scholarly journals 314 mm2 Hexagonal Double-Sided Spiral Silicon Drift Detector for Soft X-Ray Detection Based on Ultra-Pure High Resistance Silicon

2021 ◽  
Vol 8 ◽  
Author(s):  
Manwen Liu ◽  
Zheng Li ◽  
Zhi Deng ◽  
Li He ◽  
Bo Xiong ◽  
...  
Keyword(s):  
Single Cell ◽  
Energy Resolution ◽  
High Resistance ◽  
Radiation Detection ◽  
Natural World ◽  
Semiconductor Detectors ◽  
Silicon Drift Detector ◽  
Large Area ◽  
Important Indicator ◽  
X Ray

An X-ray pulsar is a remnant of massive star evolution, collapse, and supernova explosions. It has an extremely stable spin cycle and is known as the most accurate astronomical clock in the natural world. It presents high-precision navigational information, such as the location, speed, time, and attitude, which are used in deep space exploration and interstellar flight, such as the X-ray pulsar navigation (XPNAV). However, the energy of the X-ray from the pulsar is very low and its signal is very weak; this X-ray is known as the soft X-ray. In the low and medium energy radiation spectroscopy, the semiconductor detectors, especially the silicon drift detectors (SDD), achieve the best energy resolution. In this study, a 314 mm2 and a 600 mm2 double-sided spiral hexagonal silicon drift detector (DSSH-SDD) single cell for the pulsar soft X-ray detection is analyzed based on ultra-pure high-resistance silicon. The DSSH-SDD device is fabricated using ultra-pure high-resistivity silicon substrates patterned with ion-implanted electrodes. This study proposes a model capable of reaching a large area of 314 mm2 or 600 mm2 single cell and maintaining an optimal drift electric field. The design, modeling, 3D simulation, and the fabrication of the model are performed to analyze the physical performance of the DSSH-SDD. The electrical characteristics of the as-processed SDD chips, including leakage current, anode capacitance, and the spiral resistor current under the positive and negative biases are measured, and the energy resolution test is performed at the Tsinghua University. The energy resolution is an important indicator of the detector and is often expressed by full width at half maximum (FWHM). The results obtained in this study can be applied in the future for novel, flexible, large-area, high-resolution ionizing radiation detection systems capable of providing quantitative and real-time information of the relative position of spacecraft and pulsars through the pulsar X-ray radiation.

Cryogenic high-resolution X-ray spectrometers for SR-XRF and microanalysis

1998 ◽  
Vol 5 (3) ◽  
pp. 515-517 ◽  
Author(s):  
M. Frank ◽  
C. A. Mears ◽  
S. E. Labov ◽  
L. J. Hiller ◽  
J. B. le Grand ◽  
...  
Keyword(s):  
High Resolution ◽  
Energy Resolution ◽  
Superconducting Tunnel Junction ◽  
Semiconductor Detectors ◽  
X Rays ◽  
X Ray ◽  
Sr Xrf ◽  
Demonstration Experiment ◽  
Near Future ◽  
Stj Detector

Experimental results are presented obtained with a cryogenically cooled high-resolution X-ray spectrometer based on a 141 × 141 µm Nb-Al-Al2O3-Al-Nb superconducting tunnel junction (STJ) detector in an SR-XRF demonstration experiment. STJ detectors can operate at count rates approaching those of semiconductor detectors while still providing a significantly better energy resolution for soft X-rays. By measuring fluorescence X-rays from samples containing transition metals and low-Z elements, an FWHM energy resolution of 6–15 eV for X-rays in the energy range 180–1100 eV has been obtained. The results show that, in the near future, STJ detectors may prove very useful in XRF and microanalysis applications.

