scholarly journals Electrospun Poly(butylene-adipate-co-terephthalate)/Nano-hyDroxyapatite/Graphene Nanoribbon Scaffolds Improved the In Vivo Osteogenesis of the Neoformed Bone

2021 ◽  
Vol 12 (1) ◽  
pp. 11
Author(s):  
Luana Marotta Reis Vasconcellos ◽  
Gabriela F. Santana-Melo ◽  
Edmundo Silva ◽  
Vanessa Fernandes Pereira ◽  
Juliani Caroline Ribeiro Araújo ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
High Resolution ◽  
Graphene Nanoribbons ◽  
Fibrous Scaffold ◽  
Transmission Electron ◽  
Defect Area ◽  
High Resolution Tem ◽  
Ultrathin Fibers ◽  
Trabecular Number

Electrospun ultrathin fibrous scaffold filed with synthetic nanohydroxyapatite (nHAp) and graphene nanoribbons (GNR) has bioactive and osteoconductive properties and is a plausible strategy to improve bone regeneration. Poly(butylene-adipate-co-terephthalate) (PBAT) has been studied as fibrous scaffolds due to its low crystallinity, faster biodegradability, and good mechanical properties; however, its potential for in vivo applications remains underexplored. We proposed the application of electrospun PBAT with high contents of incorporated nHAp and nHAp/GNR nanoparticles as bone grafts. Ultrathin PBAT, PBAT/nHAp, and PBAT/nHAp/GNR fibers were produced using an electrospinning apparatus. The produced fibers were characterized morphologically and structurally using scanning electron (SEM) and high-resolution transmission electron (TEM) microscopies, respectively. Mechanical properties were analyzed using a texturometer. All scaffolds were implanted into critical tibia defects in rats and analyzed after two weeks using radiography, microcomputed tomography, histological, histomorphometric, and biomechanical analyses. The results showed through SEM and high-resolution TEM characterized the average diameters of the fibers (ranged from 0.208 µm ± 0.035 to 0.388 µm ± 0.087) and nHAp (crystallite around 0.28, 0.34, and 0.69 nm) and nHAp/GNR (200–300 nm) nanoparticles distribution into PBAT matrices. Ultrathin fibers were obtained, and the incorporated nHAp and nHAp/GNR nanoparticles were well distributed into PBAT matrices. The addition of nHAp and nHAp/GNR nanoparticles improved the elastic modulus of the ultrathin fibers compared to neat PBAT. High loads of nHAp/GNR (PBATnH5G group) improved the in vivo lamellar bone formation promoting greater radiographic density, trabecular number and stiffness in the defect area 2 weeks after implantation than control and PBAT groups.

scholarly journals Analytical High-resolution Electron Microscopy Reveals Organ-specific Nanoceria Bioprocessing

2017 ◽  
Vol 46 (1) ◽  
pp. 47-61 ◽  
Author(s):  
Uschi M. Graham ◽  
Robert A. Yokel ◽  
Alan K. Dozier ◽  
Lawrence Drummy ◽  
Krishnamurthy Mahalingam ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Analytical Electron Microscopy ◽  
High Resolution Electron Microscopy ◽  
Dark Field ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Organ Specific

This is the first utilization of advanced analytical electron microscopy methods, including high-resolution transmission electron microscopy, high-angle annular dark field scanning transmission electron microscopy, electron energy loss spectroscopy, and energy-dispersive X-ray spectroscopy mapping to characterize the organ-specific bioprocessing of a relatively inert nanomaterial (nanoceria). Liver and spleen samples from rats given a single intravenous infusion of nanoceria were obtained after prolonged (90 days) in vivo exposure. These advanced analytical electron microscopy methods were applied to elucidate the organ-specific cellular and subcellular fate of nanoceria after its uptake. Nanoceria is bioprocessed differently in the spleen than in the liver.

