scholarly journals The Interface Characterization of 2-Mercapto-1-methylimidazole Corrosion Inhibitor on Brass

Coatings ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 295
Author(s):  
Matjaž Finšgar
Keyword(s):  
Surface Layer ◽  
Corrosion Inhibitor ◽  
Photoelectron Spectroscopy ◽  
Related Species ◽  
Surface Characterization ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Xps Analysis ◽  
Spectral Interferences ◽  
Tof Sims

This work presents a detailed surface analytical study and surface characterization, with an emphasis on the X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) analyses of 2‑mercapto‑1‑methylimidazole (MMI) as a corrosion inhibitor for brass. First, the electrochemical measurements demonstrated a corrosion inhibition effect of MMI in a 3 wt.% NaCl solution. Next, the formation of the MMI surface layer and its properties after 1 month of immersion was analyzed with attenuated total reflectance–Fourier-transform infrared spectroscopy, atomic force microscopy, field-emission scanning electron microscopy, and contact angle analysis. Moreover, to gradually remove the organic surface layer, a gas cluster ion beam (GCIB) sputtering source at different accelerated voltages and cluster sizes was employed. After each sputtering cycle, a high-resolution XPS analysis was performed. Moreover, an angle‑resolved XPS analysis was carried out for the MMI-treated brass sample to analyze the heterogeneous layered structure (the interface of the MMI organic/inorganic brass substrate). The interface properties were also investigated in detail using ToF-SIMS for spectra measurements and 2D imaging. Special attention was devoted to the possible spectral interferences for MMI‑related species. The thermal stability of different MMI-related species using molecular-specific signals without possible spectral interferences was determined by performing a cooling/heating experiment associated with ToF-SIMS measurements. It was shown that these species desorbed from the brass surface in the temperature range of 310–370 °C.

scholarly journals 2-Phenylimidazole Corrosion Inhibitor on Copper: An XPS and ToF-SIMS Surface Analytical Study

Coatings ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 966
Author(s):  
Matjaž Finšgar
Keyword(s):  
Surface Layer ◽  
Corrosion Inhibitor ◽  
Photoelectron Spectroscopy ◽  
Analytical Study ◽  
Ion Beam ◽  
Principal Component ◽  
Ion Beam Sputtering ◽  
Organometallic Complex ◽  
Xps Spectra ◽  
Tof Sims

This work presents a surface analytical study of the corrosion inhibitor 2-phenylimidazole (2PhI) adsorbed on a Cu surface from 3 wt.% NaCl solution. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) were used to investigate the surface phenomena. Various XPS experiments were performed, i.e., survey- and angle-resolved high-resolution XPS spectra measurements, gas cluster ion beam sputtering in conjunction with XPS measurements, and XPS imaging in conjunction with principal component analysis. These measurements were used to detail the composition of the surface layer at depth. In addition, various ToF-SIMS experiments were performed, such as positive ion ToF-SIMS spectral measurements, ToF-SIMS imaging, and cooling/heating in conjunction with ToF-SIMS measurements. This study shows that organometallic complexes were formed between 2PhI molecules and Cu ions, that the surface layer contained entrapped NaCl, that the surface layer contained some Cu(II) species (but the majority of species were Cu(I)-containing species), that the surface was almost completely covered with a combination of 2PhI molecules and organometallic complex, and that the temperature stability of these species increases when 2PhI is included in the organometallic complex.

Surface characterization of a rosin sizing agent in paper by means of EPMA, ESCA and TOF-SIMS

1997 ◽  
Vol 12 (4) ◽  
pp. 260-266 ◽  
Author(s):  
Yasushi Ozaki ◽  
Atsushi Sawatari
Keyword(s):  
Surface Layer ◽  
Surface Characterization ◽  
Osmium Tetroxide ◽  
Secondary Ion Mass Spectrometry ◽  
Pulp Fiber ◽  
Fragment Ions ◽  
Tof Sims ◽  
Micro Analysis ◽  
Secondary Ion

