scholarly journals Annealing Effect on Optical properties of (As0.5Se0.5 doped with 1% Te) thin films

2018 ◽  
pp. 101-108
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Energy Gap ◽  
Localized States ◽  
Optical Measurements ◽  
X Ray Diffraction ◽  
Thermal Vacuum ◽  
Optical Energy Gap ◽  
X Ray ◽  
20 Nm

this work, the study of optical properties of (As0.5Se0.5 doped with 1% Te) thin films which prepared by thermal vacuum evaporation on glass bases at (R.T) with (100±20) nm thickness deposition rate (1.6nm/s) and study effect of annealing at temperatures (Ta) (348,398,448) K for time (30min) on these properties. The X-ray diffraction technique showed that all prepared films are amorphous in structure at room temperature and annealing films at (348, 398, 448) K. The transmittance spectra of the prepared films fall within a wavelength range (500-1100) nm, and increasing the annealing temperature leads to a decreased in transmission, increased absorption coefficient, and shift of the absorption edge towards low photon energies. The optical measurements showed that the prepared films had an allowed indirect optical energy gap and were found to decrease with the increase of (Ta) within the range (R.T, 348,398,448) K. As indicated by the tails of the localized states, it was observed that they increased by increasing (Ta).

scholarly journals Depending the Structure and Optical Properties of Cadmium Telluride Films on the Doping process

2018 ◽  
Vol 29 (1) ◽  
pp. 160
Author(s):  
Iman Hameed Khudayer
Keyword(s):  
Optical Properties ◽  
Cadmium Telluride ◽  
Energy Gap ◽  
Dielectric Constants ◽  
Optical Measurements ◽  
X Ray Diffraction ◽  
Optical Energy Gap ◽  
X Ray ◽  
Evaporation Technique ◽  
Effect Of Doping

The purpose of the present paper is to study the effect of doping by different materials on the structure and the optical properties of Cadmium Telluride films which prepared by rate deposition (4.21 nmn/sec) and thickness (≈ 200 nm) in vacuum by use thermal evaporation technique at a substrate temperature (300K), we are studying the effect of doping by different material (Antimony, Aluminum and Silver) on the structural1and optical2 properties of CdTe thin films. The structural properties of these films have been studied by using X-ray diffraction methods. The optical measurements indicated that Cadmium Telluride films have a direct optical energy gap (Egopt), and it decreases when we doped this films by different materials (Sb, Al and Ag) with the same ratio doping. The optical constants refractive index (n), extinction coefficient (k), absorption coefficient (α) and dielectric constants (r and i) were also studied.

scholarly journals The structure and optical properties of CdSe:Cu Thin Films

2009 ◽  
Vol 6 (1) ◽  
pp. 141-149
Author(s):  
Baghdad Science Journal
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Absorption Coefficient ◽  
Substrate Temperature ◽  
Energy Gap ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
Optical Energy Gap ◽  
X Ray ◽  
Substrate Temperatures

A polycrystalline CdSe thin films doped with (5wt%) of Cu was fabricated using vacuum evaporation technique in the substrate temperature range(Ts=RT-250)oC on glass substrates of the thickness(0.8?m). The structure of these films are determined by X-ray diffraction (XRD). The X-ray diffraction studies shows that the structure is polycrystalline with hexagonal structure, and there are strong peaks at the direction (200) at (Ts=RT-150) oC, while at higher substrate temperature(Ts=150-250) oC the structure is single crystal. The optical properties as a function of Ts were studied. The absorption, transmission, and reflection has been studied, The optical energy gap (Eg)increases with increase of substrate temperature from (1.65-1.84)eV due to improvement in the structure. The amorphousity of the films decreases with increasing Ts. The films have direct energy gap and the absorption edge was shift slightly towards smaller wavelength for CdSe:Cu thin film with increase of substrate temperature.it was found that the absorption coefficient was decreased with increasing of substrate temperature due to increases the value of(Eg). The CdSe:Cu films showed absorption coefficient in the range (0.94 x104-0.42x104)cm-1at Ts=RT-250 oC. Also the density of state decreases with increasing of substrate temperatures from (0.20-0.07)eV, it is possibly due to the recrystallization by the heating substrate temperatures.. Also the extinction coefficient, refractive index and dielectric constant have been studied.

