scholarly journals Энергетические распределения вторичных заряженных частиц при распылении газовыми кластерными ионами

2021 ◽  
Vol 47 (8) ◽  
pp. 25
Author(s):  
А.Е. Иешкин ◽  
А.А. Татаринцев ◽  
Д.С. Киреев ◽  
В.И. Бачурин ◽  
А.С. Рудый
Keyword(s):  
Experimental Investigation ◽  
Energy Transfer ◽  
Ion Irradiation ◽  
Charged Particles ◽  
Energy Spectra ◽  
Polycrystalline Copper ◽  
Secondary Particles ◽  
Cluster Bombardment ◽  
Xenon Cluster ◽  
Cluster Ion

We present an experimental investigation of the energy spectra of the charged particles emitted from polycrystalline copper under argon and xenon cluster ion irradiation. Positive secondary particles have significantly lower energies than in the case of sputtering with atomic argon. The spectra of the charged particles emitted under xenon cluster bombardment are systematically narrower than the corresponding ones obtained under argon cluster bombardment. The observed regularities can be explained in terms of energy transfer form a cluster to the target.

SPUTTERING WITH GAS CLUSTER-ION BEAMS

1996 ◽  
Vol 03 (01) ◽  
pp. 1017-1021 ◽  
Author(s):  
J. MATSUO ◽  
M. AKIZUKI ◽  
J. NORTHBY ◽  
G.H. TAKAOKA ◽  
I. YAMADA
Keyword(s):  
Ion Irradiation ◽  
Removal Rate ◽  
Ion Beam ◽  
Solid Surfaces ◽  
Silicon Surfaces ◽  
Cluster Ions ◽  
Mass Filter ◽  
Cluster Bombardment ◽  
Cluster Ion Beams ◽  
Cluster Ion

A high-current (~100 nA) cluster-ion-beam equipment with a new mass filter has been developed to study the energetic cluster-bombardment effects on solid surfaces. A dramatic reduction of Cu concentration on silicon surfaces has been achieved by 20-keV Ar cluster (N~3000) ion bombardment. The removal rate of Cu with cluster ions is two orders of magnitude higher than that with monomer ions. A significantly higher sputtering yield is expected for cluster-ion irradiation. An energetic cluster-ion beam is quite suitable for removal of metal.

Energy distribution over the cross section of the track of charged particles having the same linear energy transfer

1973 ◽  
Vol 34 (4) ◽  
pp. 372-373
Author(s):  
I. K. Kalugina ◽  
I. B. Keirim-Markus ◽  
A. K. Savinskii ◽  
I. V. Filyushkin
Keyword(s):  
Energy Transfer ◽  
Energy Distribution ◽  
Cross Section ◽  
Linear Energy Transfer ◽  
Charged Particles ◽  
The Cross

scholarly journals An experimental investigation on slamming kinematics, impulse and energy transfer for high-speed catamarans equipped with Ride Control Systems

2019 ◽  
Vol 178 ◽  
pp. 410-422 ◽  
Author(s):  
Javad AlaviMehr ◽  
Jason Lavroff ◽  
Michael R. Davis ◽  
Damien S. Holloway ◽  
Giles A. Thomas
Keyword(s):  
Experimental Investigation ◽  
Energy Transfer ◽  
Control Systems ◽  
High Speed ◽  
Ride Control

The multiplicity characteristics of 7Li-Em interactions as a function of noninteracting projectile nucleons

2020 ◽  
Vol 29 (08) ◽  
pp. 2050063
Author(s):  
M. Mohery ◽  
E. M. Sultan ◽  
N. N. Abdallah ◽  
M. H. Farghaly
Keyword(s):  
Impact Parameter ◽  
Charged Particles ◽  
Heavy Ion ◽  
The Other ◽  
Total Charge ◽  
Secondary Particles ◽  
Ion Interactions ◽  
Charged Secondary ◽  
The Impact ◽  
Relativistic Particles

In this work, the interactions of 7Li nuclei with emulsion at 3 A GeV/c were studied. Multiplicity of the charged secondary particles as well as the charge of the outgoing projectile fragments were measured, while correlations among them are discussed. The values of the total charge of the noninteracting projectile nucleons and the average number of interacting projectile nucleons are estimated. The dependence of the secondary particles on the number of heavily-ionized tracks is analyzed. The results show that interactions of 7Li nuclei with emulsion nuclei exhibit a number of regularities, which had been noted in experiments with lighter nuclei. The absorption of relativistic particles, while increasing the degree of target destruction, is observed. The average multiplicities of the secondary charged particles depend on the impact parameter, as their values increase, while decreasing the impact parameter. The number of secondary charged particles in the heavy-ion interactions depends on the degree of disintegration of the target nuclei. This dependence is not observed in the case of the interaction of hadron with emulsion. The experimental data of the interaction of 7Li are systematically compared with the other interactions at different energies. The results agree with the corresponding results at nearly the same energy.

scholarly journals Particle Acceleration in Collisionless Magnetic Reconnection

2001 ◽  
Vol 203 ◽  
pp. 555-557
Author(s):  
P. K. Browning ◽  
G. E. Vekstein
Keyword(s):  
Magnetic Field ◽  
Field Component ◽  
Charged Particles ◽  
Energy Spectra ◽  
Uniform Field ◽  
Two Dimensional ◽  
Point Field ◽  
Field Geometry ◽  
Collisionless Reconnection ◽  
Accelerated Particles

We investigate the acceleration of charged particles in the framework of collisionless reconnection. A steady reconnection scenario is considered, with a two dimensional X-point magnetic field geometry having also a uniform field component transverse to the plane of the X-point field, and an inductive electric field generating an inflow of particles. Test particle trajectories are studied, and the energy spectra of the accelerated particles are determined.

Cellular and Molecular Analysis of Mutagenesis Induced by Charged Particles of Defined Linear Energy Transfer

1996 ◽  
Vol 145 (3) ◽  
pp. 251 ◽  
Author(s):  
Li X. Zhu ◽  
Charles A. Waldren ◽  
Diane Vannais ◽  
Tom K. Hei
Keyword(s):  
Energy Transfer ◽  
Molecular Analysis ◽  
Linear Energy Transfer ◽  
Charged Particles

Application of Cluster Ion Beam Smoothing to SiC and YBCO Surfaces

1999 ◽  
Vol 585 ◽  
Author(s):  
D. Fathy ◽  
O. W. Holland ◽  
R. Liu ◽  
J. Wosik ◽  
W. K Chu
Keyword(s):  
Surface Topography ◽  
Ion Irradiation ◽  
Ion Beam ◽  
High Temperature Superconductors ◽  
Cluster Ions ◽  
Microwave Surface Resistance ◽  
Average Roughness ◽  
Cross Sectional ◽  
Cluster Ion Beams ◽  
Cluster Ion

AbstractOptimization of the surface topography, especially in high-temperature superconductors (HTS) and silicon carbide is crucial for device processing. Surface smoothing in these materials was investigated using Gas Cluster Ion Beams (GCIB) capable of delivering cluster ions of ≥ 2000 Ar atoms with energies of up to 30keV. Examination of the surface topography after cluster-ion irradiation was done using cross-sectional transmission electron microscopy (TEM) and atomic force microscopy (AFM). The results indicate that typical as-deposited YBCO films on MgO substrates have an average roughness of the order of 40 nm, and interpeak distance between 300–600 nm. Application of GCIB to the surface planarization reduces the roughness to only 10 nm. Also power handling and microwave surface resistance of the YBCO film and its relationship to surface smoothness are reported. Similar observations using bulk SiC are discussed.

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