scholarly journals Regularities of the Formation of a Green Superhydrophobic Protective Coating on an Aluminum Alloy after Surface Modification with Stearic Acid Solutions

Metals ◽  
2021 ◽  
Vol 11 (11) ◽  
pp. 1718
Author(s):  
Aleksey Abrashov ◽  
Nelya Grigoryan ◽  
Yuri Korshak ◽  
Tigran Vagramyan ◽  
Oleg Grafov ◽  
...  
Keyword(s):  
Aluminum Alloy ◽  
Stearic Acid ◽  
Scanning Probe Microscopy ◽  
Protective Coatings ◽  
Scanning Probe ◽  
Acid Solutions ◽  
Express Method ◽  
Protective Ability ◽  
Salt Fog ◽  
Aluminum Alloy Surface

It has been shown that solutions of stearic acid in a dimethyl sulfoxide–water binary mixture allow superhydrophobic protective coatings to be created on an aluminum alloy surface with a minimum impact on the environment. The superhydrophobicity and self-cleaning ability of the coating that we developed have been confirmed by measurements of droplet wetting angles and roll-off angles. These properties appear due to the formation of a multimodal micro-rough surface that mainly consists of aluminum stearate. The coatings formed in this manner have been studied by ellipsometry, XPS, and scanning probe microscopy. Their protective ability has been estimated by the “droplet-express” method and in a salt fog chamber. The protective ability of the coating is determined by the DMSO/H2O ratio, the concentration of stearic acid, and the duration and temperature of modification of the aluminum alloy; it is controlled by a competition between the processes of aluminum stearate formation and hydrolysis. It has been shown that adsorption of stearic acid on an aluminum stearate coating increases its permeability and decreases its protective capability. The results presented in this article are useful for optimizing the conditions of applying green superhydrophobic stearate coatings on aluminum alloys in order to achieve a maximum protective effect.

Scanning probe microscopy studies of PbS surfaces oxidized in air and etched in aqueous acid solutions

2006 ◽  
Vol 252 (16) ◽  
pp. 5645-5658 ◽  
Author(s):  
Yuri L. Mikhlin ◽  
Alexander S. Romanchenko ◽  
Alexander A. Shagaev
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Acid Solutions ◽  
Probe Microscopy ◽  
Aqueous Acid

Research into the Structure of Aluminum Matrix Composite АK12+2.38%Cu+0.06%SiC with a Scanning Probe Microscope

2017 ◽  
Vol 265 ◽  
pp. 723-727
Author(s):  
S.V. Voronin ◽  
K.K. Chaplygin ◽  
A.D. Litoshina ◽  
Sergey V. Konovalov
Keyword(s):  
Silicon Carbide ◽  
Aluminum Alloy ◽  
Matrix Composite ◽  
Scanning Probe Microscopy ◽  
Aluminum Matrix ◽  
Aluminum Matrix Composite ◽  
Scanning Probe ◽  
Measuring Device ◽  
Probe Microscopy ◽  
Embedded Particles

The paper provides an overview of the results obtained when using the method of scanning probe microscopy for exploring surfaces of aluminum matrix composite (АC12+2.38%Cu+0.06%SiC) and modified aluminum alloy (АL2) samples with nanohardness measuring device “NanoScan-3D”. The authors describe a calibration process of the device, which was implemented via precise positioning the optical axis of nanohardness measuring device “NanoScan-3D” with the indenter axis. The paper highlights that the structure images of materials under study obtained in the process of optical metallographic tests are similar to results of scanning probe microscopy. The second major finding is that the modules of elasticity of phase components in materials АC12+2.38%Cu+0.06%SiC and АL2 can be appropriately measured using the method of scanning probe microscopy with nanohardness measuring device “NanoScan-3D”. The paper identifies that modules of elasticity of alpha solid solution grains, eutectic and released silicon are comparable in aluminum matrix composite АC12+2.38%Cu+0.06%SiC and modified aluminum alloy АL2. The authors also point out the convergence of modules of elasticity in the zones with embedded particles of silicon carbide with the data given in literature. The paper reports practical approval of the procedure for detecting the strengthening particles of silicon carbide in aluminum matrix composite АC12+2.38%Cu+0.06%SiC using the method of scanning probe microscopy with device “NanoScan-3D”.

