scholarly journals Van Der Waals Epitaxial Growth of Bismuth Thin-film on Silicon (111) Substrate by MBE

2021 ◽  
Author(s):  
Chieh Chou ◽  
Po-Siun Wu ◽  
Hao-Hsiung Lin
Keyword(s):  
Thin Film ◽  
Van Der Waals ◽  
Electron Back Scatter Diffraction ◽  
X Ray Diffraction ◽  
X Ray ◽  
Selected Area Electron Diffraction ◽  
Pole Figures ◽  
Angle Difference ◽  
Diffraction Patterns ◽  
Φ Angle

Abstract Crystallinity of an 80-nm-thick bismuth thin film grown on Si(111) substrate by MBE was investigated. The highly (0003) textured Bi film contains two twinning domains with different bilayer stacking sequences. The basic lattice parameters c and a as well as b, the bilayer thickness, of the two domains were determined from a series of X-ray diffraction (XRD) measurements, and found that the differences are within 0.1% as compared with those of bulk Bi reported in literature, suggesting that the Bi film has been nearly fully relaxed. From the XRD φ-scans of asymmetric Bi (01-14), (10-15), (11-26) planes and Si (220) plane as well as selected area electron diffraction patterns and electron back scatter diffraction pole figures, we confirmed the well registration between the lattices of Si and Bi lattice, i.e. the ω angle difference between Bi[0003] and Si[111] and the φ angle different between Bi[01-14] and Si[220] are 0.056° and 0.25°, respectively, and thus concluded that the growth is a quasi-van der Waals epitaxy.

scholarly journals Deep learning for visualization and novelty detection in large X-ray diffraction datasets

2021 ◽  
Vol 7 (1) ◽  
Author(s):  
Lars Banko ◽  
Phillip M. Maffettone ◽  
Dennis Naujoks ◽  
Daniel Olds ◽  
Alfred Ludwig
Keyword(s):  
Thin Film ◽  
Crystal Structure ◽  
Artificial Intelligence ◽  
Deep Learning ◽  
Novelty Detection ◽  
Structural Similarity ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Patterns ◽  
Post Hoc

AbstractWe apply variational autoencoders (VAE) to X-ray diffraction (XRD) data analysis on both simulated and experimental thin-film data. We show that crystal structure representations learned by a VAE reveal latent information, such as the structural similarity of textured diffraction patterns. While other artificial intelligence (AI) agents are effective at classifying XRD data into known phases, a similarly conditioned VAE is uniquely effective at knowing what it doesn’t know: it can rapidly identify data outside the distribution it was trained on, such as novel phases and mixtures. These capabilities demonstrate that a VAE is a valuable AI agent for aiding materials discovery and understanding XRD measurements both ‘on-the-fly’ and during post hoc analysis.

A Chemical Solution Route to Rapid Synthesis of Homogeneous Bi100−xSbx Alloys Nanoparticles at Room Temperature

2007 ◽  
Vol 7 (2) ◽  
pp. 525-529 ◽  
Author(s):  
Bo Zhou ◽  
Jun-Jie Zhu
Keyword(s):  
Room Temperature ◽  
Raw Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Selected Area Electron Diffraction ◽  
Transmission Electron ◽  
Solution Route ◽  
Diffraction Patterns ◽  
Co Reduction ◽  
Chemical Solution Route

A chemical co-reduction route in aqueous solution was developed to synthesize Bi100−xSbx alloys at room temperature. The hydrolyses of Bi(III) and Sb(III) were effectively avoided by selecting proper raw materials and coordinator. X-ray diffraction analysis indicated that the as-prepared Bi100−xSbx alloys were homogeneous and phase-pure, and the Bi/Sb ratios in the alloys were very close to those in the aqueous solutions. The transmission electron microscope observation showed that the as-prepared Bi100−xSbx (x = 0∼100) alloys were particles with a size of tens of nanometers. The selected area electron diffraction patterns confirmed the high crystallinity, the homogeneousness, and the composition controllability of as-prepared alloys. All these characters and the nanometer-scaled size of the alloys are believed to be beneficial to the thermoelectric property of the Bi100−xSbx alloys.

