Structural and Magnetic Investigation of Cu, Co Substituted NiFe2O4 Thin Films by Scanning Probe Microscopy (AFM, MFM)

2015 ◽  
Vol 830-831 ◽  
pp. 589-591 ◽  
Author(s):  
Hakikat Sharma ◽  
N.S. Negi
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Microstructural Analysis ◽  
Secondary Phase ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Magnetic Investigation ◽  
Probe Microscope ◽  
Xrd Patterns

In the present study we prepared NiFe2O4, Ni0.95Cu0.05Fe2O4and Ni0.94Cu0.05Co0.01Fe2O4thin films by metallo-organic decomposition method (MOD) using spin coating technique. The samples were characterized by XRD. XRD patterns of thin films confirmed the formation of cubic spinel structure without any secondary phase. For microstructural analysis we characterized samples by Scanning Probe Microscope (SPM). From Atomic force microscopy (AFM), we analyzed surface morphology, calculated grain size, roughness and porosity. It has been found that grain size and roughness affected by Cu, Co substitution. After this we carried out magnetic force microscopy (MFM) on the samples. Effect of substitution on magnetic grains was observed from MFM.

Mechanical Property Evaluation of ZnO Thin Films Using Nanoindentation and Scanning Probe Microscope

2008 ◽  
Vol 55-57 ◽  
pp. 609-612 ◽  
Author(s):  
Te Hua Fang ◽  
S.H. Kang
Keyword(s):  
Thin Films ◽  
Mechanical Property ◽  
Scanning Probe ◽  
Zno Thin Films ◽  
X Ray Diffraction ◽  
Surface Geometry ◽  
Force Microscopy ◽  
Atomic Force ◽  
Property Evaluation ◽  
Probe Microscope

The characteristics of morphology, friction and nanotribological properties of ZnO thin films were achieved by means of x-ray diffraction, scanning probe microscopy (SPM), and nanoindentation. The ZnO thin films were deposited by a radio frequency magnetron sputtering system. Surface geometry and friction analysis were derived from atomic force microscopy/friction force microscopy (AFM/FFM). The hardness and Young’s modulus of the ZnO thin films were investigated by nanoindentation measurements with a Berkovich indenter. The films exhibited an increase in the hardness with decreasing load i.e. the indentation size effect (ISE) was found. In addition, the nanoscratched mechanical property of the films was discussed.

Structural and Multiferroic Properties of Co0.6Zn0.4Fe2O4 – Pb0.76Ca0.24TiO3 Composite Thin Films

2015 ◽  
Vol 830-831 ◽  
pp. 592-594 ◽  
Author(s):  
Shilpa Thakur ◽  
Hakikat Sharma ◽  
Sarita Sharma ◽  
N.S. Negi
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Grain Size ◽  
Solution Method ◽  
Composite Thin Film ◽  
Organic Precursor ◽  
Force Microscopy ◽  
Chemical Solution Method ◽  
Atomic Force ◽  
Xrd Patterns

Co0.6Zn0.4Fe2O4(CZFO), Pb0.76Ca0.24TiO3(PCT) thin films and Co0.6Zn0.4Fe2O4– Pb0.76Ca0.24TiO3(CZFO/PCT) composite thin film were prepared by chemical solution method using metello – organic precursor. Structural and microstructural properties were studied by using XRD and Atomic force microscopy (AFM) respectively. XRD patterns confirme cubic spinel structure for CZFO ferrite and perovskite structure for PCT ferroelectric phase without any impurity phase formation. Grain size and roughness were calculated from AFM images. Grain size and roughness of composite thin film are decreased in comparison to individual phases (CZFO,PCT). Magnetic properties were studied using VSM.

SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION

COSMOS ◽  
2007 ◽  
Vol 03 (01) ◽  
pp. 1-21 ◽  
Author(s):  
XIAN NING XIE ◽  
HONG JING CHUNG ◽  
ANDREW THYE SHEN WEE
Keyword(s):  
Integrated Circuits ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Nanoscale Patterning ◽  
Atomic Force ◽  
Probe Microscope ◽  
Molecular Manipulation

Nanotechnology is vital to the fabrication of integrated circuits, memory devices, display units, biochips and biosensors. Scanning probe microscope (SPM) has emerged to be a unique tool for materials structuring and patterning with atomic and molecular resolution. SPM includes scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In this chapter, we selectively discuss the atomic and molecular manipulation capabilities of STM nanolithography. As for AFM nanolithography, we focus on those nanopatterning techniques involving water and/or air when operated in ambient. The typical methods, mechanisms and applications of selected SPM nanolithographic techniques in nanoscale structuring and fabrication are reviewed.

