1604-PICE SIMULATION PROGRAM OPERATING INSTRUCTIONS (MILESTONE VII) DATA REDUCTION AND OUTPUT PROCESSING SYSTEM

1962 ◽  
Author(s):  
P. T. Kastama
Keyword(s):  
Data Reduction ◽  
Processing System ◽  
Simulation Program ◽  
Operating Instructions

OPERATING INSTRUCTIONS FOR THE AUGMENTED TRACK ING STATION SIMULATION PROGRAM (SIMSTN) MILESTONE 7

1963 ◽  
Author(s):  
SYSTEM DEVELOPMENT CORP SANTA MONICA CA
Keyword(s):  
Simulation Program ◽  
Operating Instructions

Safeguard Data-Processing System: SAFEGUARD Data Reduction System

1975 ◽  
Vol 54 (10) ◽  
pp. S181-S189
Author(s):  
E. S. Hoover ◽  
R. A. Jacoby
Keyword(s):  
Data Processing ◽  
Data Reduction ◽  
Processing System ◽  
Data Processing System ◽  
Reduction System

scholarly journals Data Reduction and Imaging of Gravitational Lens System Class B0631+519

2020 ◽  
Vol 57 (1-2) ◽  
pp. 41-51
Author(s):  
K. Prūsis ◽  
A. Nikolajevs
Keyword(s):  
Data Reduction ◽  
Processing System ◽  
Gravitational Lens ◽  
Small Scale ◽  
Lens System ◽  
Automatic Data ◽  
Specific Data ◽  
Faraday Effects ◽  
Astronomical Image Processing ◽  
Processing Steps

AbstractThe present paper describes reduction procedures and imaging of radio astronomical data from the gravitational lens system CLASS B0631+519 acquired by e-MERLIN interferometer. The source has been previously imaged with VLA, MERLIN and the VLBA interferometers. Data reduction and polarisation calibration procedures will provide data on Faraday effects such as Faraday rotation and depolarization between lensed images that in turn carry information on large and small-scale magnetic fields in the lensing galaxy.Reduction of data and imaging of the radio astronomical source have been achieved using Astronomical Image Processing System (AIPS) in conjunction with automatic data reduction pipelines that performed specific data processing steps. As a result, the sky map for the gravitational lens system has been successfully acquired and accuracy comparing the generated map to sky maps of the source produced by different authors has been confirmed.

Digital image processing methods applied to the study of annealing time on semiconductor-metal eutectic composites

1988 ◽  
Vol 46 ◽  
pp. 848-849
Author(s):  
J. Hefter
Keyword(s):  
Image Processing ◽  
Digital Image Processing ◽  
Digital Image ◽  
Electronic Device ◽  
Processing System ◽  
Average Diameter ◽  
Eutectic Solidification ◽  
Metal Silicide ◽  
The Matrix ◽  
Microscopic Studies

Semiconductor-metal composites, formed by the eutectic solidification of silicon and a metal silicide have been under investigation for some time for a number of electronic device applications. This composite system is comprised of a silicon matrix containing extended metal-silicide rod-shaped structures aligned in parallel throughout the material. The average diameter of such a rod in a typical system is about 1 μm. Thus, characterization of the rod morphology by electron microscope methods is necessitated.The types of morphometric information that may be obtained from such microscopic studies coupled with image processing are (i) the area fraction of rods in the matrix, (ii) the average rod diameter, (iii) an average circularity (roundness), and (iv) the number density (Nd;rods/cm2). To acquire electron images of these materials, a digital image processing system (Tracor Northern 5500/5600) attached to a JEOL JXA-840 analytical SEM has been used.

Digital Processing of STEM Images

1981 ◽  
Vol 39 ◽  
pp. 236-237
Author(s):  
A. V. Crewe ◽  
M. Ohtsuki
Keyword(s):  
High Resolution ◽  
Low Dose ◽  
Assembly Language ◽  
Processing System ◽  
Principal Component ◽  
Digital Processing ◽  
Image Analysis System ◽  
Black And White ◽  
Analysis System ◽  
Dose Imaging

We have assembled an image processing system for use with our high resolution STEM for the particular purpose of working with low dose images of biological specimens. The system is quite flexible, however, and can be used for a wide variety of images.The original images are stored on magnetic tape at the microscope using the digitized signals from the detectors. For low dose imaging, these are “first scan” exposures using an automatic montage system. One Nova minicomputer and one tape drive are dedicated to this task.The principal component of the image analysis system is a Lexidata 3400 frame store memory. This memory is arranged in a 640 x 512 x 16 bit configuration. Images are displayed simultaneously on two high resolution monitors, one color and one black and white. Interaction with the memory is obtained using a Nova 4 (32K) computer and a trackball and switch unit provided by Lexidata.The language used is BASIC and uses a variety of assembly language Calls, some provided by Lexidata, but the majority written by students (D. Kopf and N. Townes).