The Measurement Of Subtle Structural Changes In Yba2cu3O7-x By Processing High Resolution Tem Images

1999 ◽  
Vol 5 (S2) ◽  
pp. 196-197
Author(s):  
J.C. Barry ◽  
J.A. Alarco
Keyword(s):  
Image Processing ◽  
High Resolution ◽  
Structural Changes ◽  
Processing Method ◽  
Recent Theory ◽  
Major Focus ◽  
Image Processing Method ◽  
Transmission Electron ◽  
High Resolution Tem ◽  
Structural Modulation

Since the discovery of high temperature superconducting (HTS) ceramics there has been a great deal of discussion about theories of superconductivity. In a recent theory it has been proposed that the Tc's in these new materials are related in some way to a subtle phase separation in the structure. HTS ceramics have been studied quite intensively by high resolution transmission electron microscopy (HRTEM) and by electron diffraction (ED). In such studies the major focus invariably has been on the periodic structure of the object. However, early HRTEM work on Yba2cu3O7-x by Barry found that in addition to the crystalline order, the Yba2cu3O7-x HTS has a non-periodic structural modulation. In this work we have used an image processing method to look for subtle structural changes in Yba2cu3O7-x by measuring the bending of lattice fringes at twin planes. The image processing method is similar to the method used by Hetherington to study rigid body displacements at gold grain boundaries.

Multiple Double Cross-Section Transmission Electron Microscope Sample Preparation of Specific Sub-10 nm Diameter Si Nanowire Devices

2011 ◽  
Vol 17 (6) ◽  
pp. 889-895 ◽  
Author(s):  
Lynne M. Gignac ◽  
Surbhi Mittal ◽  
Sarunya Bangsaruntip ◽  
Guy M. Cohen ◽  
Jeffrey W. Sleight
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Cross Section ◽  
Transmission Electron Microscope ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Si Nanowire ◽  
Dual Beam ◽  
Transmission Electron ◽  
High Resolution Tem

AbstractThe ability to prepare multiple cross-section transmission electron microscope (XTEM) samples from one XTEM sample of specific sub-10 nm features was demonstrated. Sub-10 nm diameter Si nanowire (NW) devices were initially cross-sectioned using a dual-beam focused ion beam system in a direction running parallel to the device channel. From this XTEM sample, both low- and high-resolution transmission electron microscope (TEM) images were obtained from six separate, specific site Si NW devices. The XTEM sample was then re-sectioned in four separate locations in a direction perpendicular to the device channel: 90° from the original XTEM sample direction. Three of the four XTEM samples were successfully sectioned in the gate region of the device. From these three samples, low- and high-resolution TEM images of the Si NW were taken and measurements of the NW diameters were obtained. This technique demonstrated the ability to obtain high-resolution TEM images in directions 90° from one another of multiple, specific sub-10 nm features that were spaced 1.1 μm apart.

Development of a Double Tilt Specimen Heating Holder and its Application for the Study of Phase Transformation of Si3N4 During Sintering

1997 ◽  
Vol 3 (S2) ◽  
pp. 1085-1086
Author(s):  
T. Kamino ◽  
T. Yaguchi ◽  
M. Tomita ◽  
Y. Yasutomi ◽  
K. Hidaka
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Elevated Temperatures ◽  
Heating Element ◽  
High Melting ◽  
High Melting Point ◽  
Transmission Electron ◽  
High Resolution Tem ◽  
Metal Wires ◽  
Very High

The results of our previous studies revealed that the specimen heating holder with the heating elements of spiral shaped fine metal wires of high melting point enable us to observe high resolution transmission electron microscopy(TEM) images at elevated temperatures.In fact, the holder was applied for high resolution TEM study of a formation of SiC crystal at 1500°C and a surface reconstruction of Au deposited Si particle at 1000°C successfully. However, because the heating holder was single tilt type, there was a certain limitation in its application.In this paper, development of a double tilt specimen heating holder with a heating element of spiral shaped fine metal wire and its application for the study of microstructural changes of Si3N4 during sintering at very high temperature.Photograph of the newly developed double tilt specimen heating holder is shown in Fig. 1. The heating element is mounted on the electrically isolated tilting frame of the holder and the heating current is supplied via tilting rod which is also electrically isolated from other parts of the holder.