Abstract EPMA(e1ectronprobe micro analysis), ESCA (electron spectroscopy for chemical analysis) and TOF-SIMS (time of flight type secondary ion mass spectrometry) were used to detect the distribution of a rosin sizing agent in paper. For EPMA we labelled paper samples with osmium tetroxide which enabled the detection of rosin in the XY direction of the paper sheet. For ESCA we labelled paper samples with fluorine which also enabled the detection of rosin. At the same time, the ESCA angle-dependent technique was used to obtain depth profiles of the rosin. Also, distribution images of rosin on an extremely thin ( 1 nm) surface layer were made observable by monitoring fragment ions from the rosin with TOF-SIMS. By using EPMA, a notable difference in rosin distribution was shown on the pulp fiber. However, according to the TOF-SIMS examination, the rosin was shown to be distributed relatively even in an extremely thin surface layer. The ESCA angle- dependent technique showed that rosin was present mainly on the outer surface layer.

scholarly journals The Corrosion Inhibition of AA6082 Aluminium Alloy by Certain Azoles in Chloride Solution: Electrochemistry and Surface Analysis

Coatings ◽  
2019 ◽  
Vol 9 (6) ◽  
pp. 380 ◽  
Author(s):  
Klodian Xhanari ◽  
Matjaž Finšgar
Keyword(s):  
Surface Layer ◽  
Aluminium Alloy ◽  
Surface Analysis ◽  
Corrosion Inhibition ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Attenuated Total Reflectance ◽  
X Ray ◽  
Inhibition Effect ◽  
Secondary Ion

The corrosion inhibition effect of five azole compounds on the corrosion of an AA6082 aluminium alloy in 5 wt.% NaCl solution at 25 and 50 °C was investigated using weight loss and electrochemical measurements. Only 2-mercaptobenzothiazole (MBT) showed a corrosion inhibition effect at both temperatures and was further studied in detail, including with the addition of potassium iodide as a possible intensifier. Surface analysis of the MBT surface layer was performed by means of attenuated total reflectance Fourier transform infrared spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass spectrometry techniques. The hydrophobicity of the MBT surface layer was also investigated.

scholarly journals Exploring the geochemical distribution of organic carbon in early land plants: a novel approach

2017 ◽  
Vol 373 (1739) ◽  
pp. 20160499 ◽  
Author(s):  
Geoffrey D. Abbott ◽  
Ian W. Fletcher ◽  
Sabrina Tardio ◽  
Ethan Hack
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Plant Cell Wall ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Terrestrial Ecosystem ◽  
Gas Chromatography Mass Spectrometry ◽  
Fossil Plants ◽  
Tof Sims ◽  
Chromatography Mass Spectrometry

Terrestrialization depended on the evolution of biosynthetic pathways for biopolymers including lignin, cutin and suberin, which were concentrated in specific tissues, layers or organs such as the xylem, cuticle and roots on the submillimetre scale. However, it is often difficult, or even impossible especially for individual cells, to resolve the biomolecular composition of the different components of fossil plants on such a scale using the well-established coupled techniques of gas chromatography/mass spectrometry and liquid chromatography/mass spectrometry. Here, we report the application of techniques for surface analysis to investigate the composition of Rhynia gwynne-vaughanii . X-ray photoelectron spectroscopy of two different spots (both 300 µm × 600 µm) confirmed the presence of carbon. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) revealed ‘chemical maps’ (imaging mode with 300 nm resolution) of aliphatic and aromatic carbon in the intact fossil that correlate with the vascular structures observed in high-resolution optical images. This study shows that imaging ToF-SIMS has value for determining the location of the molecular components of fossil embryophytes while retaining structural information that will help elucidate how terrestrialization shaped the early evolution of land plant cell wall biochemistry. This article is part of a discussion meeting issue ‘The Rhynie cherts: our earliest terrestrial ecosystem revisited’.