Imaging molecules adsorbed onto electrodes under potential control by scanning probe microscopy

1991 ◽  
Vol 49 ◽  
pp. 376-377 ◽  
Author(s):  
N.J. Tao ◽  
J.A. DeRose ◽  
P.I. Oden ◽  
S.M. Lindsay
Keyword(s):  
Surface Charge ◽  
Environmental Effects ◽  
Scanning Probe Microscopy ◽  
Statistical Significance ◽  
Electrochemical Methods ◽  
Surface Structures ◽  
Scanning Probe ◽  
Potential Control ◽  
Afm Imaging ◽  
Special Circumstances

Clemmer and Beebe have pointed out that surface structures on graphite substrates can be misinterpreted as biopolymer images in STM experiments. We have been using electrochemical methods to react DNA fragments onto gold electrodes for STM and AFM imaging. The adsorbates produced in this way are only homogeneous in special circumstances. Searching an inhomogeneous substrate for ‘desired’ images limits the value of the data. Here, we report on a reversible method for imaging adsorbates. The molecules can be lifted onto and off the substrate during imaging. This leaves no doubt about the validity or statistical significance of the images. Furthermore, environmental effects (such as changes in electrolyte or surface charge) can be investigated easily.

The Role of Scanning Probe Microscopy in Drug Delivery Research

1996 ◽  
Vol 13 (3-4) ◽  
pp. 225-256 ◽  
Author(s):  
Kevin M. Shakesheff ◽  
Martyn C. Davies ◽  
Clive J. Roberts ◽  
Saul J. B. Tendler ◽  
Philip M. Williams
Keyword(s):  
Drug Delivery ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

Salt fog corrosion behavior of friction stir welded AA2014-T651 aluminum alloy

2016 ◽  
Vol 58 (11-12) ◽  
pp. 932-938 ◽  
Author(s):  
Kollapuri Thamilarasan ◽  
Sadayan Rajendraboopathy ◽  
Gankidi Madhusudhan Reddy ◽  
Tadivaka Srinivasa Rao ◽  
Sajja Rama ◽  
...  
Keyword(s):  
Aluminum Alloy ◽  
Corrosion Behavior ◽  
Friction Stir ◽  
Salt Fog Corrosion ◽  
Salt Fog

Extending Electrical Scanning Probe Microscopy Measurements of Semiconductor Devices Using Microwave Impedance Microscopy

2015 ◽  
Author(s):  
Benedict Drevniok ◽  
St. John Dixon-Warren ◽  
Oskar Amster ◽  
Stuart L Friedman ◽  
Yongliang Yang
Keyword(s):  
Scanning Probe Microscopy ◽  
Semiconductor Devices ◽  
Cmos Image Sensor ◽  
Image Sensor ◽  
Scanning Probe ◽  
Cross Sectional ◽  
Probe Microscopy ◽  
Dopant Profiling ◽  
Capacitance Voltage

Abstract Scanning microwave impedance microscopy was used to analyze a CMOS image sensor sample to reveal details of the dopant profiling in planar and cross-sectional samples. Sitespecific capacitance-voltage spectroscopy was performed on different regions of the samples.

Cross-Section Sample Preparation Method for Imaging Dopant Related Anomalies Using Scanning Probe Microscopy Techniques

2014 ◽  
Author(s):  
Swaminathan Subramanian ◽  
Khiem Ly ◽  
Tony Chrastecky
Keyword(s):  
Sample Preparation ◽  
Failure Analysis ◽  
Cross Section ◽  
Scanning Probe Microscopy ◽  
Preparation Method ◽  
Fault Isolation ◽  
Scanning Probe ◽  
Sample Preparation Method ◽  
Probe Microscopy ◽  
Section Sample

Abstract Visualization of dopant related anomalies in integrated circuits is extremely challenging. Cleaving of the die may not be possible in practical failure analysis situations that require extensive electrical fault isolation, where the failing die can be submitted of scanning probe microscopy analysis in various states such as partially depackaged die, backside thinned die, and so on. In advanced technologies, the circuit orientation in the wafer may not align with preferred crystallographic direction for cleaving the silicon or other substrates. In order to overcome these issues, a focused ion beam lift-out based approach for site-specific cross-section sample preparation is developed in this work. A directional mechanical polishing procedure to produce smooth damage-free surface for junction profiling is also implemented. Two failure analysis applications of the sample preparation method to visualize junction anomalies using scanning microwave microscopy are also discussed.

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