scholarly journals Development of STJ as a New X-Ray Detector

1998 ◽  
Vol 188 ◽  
pp. 335-336
Author(s):  
N. Y. Yamasaki ◽  
T. Ohashi ◽  
K. Kikuchi ◽  
H. Miyazaki ◽  
E. Rokutanda ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Effective Area ◽  
High Energy ◽  
High Energy Resolution ◽  
X Rays ◽  
Large Area ◽  
Position Resolution ◽  
X Ray ◽  
Plane Detector ◽  
Nippon Steel Corporation

STJs are promising X-ray detectors as high energy resolution spectrometers due to the small excitation energy to break the Cooper pairs to product detectable electrons. The expected energy resolution is about 5 eV for a 6 keV incident X-rays (see review by Kraus et al. and Esposito et al.). We have developed a large area (178 × 178μm2) Nb/Al/AlOX/Al/Nb STJs (Kurakado et al. 1993) and series-connected STJs with a position resolution of 35μm for α particles (Kurakado 1997) at Nippon Steel Corporation. As a focal plane detector in future X-ray missions, we are developing STJs whose targert characteristics are; an energy resolution of 20 eV at 6keV, an effective area of 1 cm2, and position resolution of 100μm.

A fast energy-dispersive multi-element detector for X-ray absorption spectroscopy

2009 ◽  
Vol 16 (2) ◽  
pp. 293-298 ◽  
Author(s):  
Edmund Welter ◽  
Karsten Hansen ◽  
Christian Reckleben ◽  
Inge Diehl
Keyword(s):  
Fine Structure ◽  
Absorption Spectroscopy ◽  
Energy Resolution ◽  
Integrated Circuit ◽  
Fluorescence Yield ◽  
Silicon Drift Detector ◽  
Excellent Performance ◽  
High Count ◽  
X Ray ◽  
X Ray Absorption

In this paper results are presented from fluorescence-yield X-ray absorption fine-structure spectroscopy measurements with a new seven-cell silicon drift detector (SDD) module. The complete module, including an integrated circuit for the detector readout, was developed and realised at DESY utilizing a monolithic seven-cell SDD. The new detector module is optimized for applications like XAFS which require an energy resolution of ∼250–300 eV (FWHM Mn Kα) at high count rates. Measurements during the commissioning phase proved the excellent performance for this type of application.

Large-area linear Silicon Drift Detector design for X-ray experiments

2014 ◽  
Vol 9 (07) ◽  
pp. P07014-P07014 ◽  
Author(s):  
A Rachevski ◽  
G Zampa ◽  
N Zampa ◽  
R Campana ◽  
Y Evangelista ◽  
...  
Keyword(s):  
Silicon Drift Detector ◽  
Large Area ◽  
X Ray ◽  
Design For X ◽  
Detector Design

scholarly journals High Energy Resolution X-Ray Spectrometer for High Count Rate Xrf Applications

1993 ◽  
Vol 37 ◽  
pp. 405-411
Author(s):  
C. S. Rossington ◽  
N. W. Madden ◽  
K. Chapman
Keyword(s):  
Energy Resolution ◽  
Count Rate ◽  
High Energy ◽  
Low Noise ◽  
High Energy Resolution ◽  
Photon Flux ◽  
Large Area ◽  
High Count ◽  
High Count Rate ◽  
X Ray

AbstractA new x-ray spectrometer has been constructed which incorporates a novel large area, low capacitance Si(Li) detector and a low noise JFET (junction field effect transistor) preamplifier. The spectrometer operates at high count Tates without the conventional compromise in energy resolution. For example, at an amplifier peaking time of 1 p.sec and a throughput count rate of 145,000 counts sec-1, the energy resolution at 5.9 keV is 220 eV FWHM. Commercially available spectrometers utilizing conventional geometry Si(Li) detectors with areas equivalent to the new detector have resolutions on the order of 540 eV under the same conditions. Conventional x-ray spectrometers offering high energy resolution must employ detectors with areas one-tenth the size of the new LBL detector (20 mm2 compared with 200 mm2). However, even with the use of the smaller area detectors, the energy resolution of a commercial system is typically limited to approximately 300 eV (again, at 1 μsec and 5.9 keV) due to the noise of the commercially available JFET's. The new large area detector is useful in high count rate applications, but is also useful in the detection of weak photon signals, in which it is desirable to subtend as large an angle of the available photon flux as possible, while still maintaining excellent energy resolution. X-ray fluorescence data from die new spectrometer is shown in comparison to a commercially available system in the analysis of a dilute muhi-element material, and also in conjunction with high count rate synchrotron EXAFS applications.