Nanocrystalline Solutions as Precursors to The Spray Deposition of Cdte Thin Films

1995 ◽  
Vol 382 ◽  
Author(s):  
Martin Pehnt ◽  
Douglas L. Schulz ◽  
Calvin J. Curtis ◽  
Helio R. Moutinho ◽  
Amy Swartzlander ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Grain Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Cdte Nanoparticles ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Cdte Thin Films

ABSTRACTIn this article we report the first nanoparticle-derived route to smooth, dense, phase-pure CdTe thin films. Capped CdTe nanoparticles were prepared by injection of a mixture of Cd(CH3)2, (n-C8H17)3 PTe and (n-C8H17)3P into (n-C8H17)3PO at elevated temperatures. The resultant nanoparticles 32-45 Å in diameter were characterized by x-ray diffraction, UV-Vis spectroscopy, transmission electron microscopy, thermogravimetric analysis and energy dispersive x-ray spectroscopy. CdTe thin film deposition was accomplished by dissolving CdTe nanoparticles in butanol and then spraying the solution onto SnO2-coated glass substrates at variable susceptor temperatures. Smooth and dense CdTe thin films were obtained using growth temperatures approximately 200 °C less than conventional spray pyrolysis approaches. CdTe films were characterized by x-ray diffraction, UV-Vis spectroscopy, atomic force microscopy, and Auger electron spectroscopy. An increase in crystallinity and average grain size as determined by x-ray diffraction was noted as growth temperature was increased from 240 to 300 °C. This temperature dependence of film grain size was further confirmed by atomic force microscopy with no remnant nanocrystalline morphological features detected. UV-Vis characterization of the CdTe thin films revealed a gradual decrease of the band gap (i.e., elimination of nanocrystalline CdTe phase) as the growth temperature was increased with bulk CdTe optical properties observed for films grown at 300 °C.

Bacteria and viruses in the objective of probe microscopy

2021 ◽  
Vol 3 ◽  
Author(s):  
I.V. Yaminsky ◽  
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Probe Microscope

The article is devoted to the study of viruses and bacteria using a scanning probe microscope in the atomic force microscopy mode, in particular, to the question, what data can be obtained using this method and how to interpret it.

EFFECT OF SUBSTRATE TEMPERATURE ON THE STRUCTURAL AND THE OPTICAL PROPERTIES OF CdTe (100) EPITAXIAL FILMS GROWN ON GaAs (100) SUBSTRATES

2007 ◽  
Vol 14 (04) ◽  
pp. 755-759 ◽  
Author(s):  
D. U. LEE ◽  
J. H. JUNG ◽  
T. W. KIM ◽  
H. S. LEE ◽  
H. L. PARK ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Substrate Temperature ◽  
Misfit Dislocations ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Cdte Thin Films ◽  
Xrd Patterns

CdTe thin films were grown on GaAs (100) substrates by using molecular beam epitaxy at various temperatures. The results of the X-ray diffraction (XRD) patterns showed that the orientation of the grown CdTe thin films was the (100) orientation. XRD patterns, atomic force microscopy images, high-resolution transmission electron microscopy (HRTEM) images, and photoluminescence spectra showed that the crystallinity of CdTe (100) epilayers grown on GaAs (100) substrates was improved by increasing the substrate temperature. HRTEM images showed that misfit dislocations existed at the CdTe / GaAs heterointerface. These results can help improve understanding of the substrate temperature effect on the structural and the optical properties of CdTe (100)/ GaAs (100) heterostructures.

