Depth-Dependent Hardness Characterization by Nanoindentation using a Berkovich Indenter with a Rounded Tip

2005 ◽  
Vol 875 ◽  
Author(s):  
Ju-Young Kim ◽  
David T. Read ◽  
Dongil Kwon
Keyword(s):  
Single Crystal ◽  
Size Effects ◽  
Function Method ◽  
Characteristic Length ◽  
Berkovich Indenter ◽  
Indentation Size ◽  
Height Difference ◽  
Force Microscopy ◽  
Atomic Force ◽  
Fused Quartz

AbstractThe height difference Δhb between the ideally sharp Berkovich indenter tip and a Δhb rounded tip was measured by direct observation using atomic force microscopy (AFM). The accuracy of the indirect area function method for measuring h was confirmed. The Δhb indentation size effects (ISE) in (100) single crystal copper, (100) single crystal tungsten, and fused quartz were characterized by applying the ISE model considering the rounded tip effect. The model fits the data these materials well, even though fused quartz does not deform by dislocations. However, a very small value of the ISE characteristic length h' was obtained for fused quartz. The present h' value for (100) copper is 32% larger than a previously-measured value for polycrystalline copper. This may indicate that grain boundaries suppress the dislocation activity envisioned in the ISE model.

Tip size effects on atomic force microscopy nanoindentation of a gold single crystal

2008 ◽  
Vol 104 (11) ◽  
pp. 113515 ◽  
Author(s):  
Marcel Lucas ◽  
Ken Gall ◽  
Elisa Riedo
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Size Effects ◽  
Force Microscopy ◽  
Atomic Force

BLUNTNESS MEASUREMENT OF A BERKOVICH INDENTER

2011 ◽  
Vol 25 (31) ◽  
pp. 4273-4276 ◽  
Author(s):  
YUN-HEE LEE ◽  
BYUNG-GIL YOO ◽  
JAE-IL JANG
Keyword(s):  
Size Effects ◽  
Indentation Depth ◽  
Three Dimensional ◽  
Image Data ◽  
Curvature Radius ◽  
Berkovich Indenter ◽  
Indentation Size ◽  
Atomic Force ◽  
Observation Method ◽  
Direct Observation Method

Indenter blunting is inevitable in nanoindentations and results in unexpected contact properties. Both relaxation of the indentation size effects and deepening of the substrate effects under a blunted indenter cause a change of the bathtub-shaped hardness with indentation depth in a soft film on hard substrate. Thus an identification of three-dimensional morphology of an indenter apex is necessary for precise measurements of hardness in thin films. We observed an actual Berkovich indenter using an atomic force microscope (AFM). Through a quantitative analysis on the AFM image, data pairs of contact area versus contact depth were obtained; curvature radius of the apex was estimated by searching a sphere well-fitted to the indenter apex morphology. The estimated curvature radius and blunted height were 1043.9±50.9 nm and 44.4 nm, respectively. By comparing with the result from the modified Kick's law, both blunted heights were comparable each other within a 7 nm difference. This confirms validity of the direct observation method with the AFM.

scholarly journals Interface Structures and Electronic States of Epitaxial Tetraazanaphthacene on Single-Crystal Pentacene

Materials ◽  
2021 ◽  
Vol 14 (5) ◽  
pp. 1088
Author(s):  
Yuki Gunjo ◽  
Hajime Kamebuchi ◽  
Ryohei Tsuruta ◽  
Masaki Iwashita ◽  
Kana Takahashi ◽  
...  
Keyword(s):  
Single Crystal ◽  
Photoelectron Spectroscopy ◽  
Grazing Incidence ◽  
Force Microscopy ◽  
Interface Dipole ◽  
Atomic Force ◽  
Interfacial Structures ◽  
Donor And Acceptor ◽  
A Charge ◽  
Interface Structures

The structural and electronic properties of interfaces composed of donor and acceptor molecules play important roles in the development of organic opto-electronic devices. Epitaxial growth of organic semiconductor molecules offers a possibility to control the interfacial structures and to explore precise properties at the intermolecular contacts. 5,6,11,12-tetraazanaphthacene (TANC) is an acceptor molecule with a molecular structure similar to that of pentacene, a representative donor material, and thus, good compatibility with pentacene is expected. In this study, the physicochemical properties of the molecular interface between TANC and pentacene single crystal (PnSC) substrates were analyzed by atomic force microscopy, grazing-incidence X-ray diffraction (GIXD), and photoelectron spectroscopy. GIXD revealed that TANC molecules assemble into epitaxial overlayers of the (010) oriented crystallites by aligning an axis where the side edges of the molecules face each other along the [1¯10] direction of the PnSC. No apparent interface dipole was found, and the energy level offset between the highest occupied molecular orbitals of TANC and the PnSC was determined to be 1.75 eV, which led to a charge transfer gap width of 0.7 eV at the interface.

