scholarly journals Synthesis, characterization, and optical properties of copper oxide thin films obtained by spray pyrolysis deposition

2019 ◽  
Vol 11 (22) ◽  
pp. 64-71
Author(s):  
Rawaa A. Faris
Keyword(s):  
Thin Films ◽  
Copper Oxide ◽  
Spray Pyrolysis ◽  
Average Particle Size ◽  
Average Particle ◽  
Oxide Thin Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Spray Pyrolysis Deposition ◽  
Xrd Patterns

     Copper oxide thin films were synthesized by using spray pyrolysis deposition technique, in the temperature around 400°C in atmosphere from alcoholic solutions. Copper (II) chloride as precursor and glass as a substrate. The textural and structural properties of the films were characterized by atomic force microscopy (AFM), X-ray diffraction (XRD). The average particle size determined from the AFM images ranged from 30 to 90 nm and the roughness average was equal to 9.3 nm. The XRD patterns revealed the formation of a polycrystalline hexagonal CuO. The absorption and transmission spectrum, band gap, film thickness was investigated. The films were tested as an optical limiter. The experiments were performed using Q-switched Nd:YAG laser at 532nm and 1064 nm at different intensities. Copper oxide thin films appear to be attractive candidates for optical limiting application and sensor application.

scholarly journals Fabrication and Characterization of Gas Sensor from ZrO2: MgO Nanostructure Thin Films by R.F. Magnetron Sputtering Technique

2019 ◽  
Vol 16 (1) ◽  
pp. 0199
Author(s):  
Khalil Et al.
Keyword(s):  
Thin Films ◽  
Gas Sensor ◽  
Spectral Response ◽  
Average Particle Size ◽  
Average Particle ◽  
X Ray ◽  
Sensing Properties ◽  
Force Microscopy ◽  
Plasma Sputtering ◽  
Atomic Force

Thin films ZrO2: MgO nanostructure have been synthesized by a radio frequency magnetron plasma sputtering technique at different ratios of MgO (0,6, 8 and  10)% percentage to be used as the gas sensor for nitrogen dioxide NO2. The samples were investigated by X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscopy (SEM), energy-dispersive X-ray (EDX) and sensing properties were also investigated. The average particle size of all prepared samples was found lower than 33.22nm and the structure was a monoclinic phase. The distribution of grain size was found lower than36.3 nm and uninformed particles on the surface. Finally, the data of sensing properties have been discussed, where they indicated that sensitivity reached 42.566% at 300 oC, spectral response time less than 52.2 s and recovery time 135.9 s.

Influence of oxygen partial pressure on the metastable copper oxide thin films

2016 ◽  
Vol 30 (35) ◽  
pp. 1530012 ◽  
Author(s):  
Birol Geçici ◽  
Şadan Korkmaz ◽  
Soner Özen ◽  
Volkan Şenay ◽  
Suat Pat
Keyword(s):  
Thin Films ◽  
Copper Oxide ◽  
Rf Magnetron Sputtering ◽  
Oxide Thin Films ◽  
High Frequency Region ◽  
Glass Substrates ◽  
Atomic Force ◽  
Diffraction Peaks ◽  
Xrd Patterns ◽  
Reactive Rf Magnetron Sputtering

Paramelaconite (Cu4O3) is a metastable copper oxide. Metastable copper oxide thin films were deposited on glass substrates by reactive RF magnetron sputtering in argon (Ar) and oxygen (O2) gas mixture atmospheres. Ar/O2 gas ratios in the sputtering ambient were chosen as 1/1 and 1/9. The surface and optical properties were determined by X-ray diffractometer (XRD), atomic force microscope (AFM) and UV-Vis spectrophotometer. The XRD patterns of the samples exhibited single strong diffraction peaks at 35.39[Formula: see text] and 35.49[Formula: see text], corresponding to the (202) peak of Cu4O3. The mean thickness values were measured as 100 nm and 80 nm for the films deposited at 1/1 and 1/9 Ar/O2 gas ratios, respectively. The samples showed low transmittance and high absorbance in the high frequency region.