X-ray Photoelectron Spectroscopy (XPS) Investigation of the Surface Film on Magnesium Powders

2012 ◽  
Vol 66 (5) ◽  
pp. 510-518 ◽  
Author(s):  
Paul J. Burke ◽  
Zeynel Bayindir ◽  
Georges J. Kipouros
Keyword(s):  
Surface Layer ◽  
Photoelectron Spectroscopy ◽  
Focused Ion Beam ◽  
Surface Film ◽  
Ion Beam ◽  
Pure Magnesium ◽  
Atmospheric Conditions ◽  
Magnesium Powder ◽  
X Ray ◽  
Aerospace Applications

Magnesium (Mg) and its alloys are attractive for use in automotive and aerospace applications because of their low density and good mechanical properties. However, difficulty in forming magnesium and the limited number of available commercial alloys limit their use. Powder metallurgy may be a suitable solution for forming near-net-shape parts. However, sintering pure magnesium presents difficulties due to surface film that forms on the magnesium powder particles. The present work investigates the composition of the surface film that forms on the surface of pure magnesium powders exposed to atmospheric conditions and on pure magnesium powders after compaction under uniaxial pressing at a pressure of 500 MPa and sintering under argon at 600 °C for 40 minutes. Initially, focused ion beam microscopy was utilized to determine the thickness of the surface layer of the magnesium powder and found it to be ∼10 nm. The X-ray photoelectron analysis of the green magnesium sample prior to sintering confirmed the presence of MgO, MgCO3·3H2O, and Mg(OH)2 in the surface layer of the powder with a core of pure magnesium. The outer portion of the surface layer was found to contain MgCO3·3H2O and Mg(OH)2, while the inner portion of the layer is primarily MgO. After sintering, the MgCO3·3H2O was found to be almost completely absent, and the amount of Mg(OH)2 was also decreased significantly. This is postulated to occur by decomposition of the compounds to MgO and gases during the high temperature of sintering. An increase in the MgO content after sintering supports this theory.

Comprehensive multilayer film analysis with XPS, AES, and EDS

1992 ◽  
Vol 50 (2) ◽  
pp. 1784-1785
Author(s):  
N. C. Miller
Keyword(s):  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Surface Composition ◽  
Ion Beam ◽  
Three Dimensional ◽  
Chemical Mapping ◽  
Vertical Diffusion ◽  
X Ray ◽  
Sample Rotation ◽  
Microscopic Features

Wavelength and energy dispersive x-ray spectroscopy (WDS and EDS) are routinely utilized to measure qualitatively and quantitatively the composition of microscopic features/phases of thickness 0.5 (μm or greater in solids. Surface spectroscopies, especially x-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES), are employed to determine surface chemistry and surface composition respectively of microscopic features 0.2-5 nm thick. The combined utilization of AES and EDS (or WDS) permits microanalysis of surface and subsurface features/phases. Two areas of improved analysis through combined utilization of AES and EDS are imaging/elemental mapping and measurement of vertical diffusion profiles. Strengths of XPS in complementing EDS/WDS will also be discussed.High resolution surface elemental or chemical mapping can be carried out with scanning Auger or secondary ion mass spectrometry (SIMS) microanalysis, respectively. In fact, both offer improved spacial resolution over WDS and EDS elemental x-ray dot mapping. Using sample rotation while removing material by ion beam sputter etching, three dimensional mapping can be carried out by either surface analysis technique, permitting microanalysis of buried features even in complex heterostructures.

Industrial applications of TOF-SIMS imaging

1996 ◽  
Vol 54 ◽  
pp. 1040-1041
Author(s):  
Steven J. Pachuta
Keyword(s):  
Liquid Metal ◽  
Metal Ion ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Mass Range ◽  
Chemical Imaging ◽  
Industrial Applications ◽  
Beam Diameter ◽  
Tof Sims ◽  
Initial Penetration

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has in recent years become a useful tool for surface analysis in industrial laboratories. All elements and isotopes, as well as many molecular entities, can be detected by SIMS, with most of the signal coming from the outer 10 - 20 Å of the surface. The initial penetration of TOF-SIMS into industry was as an improvement over existing quadrupole instruments, with higher mass range, mass resolution, and sensitivity. The coupling of TOF-SIMS with high brightness liquid metal ion sources greatly expanded the applicability of the technique, making chemical imaging of the outermost monolayers of a surface a routine experiment.Several examples will be presented of TOF-SIMS imaging applied to real-world materials encountered in an industrial analytical laboratory. All results were obtained from a PHI-Evans TFS series instrument equipped with an FEI two-lens 69Ga+ liquid metal ion gun (LMIG). When operated at 25 keV beam energy, a primary ion beam diameter of 2500 Å in continuous mode, and 1-2 μm in pulsed mode, can routinely be obtained.

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