Nanoindention studies of DC sputtered Cu and Cu/Cr thin films

2001 ◽  
Vol 672 ◽  
Author(s):  
G. Wei ◽  
J. Du ◽  
A. Rar ◽  
J. A. Barnard
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Grain Size ◽  
Surface Morphology ◽  
Film Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Grain Size And Orientation

ABSTRACTThe nanoindentation behavior of DC magnetron sputtered 10 nm Cu and 10 nm Cu/2 nm Cr thin films deposited on Si (100) has been studied using a Hysitron nanomechanical system. X- ray diffraction and X-ray reflectivity were used to measure the film structure and film thickness, respectively. The grain size and orientation of Cu and Cu/Cr thin films were measured by TEM. Atomic force microscopy (AFM) was used to evaluate the surface morphology and roughness. At the same load, the nanoindentaion displacement of Cu/Cr is smaller than that for Cu, i.e., the 2nm thick Cr underlayer enhances the hardness of Cu. X-ray, TEM, and AFM results show that the grain size of Cu/Cr (< 15 nm) is actually larger than Cu (∼ 3 nm) indicating that the inverse Hall-Petch relationship may be operative.

scholarly journals Synthesis, characterization, and optical properties of copper oxide thin films obtained by spray pyrolysis deposition

2019 ◽  
Vol 11 (22) ◽  
pp. 64-71
Author(s):  
Rawaa A. Faris
Keyword(s):  
Thin Films ◽  
Copper Oxide ◽  
Spray Pyrolysis ◽  
Average Particle Size ◽  
Average Particle ◽  
Oxide Thin Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Spray Pyrolysis Deposition ◽  
Xrd Patterns

     Copper oxide thin films were synthesized by using spray pyrolysis deposition technique, in the temperature around 400°C in atmosphere from alcoholic solutions. Copper (II) chloride as precursor and glass as a substrate. The textural and structural properties of the films were characterized by atomic force microscopy (AFM), X-ray diffraction (XRD). The average particle size determined from the AFM images ranged from 30 to 90 nm and the roughness average was equal to 9.3 nm. The XRD patterns revealed the formation of a polycrystalline hexagonal CuO. The absorption and transmission spectrum, band gap, film thickness was investigated. The films were tested as an optical limiter. The experiments were performed using Q-switched Nd:YAG laser at 532nm and 1064 nm at different intensities. Copper oxide thin films appear to be attractive candidates for optical limiting application and sensor application.

scholarly journals Effect the Composition Ratio of Cobalt Oxide on the Structural and Optical Properties of Tin Oxide

2019 ◽  
Vol 24 (3) ◽  
Author(s):  
Ahmed K. Abass, ◽  
Sura A. Abd Al-Hassan
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Cobalt Oxide ◽  
Tin Oxide ◽  
Spray Pyrolysis Technique ◽  
Oxide Thin Film ◽  
Chemical Spray Pyrolysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Xrd Patterns

Tin oxide thin films were deposited on glass substrate at (400 ºC) by using chemical spray pyrolysis technique and its composed with cobalt oxide in different ratio. The structural, morphologic and optical properties of  thin films are investigated by: (XRD) X-Ray Diffraction, (AFM) Atomic Force Microscopy, (UV-Vis )Ultraviolet – Visible Spectroscopy. XRD patterns indicate that the structure of tin oxide thin film is tetragonal. All prepared films were nano materials as stated by Scherrer equation. It might have been found by AFM analysis, those surface roughness increase with increasing of cobalt ratio. By provision about Tauc plots, optical band gaps for thin                               

Mapping Nanoscale Switching Behavior of PZT Domain Patterns by Scanning Probe Microscope

2016 ◽  
Vol 680 ◽  
pp. 30-34
Author(s):  
Yan Ping Wei ◽  
Huan Ming Lu ◽  
An Xiang Wei ◽  
Yong Li
Keyword(s):  
Coercive Field ◽  
Compressive Strain ◽  
Scanning Probe ◽  
Switching Behavior ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Probe Microscope ◽  
Bottom To Top ◽  
The Impact

The switching current of the PZT domain patterns was detected by the conductive atomic force microscopy. The impact of the scan rate on the current contrast was studied. Successive current images of domain evolution during the polarization switching process were obtained. The impact of the local force exerted by the tip and the polarization cycles of the patterns were studied. The results suggested that the compressive strain exerted by the tip can decrease the piezoelectric coercive field and the polarization fatigue can increase the piezoelectric coercive field in the polarization inversion process from bottom to top.

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