Synthesis, Characterization and Optical Properties of PLA / P3HT Blends Thin Films

2021 ◽  
Vol 19 (5) ◽  
pp. 132-138
Author(s):  
Maan Abd-Alameer Salih ◽  
Q.S. Kareem ◽  
Mohammed Hadi Shinen
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Spin Coating ◽  
Ring Opening ◽  
Energy Gap ◽  
Ring Opening Polymerization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Conductivity Increase ◽  
Ft Ir

In this exploration Poly lactic corrosive (PLA) was orchestrated the ring-opening polymerization Poly lactic corrosive (PLA) blended with poly(3-hexylthiophene) (P3HT) which prepared by solution. Blends thin films Synthesis by spin coating technique and using Tetrahydrofuran (THF) as solvent. PLA powder was 'characterized by' 'X-ray' 'diffraction', '(FT-IR)'. pure Optical properties (PLA), (PLA)/P3HT blends thin films with different percentage of P3HT (0, 1, 2, and 3) wt% were investigated using UV-VS spectroscopy The results showed that the absorption, absorption coefficient, extinction coefficient and conductivity increase with increasing the rate of deformation P3HT, The energy gap decreases with increasing deformation.

scholarly journals Laser induced plasma of cadmium oxide: structural, morphological and optical properties

2021 ◽  
Vol 2114 (1) ◽  
pp. 012012
Author(s):  
Tamara S. Hussein ◽  
Ala F. Ahmed
Keyword(s):  
Optical Properties ◽  
Energy Gap ◽  
Cadmium Oxide ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Optical Energy Gap ◽  
X Ray ◽  
Laser Induced Plasma ◽  
Atomic Force ◽  
Doping Ratio

Abstract In this study, the effect of grafting with Iron (Fe) ratios (0.1, 0.3 and 0.5) on the structural and optical properties of cadmium oxide films (CdO) was studied, as these films were prepared on glass bases using the method of pulse laser deposition (PLD). The crystallization nature of the prepared films was examined by X-ray diffraction technique (XRD), which showed that the synthesis of the prepared films is polycrystalline, and Atomic Force Microscope (AFM) images also showed that the increased vaccination with Iron led to an increase in the crustal size ratio and a decrease in surface roughness, The absorption coefficient was calculated and the optical energy gap for the prepared thin films. It was found the absorption decreases and the energy gap decreases with the increase of doping ratio.

scholarly journals Study the effect by CO2 laser on some optical properties of (Cd) thin film doping by Ni

2008 ◽  
Vol 5 (3) ◽  
pp. 387-390
Author(s):  
Baghdad Science Journal
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Absorption Coefficient ◽  
Co2 Laser ◽  
Energy Gap ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Before And After ◽  
Cds Thin Films

In this research study the effect of irradiation by (CW) CO2 laser on some optical properties of (Cds) doping by Ni thin films of (1)µm thickness has been prepared by heat evaporation method. (X-Ray) diffraction technique showed the prepared films before and after irradiation are ploy crystalline hexagonal structure, optical properties were include recording of absorbance spectra for prepared films in the range of (400-1000) nm wave lengths, the absorption coefficient and the energy gap were calculated before and after irradiation, finally the irradiation affected (CdS) thin films by changing its color from the Transparent yellow to dark rough yellow and decrease the value absorption coefficient also increase the value of energy gap.

scholarly journals Enhancement of vanadium oxide doped Eu+3 for gas sensor application

2019 ◽  
Vol 15 (33) ◽  
pp. 17-27
Author(s):  
Hassan M. Odhaib
Keyword(s):  
Thin Films ◽  
Response Time ◽  
Vanadium Oxide ◽  
Energy Gap ◽  
Average Frequency ◽  
Europium Oxide ◽  
X Ray Diffraction ◽  
Optical Energy Gap ◽  
X Ray ◽  
Vis Spectroscopy

Thin films of vanadium oxide nanoparticles doped with different concentrations of europium oxide (2, 4, 6, and 8) wt % are deposited on glass and Si substrates with orientation (111) utilizing by pulsed laser deposition technique using Nd:YAG laser that has a wavelength of 1064 nm, average frequency of 6 Hz and pulse duration of 10 ns. The films were annealed in air at 300 °C for two hours, then the structural, morphological and optical properties are characterized using x-ray diffraction (XRD), Field emission scanning electron microscopy (FESEM) and UV-Vis spectroscopy respectively. The X-ray diffraction results of V2O5:Eu2O3 exhibit that the film has apolycrystalline monoclinic V2O5 and triclinic V4O7 phases. The FESEM image shows a homogeneous pattern and confirms the formation of uniform nanostructures on the glass substrate. The type of the particle found nanoparticles with different doping concentrations of Eu2O3. The optical energy gap increases with the increase of doping concentration and it varies from 2.67 eV to 2.71 eV. The prepared thin films are used to fabricate sensor against nitrogen dioxide gas. The dependence of sensitivity and response time on doping ratio and operation temperature of gas sensors has been studied, the maximum sensitivity was about 100%, the response time is equal to 24s and recovery time 16s for V2O5 doped 2% Eu2O3 at 50 °C.

scholarly journals Impact of ZnO Atomic Ratio on Structural, Morphological and Some Optical Properties of (SnO2)1-x (ZnO)x Thin Films

