Moxtek, Inc.

2013 ◽  
Vol 21 (S1) ◽  
pp. 12-12 ◽  
Keyword(s):  
Elemental Analysis ◽  
High Performance ◽  
Low Energy ◽  
Hazardous Substance ◽  
X Rays ◽  
Customer Requirements ◽  
X Ray ◽  
Performance Quality ◽  
Thin Polymer ◽  
Miniature Portable

Moxtek is the leading manufacturer of nano-optical and X-ray components, including high performance X-ray windows for demanding applications. AP3 ultra-thin polymer windows offer the highest transmission of low energy X-rays. Moxtek DuraBeryllium® windows are highly reliable, are resistance to moisture and harsh chemicals, and are available in thicknesses down to 8 μm. Moxtek also provides window solutions for sealed and flow proportional counters. Moxtek X-ray products (X-ray windows, X-ray JFETs, miniature/portable X-ray sources, X-ray detectors) enable compact handheld and benchtop elemental analysis for positive material identification. Moxtek products are used in various EDXRF systems for environmental screening, for hazardous substance analysis, and for sorting and recycling. Moxtek X-ray products are critical for optimal elemental analysis in electron microscopy, especially for low-Z elements. Moxtek strives to deliver products and services that meet or exceed customer requirements for performance, quality, and value.

scholarly journals ELEMENTAL ANALYSIS OF AEROSOL SAMPLES USING PIXE TECHNIQUE

2021 ◽  
Vol 9 (5) ◽  
pp. 175-180
Author(s):  
Deepali Modi
Keyword(s):  
Trace Elements ◽  
Data Analysis ◽  
Proton Beam ◽  
Elemental Analysis ◽  
Hpge Detector ◽  
Low Energy ◽  
X Rays ◽  
X Ray ◽  
Minor Elements

In this work a complex study of the capabilities Particle Induced X-Ray emission(PIXE) technique for the determination of minor constituents of aerosol samples has been done.The PIXE experiments were carried out at Cyclotron at Department of Physics, Panjab University Chandigarh using ~2.7MeV proton beam. The X-rays were detected with the help of low energy HPGE detector. Total fifteen samples were collected from various locations in Chandigarh.The minor elements identified in the aerosol samples wereS,Cl,K,Ca,Ti,Cr,Mn,Fe,Ni,Zn,V,Br and Pb. The data analysis was done using GUPIX software to extract the quantity of the trace elements.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

scholarly journals The use of fricke dosimetry for low energy x-rays

2006 ◽  
Vol 49 (spe) ◽  
pp. 17-23 ◽  
Author(s):  
Carlos de Austerlitz ◽  
Viviane Souza ◽  
Heldio Pereira Villar ◽  
Aloisio Cordilha
Keyword(s):  
Ionization Chamber ◽  
Parallel Plate ◽  
Low Energy ◽  
Calibration Factor ◽  
X Rays ◽  
Measuring Systems ◽  
X Ray ◽  
Dose Measurements

The performance of four X-ray qualities generated in a Pantak X-ray machine operating at 30-100 kV was determined with a parallel-plate ionization chamber and a Fricke dosimeter. X-ray qualities used were those recommended by Deutsch Internationale Normung DIN 6809 and dose measurements were carried out with Plexiglas® simulators. Results have shown that the Fricke dosimeter can be used not only for soft X-ray dosimetry, but also for the maintenance of low-energy measuring systems' calibration factor.

SOFT X-RAY EMISSION IN THE (1.0–1.5 KEV) WINDOW WITH NITROGEN FILLING IN A LOW ENERGY PLASMA FOCUS

2002 ◽  
Vol 16 (09) ◽  
pp. 309-318 ◽  
Author(s):  
M. SHAFIQ ◽  
SARTAJ ◽  
S. HUSSAIN ◽  
M. SHARIF ◽  
S. AHMAD ◽  
...  
Keyword(s):  
Plasma Focus ◽  
Pressure Range ◽  
Filling Pressure ◽  
Pinhole Camera ◽  
Low Energy ◽  
X Rays ◽  
System Efficiency ◽  
Current Sheath ◽  
Pin Diodes ◽  
X Ray

A study of soft X-ray emission in the 1.0–1.5 keV energy range from a low energy (1.15 kJ) plasma focus has been conducted. X-rays are detected with the combination of Quantrad Si PIN-diodes masked with Al (50 μm), Mg (100 μm) and Ni (17.5 μm) filters and with a pinhole camera. The X-ray flux is found to be measurable within the pressure range of 0.1–1.0 mbar nitrogen. In the 1.0–1.3 keV and 1.0–1.5 keV windows, the X-ray yield in 4π-geometry is 1.03 J and 14.0-J, respectively, at a filling pressure of 0.25 mbar and the corresponding efficiencies are 0.04% and 1.22%. The total X-ray emission in 4π-geometry is 21.8 J, which corresponds to the system efficiency of about 1.9%. The X-ray emission is found dominantly as a result of the interaction of energetic electrons in the current sheath with the anode tip. Images recorded by the pinhole camera confirm the emission of X-rays from the tip of the anode.