Operando atomic force microscopy study of electric double-layer transistors based on ionic liquid/rubrene single crystal interfaces

2021 ◽  
Vol 118 (24) ◽  
pp. 243301
Author(s):  
Yusuke Morino ◽  
Yasuyuki Yokota ◽  
Ken-ichi Bando ◽  
Hisaya Hara ◽  
Akihito Imanishi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Double Layer ◽  
Electric Double Layer ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force ◽  
Crystal Interfaces

2 MeV PROTON IRRADIATION EFFECTS ON ZnO SINGLE CRYSTAL

2014 ◽  
Vol 21 (01) ◽  
pp. 1450012 ◽  
Author(s):  
T. SECHOGELA ◽  
L. KOTSEDI ◽  
M. NKOSI ◽  
C. SANDT ◽  
R. MADJOE ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Single Crystal ◽  
Proton Irradiation ◽  
Proton Bombardment ◽  
Irradiation Effects ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Alteration ◽  
Zno Crystal ◽  
Zno Single Crystal

Melt grown ZnO single crystal was irradiated with varying fluence of 2 MeV proton beam in the range of 1 × 1016 H +/cm2 to 5 × 1017 H +/cm2. The irradiated spots exhibited varying degree of discoloration due to the irradiation indicating surface and volume defects. The surface roughness of the irradiated spots was measured using atomic force microscopy indicating surface modification of the sample. The extent of the damage on the ZnO single crystal from radiation was assessed using Raman spectroscopy. The emergence of the A1( LO ) band at 579 cm-1 pointed to the significant surface alteration in the ZnO crystal due to proton bombardment.

Microscopy and microindentation mechanics of single crystal Fe−3 wt. % Si: Part I. Atomic force microscopy of a small indentation

1993 ◽  
Vol 8 (6) ◽  
pp. 1291-1299 ◽  
Author(s):  
S. Harvey ◽  
H. Huang ◽  
S. Venkataraman ◽  
W.W. Gerberich
Keyword(s):  
Plastic Zone ◽  
Single Crystal ◽  
Surface Displacement ◽  
Plastic Zone Size ◽  
Force Microscopy ◽  
Elastic Plastic ◽  
Atomic Force ◽  
Plastic Indentation ◽  
Volume Estimates ◽  
Small Indentation

Atomic force microscope measurements of elastic-plastic indentation into an Fe−3 wt. % Si single crystal showed that the volume displaced to the surface is nearly equal to the volume of the cavity. The surface displacement profiles and plastic zone size caused by a 69 nm penetration of a Vickers diamond tip are reasonably represented by an elastic-plastic continuum model. Invoking conservation of volume, estimates of the number of dislocations emanating from the free surface are reasonably consistent with the number of dislocations that have formed in the plastic zone to represent an average calculated plastic strain of 0.044.

Surface observations of synthetic hydroxyapatite single crystal by atomic force microscopy

1995 ◽  
Vol 148 (1-2) ◽  
pp. 201-206 ◽  
Author(s):  
Kazuo Onuma ◽  
Atsuo Ito ◽  
Tetsuya Tateishi ◽  
Tetsuya Kameyama
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Force Microscopy ◽  
Atomic Force ◽  
Synthetic Hydroxyapatite ◽  
Surface Observations

Tribochemical wear of single crystal aluminum in NaCl solution studied by atomic force microscopy

2011 ◽  
Vol 110 (6) ◽  
pp. 063509 ◽  
Author(s):  
M. Cai ◽  
S. C. Langford ◽  
J. T. Dickinson
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Nacl Solution ◽  
Force Microscopy ◽  
Atomic Force
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