2020 ◽  
pp. 333-340
Author(s):  
Donia Yas Khudair ◽  
Ramiz Ahmed Al Ansari
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Energy Gap ◽  
Atomic Ratio ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Atomic Force ◽  
Uv Visible ◽  
Longitudinal Structures

In this work, SnO2 and (SnO2)1-x(ZnO)x composite thin films with different ZnO atomic ratios (x=0, 5, 10, 15 and 20%) were prepared by pulsed laser deposition technique on clean glass substrates at room temperature without any treatment. The deposited thin films were characterized by x-ray diffraction atomic force microscope  and UV-visible spectrophotometer to study the effect of the ZnO atomic ratio on their structural, morphological and optical properties. It was found that the crystallinety and the crystalline size vary according to ZnO atomic ratio. The surface appeared as longitudinal structures which was convert to spherical shapes with increasing ZnO atomic ratio. The optical transmission and energy gap increased with increasing ZnO atomic ratio. 

scholarly journals Temperature effect on structural and optical properties of V2O5 thin films prepared by spray pyrolysis technique

2020 ◽  
Vol 307 ◽  
pp. 01033
Author(s):  
Asmaa Mrigal ◽  
Lahocine El Gana ◽  
Mouhamed Addou ◽  
Khadija Bahedi ◽  
Rajae Temsamani ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Energy Gap ◽  
Spray Pyrolysis Technique ◽  
Three Dimensional ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Glass Substrates ◽  
Optical Dielectric Constant

In this work, the effect of substrate temperature on structural and optical properties of V2O5 thin films has been characterized by X-ray diffraction (XRD); SEM and transmission. The films mince has been prepared by Reactive Chemical Spraying technology in Liquid Phase (RCSLP) on glass substrates preheated at (350, 400, 450 and 500 °C). The X-ray diffraction analysis confirms that all layers are polycrystalline, and the preferred orientation of V2O5 is the (001) plane. The morphology of V2O5 thin films are porous nature and their particle’s shape is three-dimensional. The transmittance and absorbance of thin film were measured from which the optical constants (Energy gap, Refractive index, Absorption coefficient, Extinction coefficient and Optical dielectric constant) were determined.

scholarly journals Energy Gap Evaluation in Microcrystalline m-HfO2 Powder

2021 ◽  
pp. 226-231
Author(s):  
Artem O. Shilov ◽  
Sergey S. Savchenko ◽  
Alexander S. Vokhmintsev ◽  
Andrey V. Chukin ◽  
Maksim S. Karabanalov ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Optical Properties ◽  
Monoclinic Phase ◽  
Diffuse Reflectance ◽  
Energy Gap ◽  
Independent Data ◽  
X Ray Diffraction ◽  
X Ray ◽  
Russian Scientific

In this paper optical properties of microcrystalline HfO2 powder are investigated. X-ray diffraction and Raman spectroscopy were used to determine that the studied samples are in monoclinic phase. Based on the analysis of the diffuse reflectance spectra and applying Kubelka-Munk formalism we evaluated the indirect bandgap value Eg = 5.34 ± 0.05 eV. The calculated value is in agreement with independent data for HfO2 thin films synthesized by various methods. The paper is based on the materials of the report presented at the first Russian scientific confererence with the participation of the international community "YENISEI PHOTONICS – 2020"

scholarly journals INFLUENCE OF ANNEALING TEMPERATURE ON THE STRUCTURAL AND OPTICAL PROPERTIES OF COPPER IODIDE THIN FILMS

2021 ◽  
Vol 03 (02) ◽  
pp. 100-108
Author(s):  
Zuheer. N MAJEED ◽  
Nadia Naeema DAHAHER ◽  
Ebtisam K ALWAN
Keyword(s):  
Thin Films ◽  
Annealing Temperature ◽  
Energy Gap ◽  
Target Surface ◽  
Optical Measurements ◽  
Cubic Phase ◽  
Copper Iodide ◽  
X Ray Diffraction ◽  
X Ray ◽  
Annealing Temperatures

Copper Iodide (CuI) nanoparticles with (250 nm) thickness have been prepared at RT on glass substrate using PLD technique with focused Nd:YAG laser beam at (800 mJ) with a frequency second radiation at (1064 nm) (pulse width 9 ns) repetition frequency (6 Hz), for 500 laser pulses incident on the target surface . The films annealed to different annealing temperatures (423K )and(523K). The structural and surface morphology properties of the deposited CuI thin films were examined by X-ray diffraction analysis (XRD) and Atomic force microscope (AFM). The X-ray diffraction show that structure is a cubic phase with (111) plane preferential orientation direction. AFM was used to examine and measure the morphology and average diameter for CuI thin films respectively. It is observed that the average nanoparticles size increases with increasing of annealing temperature. The optical measurements showed that CuI thin films have direct allowed energy gap transition and the energy gap (Eg) decreases from (3.2eV) to (2.8 eV) with increasing annealing temperatures from RT to (532 K) for all samples.

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