◽  
pp. 1956-1959
Author(s):  
Zizi Ileana Balta ◽  
Ioana Demetrescu ◽  
Irina Petroviciu ◽  
Mihai Lupu
Keyword(s):  
Trace Elements ◽  
Spatial Distribution ◽  
Optical Microscopy ◽  
Elemental Composition ◽  
Depth Profiling ◽  
Composition Distribution ◽  
X Ray ◽  
Constituent Elements ◽  
Elemental Maps

In the present study, golden threads from two, apparently identical, medieval epitrachelions considered masterpieces of the Romanian Byzantine embroidery art, were investigated by using Micro-Particle Induced X-ray Emission (micro-PIXE) and optical microscopy. PIXE measurements allowed to accurate identify the elemental composition, distribution of the trace elements, the layered structures (depth profiling) and thicknesses of the gold layer. Useful information for the characterization of the gilded silver threads due to elemental maps concerning the constituent elements spatial distribution in the sample was also obtained.

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