scholarly journals Surface Roughness in Ceramics with Different Finishing Techniques Using Atomic Force Microscope and Profilometer

10.2341/05-54 ◽  
2006 ◽  
Vol 31 (4) ◽  
pp. 442-449 ◽  
Author(s):  
B. Tholt ◽  
W. G. Miranda-Júnior ◽  
R. Prioli ◽  
J. Thompson ◽  
M. Oda
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscope ◽  
Clinical Relevance ◽  
Ceramic Surface ◽  
Surface Smoothness ◽  
Atomic Force ◽  
Ceramic Surfaces ◽  
Ceramic Restorations

Clinical Relevance Ceramic restorations often require intraoral adjustment and the use of a polishing kit is mandatory to re-establish surface smoothness. When the ceramic surface was ground and polished, the 3 types of ceramic restorations reacted differently to each tested polishing kit. Some of the polished surfaces obtained were at least equivalent to glaze-fired ceramic surfaces.

scholarly journals Surface roughness of a dental ceramic after polishing with different vehicles and diamond pastes

2006 ◽  
Vol 17 (3) ◽  
pp. 191-194 ◽  
Author(s):  
Guilherme Brião Camacho ◽  
Dionísio Vinha ◽  
Heitor Panzeri ◽  
Tomio Nonaka ◽  
Mariane Gonçalves
Keyword(s):  
Surface Roughness ◽  
Ceramic Surface ◽  
Significance Level ◽  
Dental Ceramic ◽  
Ceramic Surfaces ◽  
Diamond Polishing ◽  
Dental Office ◽  
Significant Difference ◽  
Adhesive Cementation ◽  
Ceramic Restorations

During fabrication of bonded ceramic restorations, cervical adaptation, occlusal adjustment and final finishing/polishing are procedures to be performed at the dental office after adhesive cementation. Final adjustments may result in loss of ceramic glaze, which requires new polishing of the ceramic surface, with special attention for selection of adequate materials and instruments. The purpose of this study was to evaluate the efficiency of different vehicles associated with diamond pastes indicated for dental ceramic polishing. Two polishing pastes (Crystar Paste and Diamond Excell) associated with four vehicles (rubber cup, Robinson bristle brush, felt wheel and buff disc) were evaluated. Disc-shaped specimens were fabricated from Ceramco II dental ceramic. Surface roughness means (Ra) of the ceramic specimens were determined with a rugosimeter. Data were analyzed statistically by two-way ANOVA and Tukey's test at 5% significance level. There was no statistically significant difference (p>0.01) between the polishing pastes. However, there were statistically significant differences (p<0.01) among the tested vehicles. Vehicle-paste interaction showed statistically significant difference (p<0.05) as well. It may be concluded that: 1) Robinson bristle brush, felt wheel and buff disc were efficient vehicles to be used in association with a diamond polishing paste; 2) The use of rubber cup as a vehicle showed poor efficiency for mechanical polishing of the ceramic surfaces; 3) Both pastes provided similar and efficient polishing and may be recommended for use with an appropriated vehicle.

Study on Surface Roughness Based on Dynamic Minimum Thickness of Cut

2011 ◽  
Vol 88-89 ◽  
pp. 34-37
Author(s):  
Kuai Ji Cai
Keyword(s):  
Surface Roughness ◽  
Friction Coefficient ◽  
Atomic Force Microscope ◽  
Surface Quality ◽  
Experimental Verification ◽  
Cutting Parameters ◽  
Minimum Thickness ◽  
Atomic Force ◽  
Relationship Of ◽  
The Relationship

The relationship of the friction coefficient and the MTC were discussed, and the MTC and its effects on surface roughness were a theoretical analysised and experimental verification by AFM (atomic force microscope). The results show that the theoretical MTC tends to be minimal value then before the adhering effect to reach remarkable. Appropriate adjustments cutting parameters, the cutting process can always micro-cutting phase to reach the steady-thin chip, and no plowing phenomenon. So the surface residues highly were reduced and higher surface quality was achieved.

Extension of the range of profile surface roughness measurements using metrological atomic force microscope

2019 ◽  
Vol 56 ◽  
pp. 321-329 ◽  
Author(s):  
Ichiko Misumi ◽  
Kentaro Sugawara ◽  
Ryosuke Kizu ◽  
Akiko Hirai ◽  
Satoshi Gonda
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscope ◽  
Atomic Force ◽  
Roughness Measurements

Relationship Between Stress and Surface Roughness in Krypton Implanted MgO

1994 ◽  
Vol 356 ◽  
Author(s):  
Laurence Gea ◽  
Jean-Luc Loubet ◽  
Roger Brenier ◽  
Paul Thevenard
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscope ◽  
Single Crystals ◽  
Internal Stresses ◽  
Post Irradiation ◽  
Implantation Damage ◽  
Atomic Force ◽  
Microindentation Technique ◽  
Good Agreement

