scholarly journals Advanced Data Mining of SSD Quality Based on FP-Growth Data Analysis

2021 ◽  
Vol 11 (4) ◽  
pp. 1715
Author(s):  
Jieh-Ren Chang ◽  
You-Shyang Chen ◽  
Chien-Ku Lin ◽  
Ming-Fu Cheng
Keyword(s):  
Data Mining ◽  
Customer Service ◽  
Flash Memory ◽  
Association Rule ◽  
Production Control ◽  
Frequent Pattern ◽  
Nand Flash ◽  
Growth Data ◽  
Nand Flash Memory ◽  
Service Strategy

Storage devices in the computer industry have gradually transformed from the hard disk drive (HDD) to the solid-state drive (SSD), of which the key component is error correction in not-and (NAND) flash memory. While NAND flash memory is under development, it is still limited by the “program and erase” cycle (PE cycle). Therefore, the improvement of quality and the formulation of customer service strategy are topics worthy of discussion at this stage. This study is based on computer company A as the research object and collects more than 8000 items of SSD error data of its customers, which are then calculated with data mining and frequent pattern growth (FP-Growth) of the association rule algorithm to identify the association rule of errors by setting the minimum support degree of 90 and the minimum trust degree of 10 as the threshold. According to the rules, three improvement strategies of production control are suggested: (1) use of the association rule to speed up the judgment of the SSD error condition by customer service personnel, (2) a quality strategy, and (3) a customer service strategy.

scholarly journals Penerapan Data Mining Apriori Pada Persediaan Obat (Studi Kasus Apotek Rafif Farma Medan)

2019 ◽  
Vol 3 (2) ◽  
pp. 115
Author(s):  
Mardiah Mardiah
Keyword(s):  
Data Mining ◽  
Phase Analysis ◽  
Customer Service ◽  
Association Rule ◽  
High Frequency ◽  
A Priori ◽  
Inventory Systems ◽  
Frequent Pattern ◽  
Apriori Algorithm ◽  
Analysis Algorithm

<span><em>The importance of inventory systems at a pharmacy and the type of goods which</em><br /><span><em>are a top priority that must be in stock. It is useful to anticipate the void stuff. Due to the</em><br /><span><em>lack of inventory may affect customer service and asset to the pharmacy. Therefore, this</em><br /><span><em>study was conducted to help resolve those problems by designing a data mining</em><br /><span><em>application that serves to predict sales of the drug is needed most knowable a priori</em><br /><span><em>algorithm with the help of Tools Tanagra. One of the interesting association analysis</em><br /><span><em>phase analysis algorithm that generates a high frequency patterns (frequent pattern</em><br /><span><em>mining).</em><br /><span><em>Keywords: Data Mining, Apriori Algorithm, Association Rule</em></span></span></span></span></span></span></span></span><br /><br class="Apple-interchange-newline" /></span>

Novel Three Dimensional (3D) NAND Flash Memory Array Having Tied Bit-line and Ground Select Transistor (TiGer)

2012 ◽  
Vol E95.C (5) ◽  
pp. 837-841 ◽  
Author(s):  
Se Hwan PARK ◽  
Yoon KIM ◽  
Wandong KIM ◽  
Joo Yun SEO ◽  
Hyungjin KIM ◽  
...  
Keyword(s):  
Flash Memory ◽  
Three Dimensional ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Memory Array

scholarly journals Artificial Neural Network Assisted Error Correction for MLC NAND Flash Memory

Micromachines ◽  
2021 ◽  
Vol 12 (8) ◽  
pp. 879
Author(s):  
Ruiquan He ◽  
Haihua Hu ◽  
Chunru Xiong ◽  
Guojun Han
Keyword(s):  
Neural Network ◽  
Error Correction ◽  
Error Detection ◽  
Flash Memory ◽  
Nand Flash ◽  
Data Reliability ◽  
Nand Flash Memory ◽  
Process Technology ◽  
Noise Mitigation ◽  
Memory Channel

The multilevel per cell technology and continued scaling down process technology significantly improves the storage density of NAND flash memory but also brings about a challenge in that data reliability degrades due to the serious noise. To ensure the data reliability, many noise mitigation technologies have been proposed. However, they only mitigate one of the noises of the NAND flash memory channel. In this paper, we consider all the main noises and present a novel neural network-assisted error correction (ANNAEC) scheme to increase the reliability of multi-level cell (MLC) NAND flash memory. To avoid using retention time as an input parameter of the neural network, we propose a relative log-likelihood ratio (LLR) to estimate the actual LLR. Then, we transform the bit detection into a clustering problem and propose to employ a neural network to learn the error characteristics of the NAND flash memory channel. Therefore, the trained neural network has optimized performances of bit error detection. Simulation results show that our proposed scheme can significantly improve the performance of the bit error detection and increase the endurance of NAND flash memory.

scholarly journals Investigation of Re-program Scheme in Charge Trap Based 3D NAND Flash Memory

2021 ◽  
pp. 1-1
Author(s):  
Ting Cheng ◽  
Jianquan Jia ◽  
Lei Jin ◽  
Xinlei Jia ◽  
Shiyu Xia ◽  
...  
Keyword(s):  
Flash Memory ◽  
Program Scheme ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Charge Trap
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