X-ray Diffraction and Modelling Studies of Multilayer SnO2 Thin Film Gas Sensors

1995 ◽  
Vol 403 ◽  
Author(s):  
L. E. Depero ◽  
C. Perego ◽  
L. Sangaletti ◽  
G. Sberveglieri
Keyword(s):  
Thin Film ◽  
Orthorhombic Phase ◽  
Sno2 Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
Modelling Studies ◽  
Cation Coordination ◽  
Diffraction Patterns ◽  
Two Phases ◽  
The Relationship

AbstractStructural studies have been carried out on SnO2 multilayer thin film grown by the Rheotaxial Growth and Thermal Oxidation method on A120 3 substrates. A preliminary analysis of the X-ray diffraction patterns shows that, in addition to the Sn0 2 cassiterite phase, a strong contribution from an orthorhombic Sn02 phase is present.In the case of the 3-layer film, the orthorhombic phase is structurally and microstructurally stable after an annealing up to 32 h at 400 'C. The cation coordination is similar to that found in cassiterite, but the chains of edge-sharing [SnO6]8- octahedra run in a zig-zag fashion along the [100] direction, each straight unit containing four octahedra. The relationship between the two phases is discussed on the basis of structural simulations including twinning planes in the crystal structure.

MgSiO3 perovskite: a HRTEM study

1996 ◽  
Vol 60 (402) ◽  
pp. 799-804
Author(s):  
Ishmael Hassan ◽  
Yasuhiro Kudoh ◽  
Peter R. Buseck ◽  
Eui Ito
Keyword(s):  
X Ray Diffraction ◽  
Phase Boundaries ◽  
Orthorhombic Unit Cell ◽  
X Ray ◽  
Mgsio3 Perovskite ◽  
Selected Area Electron Diffraction ◽  
Transmission Electron ◽  
Cell Dimensions ◽  
Crystal Fragment ◽  
Diffraction Patterns

AbstractSelected-area electron diffraction patterns for the [110] zone of MgSiO3 perovskite are consistent with the orthorhombic unit cell obtained by X-ray diffraction (a = 4.775, b = 4.929, c = 6.897 Å). Various areas of a crystal fragment show diffuse streaking along c*, and well-developed satellite reflections that give a 3-fold repeat along [10]*. Another fragment shows doubled cell dimensions when viewed down [30]. The variable occurrence of the satellite reflectioncs and diffuse streaking indicate subtle variations in ordering, chemistry, or both. Images obtained by high-resolution transmission electron microscopy contain perfectly ordered regions, out-of-phase boundaries, and intergrowths of the two orthorhombic forms of perovskite.

Ordering of Mg and Nb in the octahedral positions of the “cubic” perovskite structure of Pb3MgNb2O9

1971 ◽  
Vol 134 (1-2) ◽  
Author(s):  
H. Brigitte Krause ◽  
Donald L. Gibbon
Keyword(s):  
Electron Diffraction ◽  
Single Crystals ◽  
Perovskite Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Selected Area Electron Diffraction ◽  
Diffraction Patterns

AbstractSelected-area electron-diffraction patterns and x-ray diffraction powder patterns were taken of crushed single crystals of Pb

Reduced-pressure MOCVD of highly crystalline BaTiO3 thin films

1992 ◽  
Vol 7 (3) ◽  
pp. 542-545 ◽  
Author(s):  
Peter C. Van Buskirk ◽  
Robin Gardiner ◽  
Peter S. Kirlin ◽  
Steven Nutt
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Total Pressure ◽  
Single Phase ◽  
X Ray Diffraction ◽  
Reduced Pressure ◽  
X Ray ◽  
Selected Area Electron Diffraction ◽  
Diffraction Patterns ◽  
First Time

Epitaxial BaTi3 films have been grown on NdGaO3 [100] substrates by reduced pressure MOCVD for the first time. The substrate temperature was 1000 °C and the total pressure was 4 Torr. Electron and x-ray diffraction measurements indicate highly textured, single phase films on the NdGaO3 substrate which are predominantly [100], with [110] also present. TEM and selected area electron diffraction (SAED) indicate two specific orientational relationships between the [110] and the [001] diffraction patterns.