Abstract(001) MgO single crystals were implanted with 150 keV krypton ions (Kr+) at a fluence of 5.1016 ions.cm-2 . The implanted surface, observed with an Atomic Force Microscope (AFM) exhibits striking features that can be described as undulations with a wavelength of 0.5 [μm. We correlate these features to the decrease in density and the stresses induced by the implantation damage. As a matter of fact, a model of surface instabilities provides a relationship between the wavelength of the ondulations and internal stresses. Using this model, implantation stresses are calculated to 2.2 GPa. This is in good agreement with the value of 2 GPa obtained with the help of the microindentation technique and the literature data. Some effects of an ionizing post-irradiation on stress and surface roughness are described.

Surface roughness analysis of ceramic bracket slots using atomic force microscope

2010 ◽  
Vol 40 (5) ◽  
pp. 294 ◽  
Author(s):  
Ki-Ho Park ◽  
Hyun-Joo Yoon ◽  
Su-Jung Kim ◽  
Gi-Ja Lee ◽  
Hun-Kuk Park ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscope ◽  
Atomic Force ◽  
Roughness Analysis ◽  
Ceramic Bracket

Track sensitivity and the surface roughness measurements of CR-39 with atomic force microscope

1999 ◽  
Vol 31 (1-6) ◽  
pp. 203-208 ◽  
Author(s):  
N. Yasuda ◽  
M. Yamamoto ◽  
K. Amemiya ◽  
H. Takahashi ◽  
A. Kyan ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscope ◽  
Atomic Force ◽  
Roughness Measurements

Atomic force microscope imaging of the surface roughness of SCS- and TiB2-coated SiC fibres and uncoated sapphire fibres

Composites ◽  
1995 ◽  
Vol 26 (9) ◽  
pp. 619-629 ◽  
Author(s):  
Thomas L. Warren ◽  
Dusan Krajcinovic ◽  
Arunava Majumdar
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscope ◽  
Atomic Force ◽  
Microscope Imaging

Chemical Mechanical Polishing of Transparent Nd:YAG Ceramics

2008 ◽  
Vol 375-376 ◽  
pp. 278-282 ◽  
Author(s):  
Jun Li ◽  
Yong Zhu ◽  
Chuang Tian Chen
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscope ◽  
Chemical Mechanical Polishing ◽  
Brittle Materials ◽  
Mechanical Polishing ◽  
High Quality ◽  
Atomic Force ◽  
Hard And Brittle Materials ◽  
Quality Surface ◽  
High Quality Surface

Transparent Nd:YAG ceramics which are very hard and brittle materials, are very difficult to be polished. There are many micro scratches or damages on the surface after mechanical polishing with Al2O3. In order to remove micro scratches or damages, chemical mechanical polishing (CMP) was adopted to manufacture Nd:YAG ceramics. In the polishing experiment, Pellon and Chemcloth pads were utilized for chemical mechanical polishing of Nd:YAG ceramics. Colloidal SiO2 was selected as the polishing slurry in two different polishing environments, acidity and alkalinity. The surface roughness was determined by using atomic force microscope. In this study, four polishing experimental combinations that each combination contains one of the two pads and one of the two polishing environments were carried out in the optimum polishing condition. Then the high quality surface of transparent Nd:YAG ceramics with the best surface roughness of < 0.2 nm RMS and few micro scratches or damages is obtained by adopting CMP process with Chemcloth pad and colloidal SiO2 in acidic condition.

scholarly journals Nanoscale Measurement of Surface Roughness and the existing Surface Forces of Aluminum by AFM

2011 ◽  
Vol 2 ◽  
pp. 76-79
Author(s):  
Purna B Pun ◽  
Shobha K Lamichhane
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscope ◽  
Thermal Oxidation ◽  
Surface Force ◽  
Surface Forces ◽  
Crystal Defects ◽  
Surface Contamination ◽  
Thermal Agitation ◽  
Atomic Force ◽  
Aluminum Sample

The surface contamination affects Atomic Force Microscope (AFM) performance. Thermal agitation during mapping doping, thermal oxidation, annealing impurities and crystal defects promotes the roughness; various kinds of forces on the surface can be detected by the interaction between tip of cantilever and sample. This interaction not only help us to understand the characteristics and morphology of the sample but also useful to measure the surface force of the aluminum sample too.Key words: Atomic Force Microscope (AFM) performance; Thermal oxidation; Annealing impurities; Crystal defectsThe Himalayan Physics Vol.2, No.2, May, 2011Page: 76-79Uploaded Date: 1 August, 2011

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