scholarly journals ELEMENTAL ANALYSIS OF AEROSOL SAMPLES USING PIXE TECHNIQUE

2021 ◽  
Vol 9 (5) ◽  
pp. 175-180
Author(s):  
Deepali Modi
Keyword(s):  
Trace Elements ◽  
Data Analysis ◽  
Proton Beam ◽  
Elemental Analysis ◽  
Hpge Detector ◽  
Low Energy ◽  
X Rays ◽  
X Ray ◽  
Minor Elements

In this work a complex study of the capabilities Particle Induced X-Ray emission(PIXE) technique for the determination of minor constituents of aerosol samples has been done.The PIXE experiments were carried out at Cyclotron at Department of Physics, Panjab University Chandigarh using ~2.7MeV proton beam. The X-rays were detected with the help of low energy HPGE detector. Total fifteen samples were collected from various locations in Chandigarh.The minor elements identified in the aerosol samples wereS,Cl,K,Ca,Ti,Cr,Mn,Fe,Ni,Zn,V,Br and Pb. The data analysis was done using GUPIX software to extract the quantity of the trace elements.

scholarly journals Radionuclide x-ray fluorescence analysis of selected elements in agrimony tea samples with preconcentration

2013 ◽  
Vol 60 (2) ◽  
pp. 29-36
Author(s):  
Mikušová V. ◽  
Lukačovičová O. ◽  
Havránek E.
Keyword(s):  
Elemental Analysis ◽  
Analytical Method ◽  
Fluorescence Analysis ◽  
Low Energy ◽  
X Ray ◽  
Nitrocellulose Filter ◽  
Nuclear Analytical Method ◽  
Energy Gamma ◽  
Solid Form

Abstract The contents of selected elements (Mn, Fe, Co, Ni, Cu, Zn, Hg and Pb) in samples of loose tea of agrimony “Repikovy čaj” (Agrimonia eupatoria L.) were studied in this work. Identification and determination of the selected elements content were performed using X-ray fluorescence spectrometry - the nuclear analytical method based on the interaction between low-energy gamma and X radiation and analysed substance. Solid form samples were pressed in tablets and directly analysed. Prepared infusions were analysed after the preconcentration of the elements using precipitation with thioacetamide and ammonium diethyldithiocarbamate with subsequent filtration of created precipitates through a nitrocellulose filter. Detection limits obtained from both methods were compared and their suitability for elemental analysis of plant preparations was discussed.

ELEMENTAL ANALYSIS OF GROUND WATER USING PIXE AND PIGE TECHNIQUES

2012 ◽  
Vol 22 (03n04) ◽  
pp. 259-269 ◽  
Author(s):  
RAJBIR KAUR ◽  
A. KUMAR ◽  
B. P. MOHANTY ◽  
MUMTAZ OSWAL ◽  
NAVNEET KAUR ◽  
...  
Keyword(s):  
Trace Elements ◽  
Ground Water ◽  
Elemental Analysis ◽  
Water Samples ◽  
Gamma Ray ◽  
Elemental Content ◽  
Human Beings ◽  
X Ray ◽  
Gamma Ray Emission

Water is the most important source of minerals for both human beings and animals. But at the same time, water is also a source of disease due to the contamination of various elements. Therefore, knowledge of the elemental content of water is important. In this work, water samples were collected from areas around Chandigarh and Bathinda district, Panjab, India. Proton-induced X-ray emission (PIXE) and proton-induced gamma-ray emission (PIGE) techniques were used for the determination of heavy and light trace elements, respectively, in wide varieties of water samples. A large number of elements, namely F, Na, S, Cl, K, Ca, Ti, Cr, Mn, Fe, Cu, Zn, As, Pb , and U were detected in the samples and results are discussed.

Preliminary Study Of the Behavior Of HPGe Detectors With Ion Implanted Contacts in the Ultralow-Energy X-Ray Region

1981 ◽  
Vol 25 ◽  
pp. 23-30 ◽  
Author(s):  
M. Slapa ◽  
J. Chwaszczewska ◽  
J. Jurkowski ◽  
A. Latussynski ◽  
G.C. Huth ◽  
...  
Keyword(s):  
Hpge Detector ◽  
Low Energy ◽  
Entrance Window ◽  
X Rays ◽  
X Ray ◽  
Ultralow Energy ◽  
Hpge Detectors ◽  
Preliminary Study ◽  
First Time ◽  
Ion Implanted

AbstractPreliminary study of performance of an HPGe detector with an ion implanted entrance window in the spectrometry of the ultralowenergy x-rays is presented.For the first time it has been shown that almost symmetric photopeaks and absence of low energy tailing can be obtained in this region from HPGe detectors.

