AUTOMATIC EXTRACTION OF BUILDING BOUNDARIES FROM HIGH RESOLUTION IMAGES WITH ACTIVE CONTOUR SEGMENTATION

Abstract. Accurate detection and automatic processing of earthquake-damaged regions is essential for effective rescue and post-disaster reconstruction. In this study, we proposed a Combined Super-pixel Segmentation and AlexNet Detection approach (CSSAD) for automatically extracting damaged regions from post-earthquake high-resolution images. Simple Linear Iterative Clustering (SLIC) algorithm was used to segment the high resolution images to obtain more homogeneous geo-objects. Multiscale samples database, which took the different scale effect of damaged regions into account, was constructed based on the geometric centre of each super-pixel. AlexNet, which achieved the automatic extraction of high-level features and accurate identification of target geo-objects, was used to detect the damaged regions. To enhance the localization accuracy, the output of AlexNet was further refined using super-pixel segmentations and masked out of shadow and vegetation. Compared with traditional method, the proposed approach effectively reduces the false and missed detection ratio at least 10 percent.

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Semi-automatic extraction of large and moderate buildings from very high-resolution satellite imagery using active contour model

2015 IEEE International Geoscience and Remote Sensing Symposium (IGARSS) ◽

10.1109/igarss.2015.7326161 ◽

2015 ◽

Cited By ~ 5

Author(s):

Sandeep Kumar Bypina ◽

K. S. Rajan

Keyword(s):

High Resolution ◽

Satellite Imagery ◽

Active Contour ◽

Active Contour Model ◽

Automatic Extraction ◽

Contour Model ◽

High Resolution Satellite Imagery ◽

Very High

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FeXIV Line Emission Polarization of the July 11, 1991 Solar Corona

International Astronomical Union Colloquium ◽

10.1017/s0252921100026002 ◽

1994 ◽

Vol 144 ◽

pp. 541-547

Author(s):

J. Sýkora ◽

J. Rybák ◽

P. Ambrož

Keyword(s):

High Resolution ◽

Solar Corona ◽

Emission Line ◽

Solar Eclipse ◽

White Light ◽

Preliminary Analysis ◽

Line Emission ◽

Total Solar Eclipse ◽

Degree Of Polarization ◽

High Resolution Images

AbstractHigh resolution images, obtained during July 11, 1991 total solar eclipse, allowed us to estimate the degree of solar corona polarization in the light of FeXIV 530.3 nm emission line and in the white light, as well. Very preliminary analysis reveals remarkable differences in the degree of polarization for both sets of data, particularly as for level of polarization and its distribution around the Sun’s limb.

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Remarks on the application of backscattered electron imaging (BEI) to the scanning electron microscopy (SEM) of biological structures

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100076159 ◽

1983 ◽

Vol 41 ◽

pp. 484-487

Author(s):

Etienne de Harven

Keyword(s):

High Resolution ◽

Incident Beam ◽

Spot Size ◽

Primary Electron ◽

Critical Point Drying ◽

Cell Shapes ◽

High Resolution Images ◽

Backscattered Electron ◽

Electron Imaging ◽

Scanning Electron

Biological ultrastructures have been extensively studied with the scanning electron microscope (SEM) for the past 12 years mainly because this instrument offers accurate and reproducible high resolution images of cell shapes, provided the cells are dried in ways which will spare them the damage which would be caused by air drying. This can be achieved by several techniques among which the critical point drying technique of T. Anderson has been, by far, the most reproducibly successful. Many biologists, however, have been interpreting SEM micrographs in terms of an exclusive secondary electron imaging (SEI) process in which the resolution is primarily limited by the spot size of the primary incident beam. in fact, this is not the case since it appears that high resolution, even on uncoated samples, is probably compromised by the emission of secondary electrons of much more complex origin.When an incident primary electron beam interacts with the surface of most biological samples, a large percentage of the electrons penetrate below the surface of the exposed cells.