Exosat Observations of H2252−035: Pulse Phase and Orbital Phase Dependent Low Energy Absorption and Iron Line Emission

1987 ◽  
Vol 93 ◽  
pp. 281-292
Author(s):  
W. Pietsch ◽  
W. Voges ◽  
E. Kendziorra ◽  
M. Pakull
Keyword(s):  
Energy Absorption ◽  
Line Emission ◽  
Low Energy ◽  
Gas Absorption ◽  
X Rays ◽  
Medium Energy ◽  
Iron Line ◽  
X Ray ◽  
Low Energies ◽  
Optical Light Curve

AbstractThe 805 sec pulsing X-ray source H2252−035 has been observed for 7 h on September 14/15 and on September 17, 1983 in X-rays with the low energy telescope and the medium energy detectors of EXOSAT. While below 2 keV the semiamplitude of the 805 s pulses is ~ 100% in the 2.3–7.9 keV band it is only ~ 40%. X-ray dips that are more pronounced in low energies occur simultaneously with the orbital minimum of the optical light curve. The medium energy spectra during dips with respect to the non dip spectrum can be explained by just enhanced cold gas absorption of an additional absorbing column of 2 1022 cm−2. Model spectra for the 805 s minimum have to include a strong iron emission line at 6.55 keV with an equivalent width of 3 keV in addition to a reduced continuum intensity (radiating area) and enhanced low energy absorption.

Low-energy cosmic X-ray measurements

1969 ◽  
Vol 47 (23) ◽  
pp. 2651-2666 ◽  
Author(s):  
A. J. Baxter ◽  
B. G. Wilson ◽  
D. W. Green
Keyword(s):  
Spectral Analysis ◽  
Energy Range ◽  
Crab Nebula ◽  
Spectral Characteristics ◽  
Low Energy ◽  
Data Recovery ◽  
X Rays ◽  
X Ray ◽  
Recovery System ◽  
The Crab Nebula

An experiment is described to investigate cosmic X rays in the energy range 0.25–12 keV. The data-recovery system and methods of spectral analysis are considered. Results are presented for the energy spectrum of the diffuse X-ray component and its distribution over the northern sky down to 1.6 keV with a limited extension at 0.27 keV.In the energy range 1.6 to 12 keV, the spectrum is represented by:[Formula: see text]although separate analyses indicate a flattening below 4.5 keV to give:[Formula: see text]and[Formula: see text]At the lowest energies, the flux appears to increase more rapidly and exhibits some anisotropy in arrival directions related to the gross galactic structure. Spectral characteristics of the Crab Nebula and Cygnus X-2 have also been determined.

Synchrotron Radiation Hard X-Ray Microprobe by Multilayer Fresnel Zone Plate

1998 ◽  
Vol 524 ◽  
Author(s):  
S. Tamura ◽  
K. Ohtani ◽  
M. Yasumoto ◽  
K. Murali ◽  
N. Kamuo ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
High Performance ◽  
Fresnel Zone ◽  
Deposition Process ◽  
Spot Size ◽  
Zone Plate ◽  
Fresnel Zone Plate ◽  
X Rays ◽  
Sputtering Deposition ◽  
X Ray

ABSTRACTA hard X-ray microbeam with submicrometer spot size from synchrotron radiation (SR) sources is expected to add a new dimension to various X-ray analysis methods. A Fresnel zone plate (FZP) is one of the promising focusing elements for X-rays. In order to develop high performance multilayer FZP for use in the hard X-ray region, Cu/Al concentric multilayers were fabricated by use of a DC sputtering deposition process. Lower Ar gas pressure or higher rotating speed of a wire substrate has been effective in forming smoother multilayer interfaces. From a focusing test of the Cu/Al FZP (100-zones) by the SR (λ= 0.154nm), microbeams of 1.5 μm φ and 0.8 μm φ have been achieved for the first- and third-order focal beams, respectively.

Characterization of Metal Matrix Composites by Synchrotron Refraction Computed Topography

2010 ◽  
Vol 638-642 ◽  
pp. 967-972
Author(s):  
Bernd R. Müller ◽  
Axel Lange ◽  
M. Harwardt ◽  
M.P. Hentschel
Keyword(s):  
Computed Tomography ◽  
Metal Matrix Composites ◽  
Metal Matrix ◽  
High Performance ◽  
Three Dimensional ◽  
Matrix Composites ◽  
X Rays ◽  
X Ray ◽  
Surface And Interface ◽  
Federal Institute

X-ray computed tomography is an important tool for evaluating the three dimensional microstructure of modern materials non-destructively. To resolve material structures in the micrometre range and below high brilliance synchrotron radiation has to be taken. But materials of low absorption or mixed phases show a weak absorption contrast at there interfaces. A Contrast enhancement can be achieved by exploiting the refraction of X-rays at interfaces. This technique was developed and applied at the NDT department of the Federal Institute for Materials Research and Testing (BAM) during the last decade. It meets the actual demand for improved non-destructive characterisation of high performance composites, ceramics and other low density materials and components. The technique is based on Ultra Small Angle Scattering (USAXS) by micro structural elements causing phase related effects like refraction and total reflection at a few minutes of arc as the refractive index of X-rays is nearly unity. The extraordinary refraction contrast of inner surfaces is far beyond absorption effects and hence especially useful for materials of low absorption or mixed phases, showing similar X-ray absorption properties. Crack orientation and fibre-matrix debonding in plastics, polymers, ceramics and metal-matrix-composites after cyclic loading and hydro thermal aging can be visualized. By combining the refraction technique with the computed tomography technique the three dimensional imaging of the micro structure of the materials is obtained. In most cases the investigated inner surface and interface structures correlate to mechanical properties. Recent results with a sub-micrometer resolution will be presented.

Sign in / Sign up

Export Citation Format

Share Document