Orientation relationship and interfacial structure between Nbsolid solution precipitates and α-Nb5Si3 intermetallics

2009 ◽  
Vol 24 (1) ◽  
pp. 192-197 ◽  
Author(s):  
G.M. Cheng ◽  
Y.X. Tian ◽  
L.L. He
Keyword(s):  
Electron Microscopy ◽  
Solid Solution ◽  
Transmission Electron Microscopy ◽  
Stress Concentration ◽  
High Resolution ◽  
Orientation Relationship ◽  
Interfacial Structure ◽  
Selected Area Electron Diffraction ◽  
Transmission Electron ◽  
High Resolution Tem

The orientation relationship (OR) and the interfacial structure between Nb solid solution (Nbss) precipitates and α-Nb5Si3 intermetallics have been investigated by transmission electron microscopy (TEM). The OR between Nbss and α-Nb5Si3 was determined by selected-area electron diffraction analyses as (222)Nb//(002)α and . High-resolution TEM images of the Nbss/α-Nb5Si3 interface were presented. Steps existed at the interface that acted as centers of stress concentration and released the distortion of lattices to decrease the interfacial energy. In addition, the interfacial models were proposed based on the observed OR to describe the atomic matching of the interface. The distribution of alloying elements at the Nbss/α-Nb5Si3 interface has also been investigated, and Hf was enriched at the interface to strengthen the grain boundary.

High-Resolution Metrology in the TEM

2012 ◽  
Vol 20 (3) ◽  
pp. 46-49 ◽  
Author(s):  
C. T. Schamp
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Gate Oxide ◽  
End Points ◽  
True Value ◽  
Transmission Electron ◽  
High Resolution Tem ◽  
The Difference ◽  
Measurement Line

The transmission electron microscope (TEM) is well known as the technique of choice for visualization and measurement of features at near-atomic length scales, particularly for semiconductor devices. For example, a critical measurement of interest may be the thickness of the gate oxide in a transistor. The accuracy of these measurements is based on calibrated distances at each magnification. The term accuracy conveys the extent to which the measurement minimizes the difference between the measured value and the true value. The associated term precision is the closeness of agreement in a series of measurements locating the end-points of a measurement line. This article describes a method that increases the accuracy of metrology measurements applied to a high-resolution TEM image.

High-resolution TEM and XRD simulation of stacking disorder in 2:1 phyllosilicates

2008 ◽  
Vol 223 (01-02) ◽  
Author(s):  
Toshihiro Kogure ◽  
Jun Kameda
Keyword(s):  
High Resolution ◽  
Lateral Displacement ◽  
X Ray ◽  
Transmission Electron ◽  
Significant Difference ◽  
High Resolution Tem ◽  
Interlayer Region ◽  
Diffraction Patterns ◽  
Two Alternatives ◽  
Stacking Disorder

Stacking disorder is a common phenomenon in phyllosilicates but its nature is difficult to be deduced using conventional diffraction techniques. In contrast, recent investigations using high-resolution transmission electron microscopy (HRTEM) have elucidated the structure of stacking disorder in various phyllosilicates, by directly observing individual layers and stacking sequences. Furthermore, simulations of X-ray or electron diffraction patterns using the information from the HRTEM results can complement the limited analysis area in TEM and quantify the density of the stacking disorder.Although the bonding between adjacent layers is similar, there is a significant difference in the stacking disorder between two counterparts of dioctahedral and trioctahedral 2 : 1 phyllosilicates: pyrophyllite vs. talc and sudoite vs. trioctahedral chlorite. In pyrophyllite and sudoite, stacking disorder is caused mainly by two alternatives of the lateral displacement directions between the two tetrahedral sheets across the interlayer region. On the other hand, rotation of 2 : 1 layer is also an origin of the stacking disorder in talc and trioctahedral chlorite. This difference is explained by the corrugation of basal oxygen planes on the dioctahedral 2 : 1 layer formed by the tetrahedral tilting to enlarge

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