Software pattern recognition applied to nanodiffraction patterns from a STEM instrument

1986 ◽  
Vol 44 ◽  
pp. 694-695
Author(s):  
G.Y. Fan ◽  
J.M. Cowley
Keyword(s):  
Image Processing ◽  
Pattern Recognition ◽  
Computer Software ◽  
Processing System ◽  
Light Level ◽  
Host Computer ◽  
Low Light ◽  
Image Processing System ◽  
Recent Developments ◽  
On Line

In recent developments, the ASU HB5 has been modified so that the timing, positioning, and scanning of the finely focused electron probe can be entirely controlled by a host computer. This made the asynchronized handshake possible between the HB5 STEM and the image processing system which consists of host computer (PDP 11/34), DeAnza image processor (IP 5000) which is interfaced with a low-light level TV camera, array processor (AP 400) and various peripheral devices. This greatly facilitates the pattern recognition technique initiated by Monosmith and Cowley. Software called NANHB5 is under development which, instead of employing a set of photo-diodes to detect strong spots on a TV screen, uses various software techniques including on-line fast Fourier transform (FFT) to recognize patterns of greater complexity, taking advantage of the sophistication of our image processing system and the flexibility of computer software.

High-resolution measurement of birefringent fine structure in living cells using a new polarized light microscope

1995 ◽  
Vol 53 ◽  
pp. 54-55
Author(s):  
Rudolf Oldenbourg
Keyword(s):  
Light Microscope ◽  
Fluorescent Dyes ◽  
Polarized Light ◽  
Processing System ◽  
Video Camera ◽  
Molecular Organization ◽  
Computer Assisted ◽  
Image Recording ◽  
Birefringent Crystal ◽  
Technological Advances

The recent renaissance of the light microsope is fueled in part by technological advances in components on the periphery of the microscope, such as the laser as illumination source, electronic image recording (video), computer assisted image analysis and the biochemistry of fluorescent dyes for labeling specimens. After great progress in these peripheral parts, it seems timely to examine the optics itself and ask how progress in the periphery facilitates the use of new optical components and of new optical designs inside the microscope. Some results of this fruitful reflection are presented in this symposium.We have considered the polarized light microscope, and developed a design that replaces the traditional compensator, typically a birefringent crystal plate, with a precision universal compensator made of two liquid crystal variable retarders. A video camera and digital image processing system provide fast measurements of specimen anisotropy (retardance magnitude and azimuth) at ALL POINTS of the image forming the field of view. The images document fine structural and molecular organization within a thin optical section of the specimen.

Computer averaging of lattice images of poly-4-methyl-pentene-1 (P4mp1): Noise created artifacts

1987 ◽  
Vol 45 ◽  
pp. 388-389
Author(s):  
P. Pradère ◽  
J.F. Revol ◽  
R. St. John Manley
Keyword(s):  
Low Dose ◽  
Polymer Concentration ◽  
Processing System ◽  
Limiting Factor ◽  
Dilute Solution ◽  
New Techniques ◽  
Dose Unit ◽  
Lattice Images ◽  
Dose Imaging ◽  
Imaging Conditions

Although radiation damage is the limiting factor in HREM of polymers, new techniques based on low dose imaging at low magnification have permitted lattice images to be obtained from very radiation sensitive polymers such as polyethylene (PE). This paper describes the computer averaging of P4MP1 lattice images. P4MP1 is even more sensitive than PE (total end point dose of 27 C m-2 as compared to 100 C m-2 for PE at 120 kV). It does, however, have the advantage of forming flat crystals from dilute solution and no change in d-spacings is observed during irradiation.Crystals of P4MP1 were grown at 60°C in xylene (polymer concentration 0.05%). Electron microscopy was performed with a Philips EM 400 T microscope equipped with a Low Dose Unit and operated at 120 kV. Imaging conditions were the same as already described elsewhere. Enlarged micrographs were digitized and processed with the Spider image processing system.

Investigation of thin sections of biological standards by EDX, EELS, and Auger electron spectroscopy

1990 ◽  
Vol 48 (2) ◽  
pp. 184-185
Author(s):  
S. Lehner ◽  
H.E. Bauer ◽  
R. Wurster ◽  
H. Seiler
Keyword(s):  
Processing System ◽  
Beam Current ◽  
Beam Diameter ◽  
Thin Sections ◽  
Biologically Relevant ◽  
Energy Filtering ◽  
Low Viscosity ◽  
Carbon Foils ◽  
Electron Microscopical ◽  
Exchange Membrane

In order to compare different microanalytical techniques commercially available cation exchange membrane SC-1 (Stantech Inc, Palo Alto), was loaded with biologically relevant elements as Na, Mg, K, and Ca, respectively, each to its highest possible concentration, given by the number concentration of exchangeable binding sites (4 % wt. for Ca). Washing in distilled water, dehydration through a graded series of ethanol, infiltration and embedding in Spurr’s low viscosity epoxy resin was followed by thin sectioning. The thin sections (thickness of about 50 nm) were prepared on carbon foils and mounted on electron microscopical finder grids.The samples were analyzed with electron microprobe JXA 50A with transmitted electron device, EDX system TN 5400, and on line operating image processing system SEM-IPS, energy filtering electron microscope CEM 902 with EELS/ESI and Auger spectrometer 545 Perkin Elmer.With EDX, a beam current of some 10-10 A and a beam diameter of about 10 nm, a minimum-detectable mass of 10-20 g Ca seems within reach.

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