X-Ray Silicon Drift Detector–CMOS Front-End System with High Energy Resolution at Room Temperature

2016 ◽  
Vol 63 (1) ◽  
pp. 400-406 ◽  
Author(s):  
G. Bertuccio ◽  
M. Ahangarianabhari ◽  
C. Graziani ◽  
D. Macera ◽  
Y. Shi ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Room Temperature ◽  
High Energy ◽  
High Energy Resolution ◽  
Silicon Drift Detector ◽  
X Ray ◽  
Front End

Determination of K–L vacancy transfer probabilities of some 3d elements using synchrotron radiation

2015 ◽  
Vol 93 (7) ◽  
pp. 760-764 ◽  
Author(s):  
Santosh Mirji ◽  
A.S. Bennal ◽  
Krishnananda ◽  
N.M. Badiger ◽  
M.K. Tiwari ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Energy Resolution ◽  
Intensity Ratio ◽  
Fluorescence Yield ◽  
Silicon Drift Detector ◽  
X Ray ◽  
3D Elements ◽  
Experimental Values ◽  
Cu And Zn

The K–L total vacancy transfer probabilities (ηKL) of some 3d elements have been determined using Indus-2 synchrotron radiation. The targets, such as Cr, Cu, and Zn, are excited by using 6.5, 10, and 11 keV synchrotron radiation, respectively. The K X-ray photons are detected with a silicon drift detector, which has an energy resolution of 130 eV at 5.9 keV. By measuring the K-shell fluorescence yield and K X-ray intensity ratio, the K–L vacancy transfer probabilities have been determined. Measured values have been compared with the theoretical values and other experimental values.

B13-O-04Fabrication of High Energy Resolution Silicon Drift Detector for Energy Dispersive X-ray Spectrometer

Microscopy ◽  
2015 ◽  
Vol 64 (suppl 1) ◽  
pp. i33.1-i33
Author(s):  
Yu-Chao Ma ◽  
Chiao-Chun Hsu ◽  
Fan-Gang Tseng ◽  
Chih-Hao Lee ◽  
Yun-Ju Chuang ◽  
...  
Keyword(s):  
Energy Resolution ◽  
High Energy ◽  
Energy Dispersive ◽  
High Energy Resolution ◽  
Silicon Drift Detector ◽  
X Ray

Towards Imaging with Polycrystalline Mercuric Iodide Semiconductor Detectors

1997 ◽  
Vol 487 ◽  
Author(s):  
M. Schieber ◽  
A. Zuck ◽  
M. Braiman ◽  
L. Melekhov ◽  
J. Nissenbaum ◽  
...  
Keyword(s):  
Vapor Deposition ◽  
Screen Printing ◽  
Radiation Detector ◽  
Nuclear Radiation ◽  
Semiconductor Detectors ◽  
Pixel Detector ◽  
Mercuric Iodide ◽  
X Ray Diffraction ◽  
Large Area ◽  
X Ray

AbstractPreparation of polycrystalline mercuric iodide very thin (1 μm) films using laser ablation and thick films (100–600μm), using hot pressing, hot wall vapor deposition and screen printing methods, fabricated as radiation detector plates are briefly described. X-ray diffraction, photoluminescence and optical microscopic measurements as well as response to nuclear radiation will be given. Finally, recent results obtained with a large area imaging pixel detector will be shown.

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