Fabrication and Characterization of Gas Sensor from ZrO2: MgO Nanostructure Thin Films by R.F. Magnetron Sputtering Technique

2019 ◽  
Vol 16 (1(Suppl.)) ◽  
pp. 0199 ◽  
Author(s):  
Khalil Et al.
Keyword(s):  
Thin Films ◽  
Gas Sensor ◽  
Spectral Response ◽  
Average Particle Size ◽  
Average Particle ◽  
X Ray ◽  
Sensing Properties ◽  
Force Microscopy ◽  
Plasma Sputtering ◽  
Atomic Force

Thin films ZrO2: MgO nanostructure have been synthesized by a radio frequency magnetron plasma sputtering technique at different ratios of MgO (0,6, 8 and  10)% percentage to be used as the gas sensor for nitrogen dioxide NO2. The samples were investigated by X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscopy (SEM), energy-dispersive X-ray (EDX) and sensing properties were also investigated. The average particle size of all prepared samples was found lower than 33.22nm and the structure was a monoclinic phase. The distribution of grain size was found lower than36.3 nm and uninformed particles on the surface. Finally, the data of sensing properties have been discussed, where they indicated that sensitivity reached 42.566% at 300 oC, spectral response time less than 52.2 s and recovery time 135.9 s.

scholarly journals Optical and structural properties of nanostructured copper oxide thin films as solar selective coating prepared by spray pyrolysis method

2017 ◽  
Vol 35 (2) ◽  
pp. 355-361 ◽  
Author(s):  
M. Asadi ◽  
S.M. Rozati
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Copper Oxide ◽  
Spray Pyrolysis ◽  
Single Phase ◽  
Spray Pyrolysis Method ◽  
Oxide Thin Films ◽  
High Crystallinity ◽  
Pyrolysis Method ◽  
Xrd Patterns

Abstract Copper (II) oxide thin films were prepared by spray pyrolysis method on soda-lime glass substrates using copper acetate precursor solution. Influence of substrate temperature on structural and optical properties was investigated. Structural analysis of these layers were carried out by X-ray diffraction (XRD). Single phase nature and high crystallinity of CuO nanostructures were observed on XRD patterns. The general appearance of the films was uniform and black in color. FT-IR transmittance spectra confirmed the results from the XRD study. Selective solar absorber coatings of copper oxide (CuO) on stainless steel substrates was prepared by spray pyrolysis method. Effect of deposition temperature on optical properties of thin films was investigated. Optical parameters, absorbance (α) and emittance (α) were evaluated from reflectance data. It can be deduced that the porous structure, such as a light traps, can greatly enhance absorbance, while the composition, thickness and roughness of thin films can greatly influence the emissivity. Single phase nature and high crystallinity of CuO nanostructures were observed by XRD patterns. Solar absorbance of thin films were in the range of 85 % to 92 %.

Structural and Magnetic Investigation of Cu, Co Substituted NiFe2O4 Thin Films by Scanning Probe Microscopy (AFM, MFM)

2015 ◽  
Vol 830-831 ◽  
pp. 589-591 ◽  
Author(s):  
Hakikat Sharma ◽  
N.S. Negi
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Microstructural Analysis ◽  
Secondary Phase ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Magnetic Investigation ◽  
Probe Microscope ◽  
Xrd Patterns

In the present study we prepared NiFe2O4, Ni0.95Cu0.05Fe2O4and Ni0.94Cu0.05Co0.01Fe2O4thin films by metallo-organic decomposition method (MOD) using spin coating technique. The samples were characterized by XRD. XRD patterns of thin films confirmed the formation of cubic spinel structure without any secondary phase. For microstructural analysis we characterized samples by Scanning Probe Microscope (SPM). From Atomic force microscopy (AFM), we analyzed surface morphology, calculated grain size, roughness and porosity. It has been found that grain size and roughness affected by Cu, Co substitution. After this we carried out magnetic force microscopy (MFM) on the samples. Effect of substitution on magnetic grains was observed from MFM.

ALBUMIN ADSORPTION ON OXIDE THIN FILMS STUDIED BY ATOMIC FORCE MICROSCOPY

2021 ◽  
pp. 1-14
Author(s):  
Denise Aparecida Tallarico ◽  
Angelo Luiz Gobbi ◽  
Pedro Iris Paulin Filho ◽  
Marcelo Eduardo Huguenin Maia da Costa ◽  
Pedro Augusto de Paula Nascente ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Oxide Thin Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Albumin Adsorption
Sign in / Sign up

Export Citation Format

Share Document