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Field Emission SEM Equipped With Noise Compensator

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100071958 ◽

1973 ◽

Vol 31 ◽

pp. 302-303

Author(s):

S. Saito ◽

H. Todokoro ◽

S. Nomura ◽

T. Komoda

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Scanning Electron Microscope ◽

Field Emission ◽

Low Contrast ◽

Probe Current ◽

High Resolution Images ◽

Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

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Low-Loss Images in a Stem/Tem Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010009244x ◽

1976 ◽

Vol 34 ◽

pp. 496-497 ◽

Cited By ~ 1

Author(s):

David C. Joy ◽

Dennis M. Maher

Keyword(s):

High Resolution ◽

Surface Topography ◽

Beam Direction ◽

Low Loss ◽

Specimen Holder ◽

Glancing Angle ◽

High Resolution Images ◽

Set Up ◽

Conventional Manner ◽

Objective Type

High-resolution images of the surface topography of solid specimens can be obtained using the low-loss technique of Wells. If the specimen is placed inside a lens of the condenser/objective type, then it has been shown that the lens itself can be used to collect and filter the low-loss electrons. Since the probeforming lenses in TEM instruments fitted with scanning attachments are of this type, low-loss imaging should be possible.High-resolution, low-loss images have been obtained in a JEOL JEM 100B fitted with a scanning attachment and a thermal, fieldemission gun. No modifications were made to the instrument, but a wedge-shaped, specimen holder was made to fit the side-entry, goniometer stage. Thus the specimen is oriented initially at a glancing angle of about 30° to the beam direction. The instrument is set up in the conventional manner for STEM operation with all the lenses, including the projector, excited.

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Effect of strain on ADF-STEM high-resolution images

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100087641 ◽

1991 ◽

Vol 49 ◽

pp. 666-667

Author(s):

M. Kelly ◽

D.M. Bird

Keyword(s):

High Resolution ◽

Strong Influence ◽

Intensity Variation ◽

Dark Field ◽

Atomic Resolution ◽

Strain Fields ◽

High Resolution Image ◽

Annular Dark Field ◽

High Resolution Images ◽

Interesting Alternative

It is well known that strain fields can have a strong influence on the details of HREM images. This, for example, can cause problems in the analysis of edge-on interfaces between lattice mismatched materials. An interesting alternative to conventional HREM imaging has recently been advanced by Pennycook and co-workers where the intensity variation in the annular dark field (ADF) detector is monitored as a STEM probe is scanned across the specimen. It is believed that the observed atomic-resolution contrast is correlated with the intensity of the STEM probe at the atomic sites and the way in which this varies as the probe moves from cell to cell. As well as providing a directly interpretable high-resolution image, there are reasons for believing that ADF-STEM images may be less suseptible to strain than conventional HREM. This is because HREM images arise from the interference of several diffracted beams, each of which is governed by all the excited Bloch waves in the crystal.

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Electron crystallographic determination of the 3-D structure of staurolite at atomic resolution

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010008701x ◽

1991 ◽

Vol 49 ◽

pp. 540-541

Author(s):

Kenneth H. Downing ◽

Hu Meisheng ◽

Hans-Rudolf Went ◽

Michael A. O'Keefe

Keyword(s):

High Resolution ◽

Three Dimensional ◽

High Resolution Electron Microscopy ◽

Atomic Resolution ◽

Dimensional Structure ◽

Structure Information ◽

Resolution Electron ◽

Scattering Effects ◽

High Resolution Images ◽

Effects Of Radiation

With current advances in electron microscope design, high resolution electron microscopy has become routine, and point resolutions of better than 2Å have been obtained in images of many inorganic crystals. Although this resolution is sufficient to resolve interatomic spacings, interpretation generally requires comparison of experimental images with calculations. Since the images are two-dimensional representations of projections of the full three-dimensional structure, information is invariably lost in the overlapping images of atoms at various heights. The technique of electron crystallography, in which information from several views of a crystal is combined, has been developed to obtain three-dimensional information on proteins. The resolution in images of proteins is severely limited by effects of radiation damage. In principle, atomic-resolution, 3D reconstructions should be obtainable from specimens that are resistant to damage. The most serious problem would appear to be in obtaining high-resolution images from areas that are thin enough that dynamical scattering effects can be ignored.

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