Microstructural Studies of Sputtered Co90Fe10/Ag GMR Multilayers

1997 ◽  
Vol 475 ◽  
Author(s):  
J.D. Jarratt ◽  
T.J. Klemmer ◽  
J.A. Barnard
Keyword(s):  
Multilayer Films ◽  
X Ray Diffraction ◽  
Satellite Peak ◽  
Cross Sectional ◽  
X Ray ◽  
Selected Area Electron Diffraction ◽  
Transmission Electron ◽  
Columnar Grains ◽  
Diffraction Patterns ◽  
Microstructural Studies

ABSTRACTThe microstructure of Co90Feio/Ag giant magnetoresistive multilayer films has been investigated using x-ray diffraction (XRD) and cross-sectional transmission electron microscopy. Columnar grains with a (111) fiber growth texture is observed. A comparison is made between the observed layering structure and earlier multilayer schematics based on the literature and magnetic and magnetoresistive measurements as a function of layer thickness. A direct correlation is made between superlattice satellite peak signals from selected area electron diffraction patterns and XRD scans.

The Gamma to Alpha Transformation in Thin Film Alumina

1984 ◽  
Vol 41 ◽  
Author(s):  
E. M. Clausen ◽  
J. J. Hren
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thermal History ◽  
Starting Material ◽  
X Ray Diffraction ◽  
Transition Alumina ◽  
X Ray ◽  
Aluminum Hydroxides ◽  
Transitional Forms ◽  
Diffraction Patterns

AbstractMany forms of low temperature alumina have been identified [1]. These are collectively referred to as transitional forms. The particular form depends strongly on the starting material (e.g., hydrated, thermally oxidized, alkoxide, etc.), the impurities present, and on thermal history. Although different forms of transition alumina are sometimes referred to as phases, none can be considered a true polymorph of corundum, i.e., α-alumina. Transformations from one form to another which occur upon heating are not reversible, although they are quite reproducible [2]. These different transitional structures are therefore considered to comprise different states of reordering. Figure 1 is a compendium of powder x-ray diffraction patterns from all known transitional aluminas and several aluminum hydroxides [3]. It i.s obvious that there are several crystallographic spacings which are nearly common to all forms.

X-ray diffraction patterns of C60 films by the thin film method and the intercalation of O2

1997 ◽  
Vol 113-114 ◽  
pp. 282-285 ◽  
Author(s):  
Takashi Itoh ◽  
Shoji Nitta ◽  
Shuichi Nonomura
Keyword(s):  
Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Patterns ◽  
C60 Films ◽  
Film Method

Improvement of beamline 4B9A and results of an X-ray diffraction experiment

1998 ◽  
Vol 5 (3) ◽  
pp. 503-505
Author(s):  
D. W. Wang ◽  
H. Y. Jiang ◽  
Z. H. Wu ◽  
X. S. Wu ◽  
S. S. Jiang ◽  
...  
Keyword(s):  
Thin Film ◽  
Photon Energy ◽  
Tetragonal Symmetry ◽  
Second Phase ◽  
Diffraction Experiment ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cylindrical Mirror ◽  
Diffraction Patterns ◽  
Maximum Photon

4B9A is a focusing and monochromatic photon beam at the BSRF, which was constructed in 1990. During the second phase of the BSRF program, the surface of the cylindrical mirror has been coated with Pt, covering the original Ni, and the monochromator has been upgraded. The maximum photon energy extends to 11 keV and the intensity has increased about tenfold with respect to the previous intensity at 6 keV. Synchrotron X-ray diffraction patterns for the Hg-1223 (HgBa2Ca2Cu3O8+δ) superconducting bulk and thin film have been measured at 1.54014 Å. Results indicate that the bulk and film can be indexed as possessing tetragonal symmetry; lattice parameters a = 3.856 Å and c = 15.851 Å for the bulk Hg-1223 compound, and a = 3.8517 Å and c = 15.8511 Å for the film. Their structures are similar.

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