ELEMENTAL ANALYSIS OF ANCIENT CHINESE BRONZE ARTIFACTS WITH EXTERNAL-BEAM PIXE

1992 ◽  
Vol 02 (03) ◽  
pp. 269-284 ◽  
Author(s):  
E.K. Lin ◽  
Y.C. Yu ◽  
C.W. Wang ◽  
C.T. Shen ◽  
Y.M. Huang ◽  
...  
Keyword(s):  
Elemental Composition ◽  
Elemental Analysis ◽  
Analytical Method ◽  
Hpge Detector ◽  
External Beam ◽  
X Ray

External-beam PIXE has been applied for the determination of the elemental composition of ancient Chinese bronze artifacts. Characteristic x-ray spectra from the samples bombarded with protons of 3 MeV have been measured with a HPGe detector. At each sample three spots were irradiated per run. Results of measurements on three fragments of bronze drinking vessels and helmet of Chinese ancient Chou and Shang dynasties (17th-8th century B.C.) are presented. To check the analytical method, we have also made measurements on the elemental composition of some modern coins. The results are discussed.

Simultaneous determination of trace elements in lavage fluids from human bronchial alveoli by energy-dispersive x-ray fluorescence. 2: Determination of abnormal lavage contents and verification of the results.

1986 ◽  
Vol 32 (4) ◽  
pp. 664-668 ◽  
Author(s):  
E A Maier ◽  
A Dietemann-Molard ◽  
F Rastegar ◽  
R Heimburger ◽  
C Ruch ◽  
...  
Keyword(s):  
Trace Elements ◽  
Occupational Exposure ◽  
Simultaneous Determination ◽  
Elemental Analysis ◽  
Detection Limits ◽  
Energy Dispersive ◽  
X Ray

Abstract We applied energy-dispersive x-ray fluorescence to the determination of abnormally present elements or abnormal concentrations of elements in human broncho-alveolar lavage fluids. The low detection limits and the ability to perform multi-elemental analysis permit one to establish or confirm occupational exposure of workers. We also describe different methods used to check our method and our results. We report examples of abnormal compositions of broncho-alveolar lavages containing W, Ce, La, Nd, I, Fe, or Ni. We discuss the limits of the method for characterizing silicosis or asbestosis.

MEASUREMENT OF GERMANIUM ESCAPE PEAKS IN PIXE SPECTRA RECORDED USING HIGH PURITY Ge (HPGe) DETECTOR

2009 ◽  
Vol 19 (01n02) ◽  
pp. 67-76
Author(s):  
SANJIV KUMAR ◽  
G. L. N. REDDY ◽  
V. S. RAJU
Keyword(s):  
Quantitative Analysis ◽  
High Purity ◽  
Hpge Detector ◽  
X Rays ◽  
Pixe Analysis ◽  
Escape Peak ◽  
X Ray ◽  
High Purity Germanium ◽  
Experimental Values

This paper deals with studies on Ge K α and K β escape peaks in particle induced X-ray emission (PIXE) spectra recorded by a high purity germanium (HPGe) detector. A knowledge of the energies and intensities of these escape peaks is desirable for accurate qualitative as well as quantitative analysis of elements by PIXE. The spectral interferences caused by Ge K escape peaks in the determination of Fe in U by PIXE are highlighted for illustration. A simple theoretical approach based on the production of Ge K X-rays inside the Ge crystal of the detector during the process of detection of the incident characteristic X-rays and the subsequent escape of a fraction of the produced radiations from the crystal, is described to calculate the intensity ratio of the Ge escape peak to its parent characteristic X-rays. The calculated values are in agreement with the experimental values and those estimated using the formulation provided in GUPIX software for PIXE. The Ge K escape peaks are very prominent; the intensities of Ge K α escape peaks, from bromine to silver, range from 15% to 6% of those of their respective K α X-rays. These intensities are, in general, considerably higher compared to those of Si escape peaks in spectra recorded by Si ( Li ) detector. Ge K escape peaks therefore may give rise to severe interferences. The present approach provides a precise (~8%) determination of the intensity of an escape peak and thereby facilitates a reliable PIXE analysis.

