Ambipolar Current Suppression, Analog/RF and Linearity Performance Improvement of Dual Material Stacked Gate Oxide TFET with Dielectric Pocket

In this article, the impact of high-K and low-K dielectric pockets on DC, analog/RF, and linearity performance parameters of dual material stacked gate oxide-dielectric pocket-tunnel field-effect transistor (DMSGO-DP-TFET) is investigated. In this regard, a stacked gate oxide (SiO2 + HfO2) with workfunction engineering is taken into consideration to improve the ON-state current (ION ), and suppress the ambipolar current (Iamb). To further improve the performance of the device, a high-K dielectric pocket (HfO2) is used at the drain-channel interface to suppress the Iamb, and at the source-channel interface a low-K dielectric pocket is used to improve the ION and analog/RF performance. Moreover, length of stacked gate segments (L1, L2, L3), pocket height, and thickness are optimized to attain better ION /IOFF ratio, and suppress the Iamb which helps to achieve higher gain and design of analog/RF circuits. The DMSGO-DP-TFET outperforms the dual material control gate-dielectric pocket-TFET (DMCG-DP-TFET) with SiO2 gate oxide and shows increment in ION /IOFF (∼ 4.23 times), 84 % increment in transconductance (gm), 136 % increment in cut-off frequency (fT ), 126 % increment in gain-bandwidth-product (GBP), and better linearity performance parametrs such as gm2 ,gm3, VIP2, VIP3 and IIP3 making the proposed device useful for low power and radio frequency applications.