Production Yield Enhancement through Failure Analysis Investigation

2009 ◽  
Author(s):  
Rajesh Medikonduri
Keyword(s):  
Failure Analysis ◽  
Flash Memory ◽  
Production Yield ◽  
Yield Enhancement ◽  
Related Issue ◽  
Data Loss ◽  
Current Testing ◽  
Corrective Actions ◽  
The One

Abstract Production yield verification for a complex device, such as the flash memory, is a problem of primary importance due to high design density and current testing capabilities of such design. In this paper, the flow byte issue in the one time programmable block is investigated through physical failure analysis (PFA). The customer reported fail for this unit was flow byte error with flipped data loss in one of the bit. Various experiments were done on numerous units to identify the yield related issue and prevent shipment of such units to customers. The case study from this paper is beneficial to the FA community by showing the exact methodology in identifying the problem, its containment, and implementation of corrective actions on the ATE to prevent shipment of low yield units to customer. The yield was enhanced by implementing the containment and corrective actions on the ATE.

Case Study in Fault Isolation of a Metal Short for Yield Enhancement

2010 ◽  
Author(s):  
Sarven Ipek ◽  
David Grosjean
Keyword(s):  
Failure Analysis ◽  
Failure Mechanism ◽  
Photon Emission ◽  
Fault Isolation ◽  
Yield Enhancement ◽  
Analysis Technique ◽  
Laser Signal ◽  
Signal Injection ◽  
Microscopy Techniques

Abstract The application of an individual failure analysis technique rarely provides the failure mechanism. More typically, the results of numerous techniques need to be combined and considered to locate and verify the correct failure mechanism. This paper describes a particular case in which different microscopy techniques (photon emission, laser signal injection, and current imaging) gave clues to the problem, which then needed to be combined with manual probing and a thorough understanding of the circuit to locate the defect. By combining probing of that circuit block with the mapping and emission results, the authors were able to understand the photon emission spots and the laser signal injection microscopy (LSIM) signatures to be effects of the defect. It also helped them narrow down the search for the defect so that LSIM on a small part of the circuit could lead to the actual defect.

Effectiveness of Nanoprober in Detecting Single/Multiple Bit Flash Data Gain & Data Loss Failures

2009 ◽  
Author(s):  
Rajesh Medikonduri
Keyword(s):  
Flash Memory ◽  
Data Loss ◽  
Voltage Contrast

Abstract This paper discusses the physics, definitions, and nanoprobing flow of a flash bit memory. In addition, a case study showing the effectiveness of nanoprobing in detecting the Single Bit Fail Data Gain and Data Loss in Flash Memory is also discussed. The paper also includes cases where no passive voltage contrast was observed at the SEM and no leakage was observed at AFM, yet the units failing SBF DG, SBF DL and depletion, were detected by nanoprobing of the single bit. The major finding of this paper is a way to resolve data gain, data loss, and depletion failures of flash memory by nanoprobing procedure, despite no PVC seen at the SEM and no leakage seen at the AFM.

Fail Mechanisms Causing Single Bit Flash Data Gain in Flash Memory

2009 ◽  
Author(s):  
Rajesh Medikonduri
Keyword(s):  
Flash Memory ◽  
Semiconductor Industry ◽  
Failure Mechanisms ◽  
Final Conclusion ◽  
Cell Theory ◽  
Data Loss ◽  
Voltage Contrast

Abstract Flash memory is one of the most mysterious and difficult structures in the semiconductor industry. Excessive data gain and data loss may cause errors in reading the flash memory. This paper discusses the data gain mechanism and the various failure mechanisms (i.e., CoSi at Mux, CoSi at bit, particle at Mux, resistive contact, erasing defect at failing bit, programming fail at bit, misaligned contact, passive voltage contrast (PVC) at multiple gates in Mux region, particle and missing via, poly residue defect etc.) causing single bit flash data gain. Presented in the paper are the definitions involved, Flash cell theory and physics involved, and the theory explaining why leakage in the 8:1 mux causes the single bit flash data gain. This is followed by a case study involving various failure mechanisms and a final conclusion. Knowing the fail mechanisms and correcting them promptly enhances the yield.

Wire-Wound Resistor Investigation—A Case Study

2016 ◽  
Author(s):  
Jason Wheeler ◽  
John Wolfgong
Keyword(s):  
Failure Analysis ◽  
Root Cause Analysis ◽  
Interesting Case ◽  
Cause Analysis ◽  
Root Cause ◽  
Resistive Element ◽  
Primary Driver ◽  
Mission Critical ◽  
Corrective Actions

Abstract The focus of this paper is to present an interesting case study involving Vishay wire-wound (WSC model) resistor failures, which affected a significant number of production and fielded assemblies. The failures were considered “mission critical”, which was the primary driver necessitating root cause analysis. A disciplined approach to the failure analysis effort was established, which resulted in root cause determination and the generation of appropriate corrective actions. This paper will highlight a non-conventional decapsulation method used to preserve the integrity of the fragile resistive element and a “lucky break” that was instrumental in linking the supplier’s actions to the failures.

