scholarly journals Characterization of Carbon Nanotube Reinforced Aluminium Nano-composite using Field Emission Scanning Electron Microscope

2018 ◽  
Vol 3 (1) ◽  
pp. 63-67
Author(s):  
Umma Abdullahi ◽  
Md. Abdul Maleque ◽  
Mohammad Yeakub Ali
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Wear Behaviour ◽  
Homogeneous Distribution ◽  
Nano Composite ◽  
Aspect Ratios ◽  
Scanning Electron

Carbon nanotubes (CNT) is a promising fibrous materials for development of nanocomposite especially aluminium (Al) matrix nanocomposites as CNT exhibited extraordinary mechanical properties and high aspect ratios. The dispersion is the main factor for a quality CNT-Al nanocomposite that affects the uniformity in mixture leading to the enhanced mechanical and wear behaviour. The present study emphasizes on the characterization of carbon nanotube dispersion by means of field emission scanning electron microscope after synthetization of new nanocomposite. The mixing of the reinforcement and matrix powders was performed in ball mill for 2 hours at 250 rpm. The result shows the homogeneous distribution was observed from the experiment. The morphological characterization under FESEM provides insight features of CNT-Al nano-composite with the ball milling parameter on the sintering.

scholarly journals Fabrication and characterization of solid-state nanopores using a field emission scanning electron microscope

2006 ◽  
Vol 88 (10) ◽  
pp. 103109 ◽  
Author(s):  
Hung Chang ◽  
Samir M. Iqbal ◽  
Eric A. Stach ◽  
Alexander H. King ◽  
Nestor J. Zaluzec ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Solid State ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Fabrication And Characterization ◽  
Scanning Electron

Field emission characteristics of an individual carbon nanotube inside a field emission-scanning electron microscope

Vacuum ◽  
2006 ◽  
Vol 81 (4) ◽  
pp. 422-426 ◽  
Author(s):  
H.-S. Jang ◽  
S.-O. Kang ◽  
S.-H. Nahm ◽  
Y.-I. Kim ◽  
B.-G. Min ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Emission Characteristics ◽  
Scanning Electron

scholarly journals Tungsten/Platinum Hybrid Nanowire Growth via Field Emission Using Nanorobotic Manipulation

2011 ◽  
Vol 2011 ◽  
pp. 1-8 ◽  
Author(s):  
Zhan Yang ◽  
Masahiro Nakajima ◽  
Yasuhito Ode ◽  
Toshio Fukuda
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Multiwalled Carbon Nanotube ◽  
Energy Dispersive ◽  
Nanowire Growth ◽  
Multiwalled Carbon ◽  
X Ray ◽  
Scanning Electron

This paper reports tungsten-platinum hybrid nanowire growth via field emission, based on nanorobotic manipulation within a field emission scanning electron microscope (FESEM). A multiwalled carbon nanotube (MWCNT) was used as the emitter, and a tungsten probe was used as the anode at the counterposition, by way of nanomanipulation. By independently employing trimethylcyclopentadienyl platinum (CpPtMe3) and tungsten hexacarbonyl (W(CO)6) as precursors, the platinum nanowire grew on the tip of the MWCNT emitter. Tungsten nanowires then grew on the tip of the platinum nanowire. The hybrid nanowire length wascontrolled by nanomanipulation. Their purity was evaluated using energy-dispersive X-ray spectroscopy (EDS). Thus, it is possible to fabricate various metallic hybrid nanowires by changing the precursor materials. Hybrid nanowires have various applications in nanoelectronics, nanosensor devices, and nanomechanical systems.

scholarly journals Permeation Characterization of the Sequence of Intersecting Ink and Seal Lines Using Field Emission Scanning Electron Microscope

CONVERTER ◽  
2021 ◽  
pp. 176-189
Author(s):  
Jiangchun Li, Et al.
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Criminal Cases ◽  
Experimental Conditions ◽  
Cross Sectional ◽  
Daily Work ◽  
Judicial Appraisal ◽  
Scanning Electron

Objectives: Paper documents are playing an increasingly important role in people's daily work with the development of economy, society and culture. In the practice of judicial appraisal, the sequence of the intersections of ink and seal on suspicious documents can often provide critical information for the detection of criminal cases. The examination of sequence of intersecting seal and ink lines is to judge the sequence of seal and ink mark formation by certain technical means.Methods: A representative black signature pen, ink, and specific paper are selected to prepare experimental samples. Under the given experimental conditions, the field emission scanning electron microscope is used to perform micro-morphology on the cross-sectional characteristics of the samples and all the characterization results obtained are systematically analyzed to summarize the specificity of the sample. Results: The results showed that the proposed method can efficiently discriminate the Permeation Characterization of the sequence of intersecting seal and ink lines.Conclusions: This research is expected to be applied to forensic investigation for counterfeiting documents and bring new developments in the field of document inspection.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

Comparison of freeze-fractured yeast replicas using conventional TEM and low-voltage field-emission SEM

1989 ◽  
Vol 47 ◽  
pp. 74-75
Author(s):  
William P. Wergin ◽  
Eric F. Erbe ◽  
Terrence W. Reilly
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Voltage ◽  
Objective Lens ◽  
Specimen Preparation ◽  
Lens System ◽  
Air Drying ◽  
Preparation Techniques ◽  
Scanning Electron

Although the first commercial scanning electron microscope (SEM) was introduced in 1965, the limited resolution and the lack of preparation techniques initially confined biological observations to relatively low magnification images showing anatomical surface features of samples that withstood the artifacts associated with air drying. As the design of instrumentation improved and the techniques for specimen preparation developed, the SEM allowed biologists to gain additional insights not only on the external features of samples but on the internal structure of tissues as well. By 1985, the resolution of the conventional SEM had reached 3 - 5 nm; however most biological samples still required a conductive coating of 20 - 30 nm that prevented investigators from approaching the level of information that was available with various TEM techniques. Recently, a new SEM design combined a condenser-objective lens system with a field emission electron source.

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