Moxtek, Inc.

2013 ◽  
Vol 21 (S1) ◽  
pp. 12-12 ◽  
Keyword(s):  
Elemental Analysis ◽  
High Performance ◽  
Low Energy ◽  
Hazardous Substance ◽  
X Rays ◽  
Customer Requirements ◽  
X Ray ◽  
Performance Quality ◽  
Thin Polymer ◽  
Miniature Portable

Moxtek is the leading manufacturer of nano-optical and X-ray components, including high performance X-ray windows for demanding applications. AP3 ultra-thin polymer windows offer the highest transmission of low energy X-rays. Moxtek DuraBeryllium® windows are highly reliable, are resistance to moisture and harsh chemicals, and are available in thicknesses down to 8 μm. Moxtek also provides window solutions for sealed and flow proportional counters. Moxtek X-ray products (X-ray windows, X-ray JFETs, miniature/portable X-ray sources, X-ray detectors) enable compact handheld and benchtop elemental analysis for positive material identification. Moxtek products are used in various EDXRF systems for environmental screening, for hazardous substance analysis, and for sorting and recycling. Moxtek X-ray products are critical for optimal elemental analysis in electron microscopy, especially for low-Z elements. Moxtek strives to deliver products and services that meet or exceed customer requirements for performance, quality, and value.

Problems in Thin-Film X-ray Quantification

1990 ◽  
Vol 48 (2) ◽  
pp. 458-459
Author(s):  
J N Chapman ◽  
W A P Nicholson
Keyword(s):  
Thin Film ◽  
Specimen Thickness ◽  
X Rays ◽  
Characteristic Peak ◽  
Local Composition ◽  
X Ray ◽  
Measured Ratio ◽  
Path Lengths ◽  
Composition Changes

Energy dispersive x-ray microanalysis (EDX) is widely used for the quantitative determination of local composition in thin film specimens. Extraction of quantitative data is usually accomplished by relating the ratio of the number of atoms of two species A and B in the volume excited by the electron beam (nA/nB) to the corresponding ratio of detected characteristic photons (NA/NB) through the use of a k-factor. This leads to an expression of the form nA/nB = kAB NA/NB where kAB is a measure of the relative efficiency with which x-rays are generated and detected from the two species.Errors in thin film x-ray quantification can arise from uncertainties in both NA/NB and kAB. In addition to the inevitable statistical errors, particularly severe problems arise in accurately determining the former if (i) mass loss occurs during spectrum acquisition so that the composition changes as irradiation proceeds, (ii) the characteristic peak from one of the minority components of interest is overlapped by the much larger peak from a majority component, (iii) the measured ratio varies significantly with specimen thickness as a result of electron channeling, or (iv) varying absorption corrections are required due to photons generated at different points having to traverse different path lengths through specimens of irregular and unknown topography on their way to the detector.

XRMF applications of a monolithic, polycapillary, focusing x-ray optic

1996 ◽  
Vol 54 ◽  
pp. 240-241
Author(s):  
D. A. Carpenter ◽  
Ning Gao ◽  
G. J. Havrilla
Keyword(s):  
Trace Elements ◽  
Point Source ◽  
Focal Spot ◽  
Fluorescence Analysis ◽  
X Rays ◽  
Focal Distance ◽  
Spot Diameter ◽  
X Ray ◽  
Focal Spot Diameter

A monolithic, polycapillary, x-ray optic was adapted to a laboratory-based x-ray microprobe to evaluate the potential of the optic for x-ray micro fluorescence analysis. The polycapillary was capable of collecting x-rays over a 6 degree angle from a point source and focusing them to a spot approximately 40 µm diameter. The high intensities expected from this capillary should be useful for determining and mapping minor to trace elements in materials. Fig. 1 shows a sketch of the capillary with important dimensions.The microprobe had previously been used with straight and with tapered monocapillaries. Alignment of the monocapillaries with the focal spot was accomplished by electromagnetically scanning the focal spot over the beveled anode. With the polycapillary it was also necessary to manually adjust the distance between the focal spot and the polycapillary.The focal distance and focal spot diameter of the polycapillary were determined from a series of edge scans.

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