A CASE STUDY OF NL INFLUENCE IN UNIS FKIP ENGLISH DEPARTMENT STUDENTS' INTERLANGUAGE

2018 ◽  
Vol 18 (1) ◽  
pp. 46-54
Author(s):  
Irmala Sukendra ◽  
Agus Mulyana ◽  
Imam Sudarmaji
Keyword(s):  
Second Language ◽  
Second Language Acquisition ◽  
Native Speakers ◽  
Communicative Competence ◽  
Mother Tongue ◽  
Universal Grammar ◽  
Similar System ◽  
The One ◽  
L1 Acquisition

Regardless to the facts that English is being taught to Indonesian students starting from early age, many Indonesian thrive in learning English. They find it quite troublesome for some to acquire the language especially to the level of communicative competence. Although Krashen (1982:10) states that “language acquirers are not usually aware of the fact that they are acquiring language, but are only aware of the fact that they are using the language for communication”, second language acquisition has several obstacles for learners to face and yet the successfulness of mastering the language never surmounts to the one of the native speakers. Learners have never been able to acquire the language as any native speakers do. Mistakes are made and inter-language is unavoidable. McNeili in Ellis (1985, p. 44) mentions that “the mentalist views of L1 acquisition hypothesizes the process of acquisition consists of hypothesis-testing, by which means the grammar of the learner’s mother tongue is related to the principles of the ‘universal grammar’.” Thus this study intends to find out whether the students go through the phase of interlanguage in their attempt to acquire second language and whether their interlanguage forms similar system as postulated by linguists (Krashen).

Interrelationships between municipal spatial policy strategy and airport operation and development. Lodz Airport case study

2018 ◽  
Vol 59 (1) ◽  
pp. 65-79
Author(s):  
Katarzyna Nikorowicz-Zatorska
Keyword(s):  
Land Use ◽  
Urban Planning ◽  
Cultural Development ◽  
The Other ◽  
Local Authorities ◽  
Spatial Management ◽  
The One ◽  
Surrounding Areas

Abstract The present paper focuses on spatial management regulations in order to carry out investment in the field of airport facilities. The construction, upgrades, and maintenance of airports falls within the area of responsibility of local authorities. This task poses a great challenge in terms of organisation and finances. On the one hand, an active airport is a municipal landmark and drives local economic, social and cultural development, and on the other, the scale of investment often exceeds the capabilities of local authorities. The immediate environment of the airport determines its final use and prosperity. The objective of the paper is to review legislation that affects airports and the surrounding communities. The process of urban planning in Lodz and surrounding areas will be presented as a background to the problem of land use management in the vicinity of the airport. This paper seeks to address the following questions: if and how airports have affected urban planning in Lodz, does the land use around the airport prevent the development of Lodz Airport, and how has the situation changed over the time? It can be assumed that as a result of lack of experience, land resources and size of investments on one hand and legislative dissonance and peculiar practices on the other, aviation infrastructure in Lodz is designed to meet temporary needs and is characterised by achieving short-term goals. Cyclical problems are solved in an intermittent manner and involve all the municipal resources, so there’s little left to secure long-term investments.

Failure Analysis Case Study of a 1.5 Meter Space Flex Harness

2017 ◽  
Author(s):  
Erick Kim ◽  
Kamjou Mansour ◽  
Gil Garteiz ◽  
Javeck Verdugo ◽  
Ryan Ross ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Failure Modes ◽  
Field Of View ◽  
Area Of Interest ◽  
Air Stream ◽  
Novel Method ◽  
Temperature Controlled ◽  
Non Destructive ◽  
Failure Site

Abstract This paper presents the failure analysis on a 1.5m flex harness for a space flight instrument that exhibited two failure modes: global isolation resistances between all adjacent traces measured tens of milliohm and lower resistance on the order of 1 kiloohm was observed on several pins. It shows a novel method using a temperature controlled air stream while monitoring isolation resistance to identify a general area of interest of a low isolation resistance failure. The paper explains how isolation resistance measurements were taken and details the steps taken in both destructive and non-destructive analyses. In theory, infrared hotspot could have been completed along the length of the flex harness to locate the failure site. However, with a field of view of approximately 5 x 5 cm, this technique would have been time prohibitive.

Failure Analysis of CDM-ESD Damage in a GaAs RFIC

2000 ◽  
Author(s):  
Amy Poe ◽  
Steve Brockett ◽  
Tony Rubalcava
Keyword(s):  
Radio Frequency ◽  
Failure Analysis ◽  
Integrated Circuit ◽  
Production Test ◽  
Analysis Techniques ◽  
Device Model ◽  
Charged Device ◽  
Subsequent Failure

Abstract The intent of this work is to demonstrate the importance of charged device model (CDM) ESD testing and characterization by presenting a case study of a situation in which CDM testing proved invaluable in establishing the reliability of a GaAs radio frequency integrated circuit (RFIC). The problem originated when a sample of passing devices was retested to the final production test. Nine of the 200 sampled devices failed the retest, thus placing the reliability of all of the devices in question. The subsequent failure analysis indicated that the devices failed due to a short on one of two capacitors, bringing into question the reliability of the dielectric. Previous ESD characterization of the part had shown that a certain resistor was likely to fail at thresholds well below the level at which any capacitors were damaged. This paper will discuss the failure analysis techniques which were used and the testing performed to verify the failures were actually due to ESD, and not caused by weak capacitors.

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