scholarly journals Crystal Growth of Cubic and Hexagonal GaN Bulk Alloys and Their Thermal-Vacuum-Evaporated Nano-Thin Films

Micromachines ◽  
2021 ◽  
Vol 12 (10) ◽  
pp. 1240
Author(s):  
Marwa Fathy ◽  
Sara Gad ◽  
Badawi Anis ◽  
Abd El-Hady B. Kashyout

In this study, we investigate a novel simple methodology to synthesize gallium nitride nanoparticles (GaN) that could be used as an active layer in light-emitting diode (LED) devices by combining the crystal growth technique with thermal vacuum evaporation. The characterizations of structural and optical properties are carried out with different techniques to investigate the main featured properties of GaN bulk alloys and their thin films. Field emission scanning electron microscopy (FESEM) delivered images in bulk structures that show micro rods with an average diameter of 0.98 µm, while their thin films show regular microspheres with diameter ranging from 0.13 µm to 0.22 µm. X-ray diffraction (XRD) of the bulk crystals reveals a combination of 20% hexagonal and 80% cubic structure, and in thin films, it shows the orientation of the hexagonal phase. For HRTEM, these microspheres are composed of nanoparticles of GaN with diameter of 8–10 nm. For the optical behavior, a band gap of about from 2.33 to 3.1 eV is observed in both cases as alloy and thin film, respectively. This article highlights the fabrication of the major cubic structure of GaN bulk alloy with its thin films of high electron lifetime.

Photonics ◽  
2019 ◽  
Vol 6 (2) ◽  
pp. 44 ◽  
Author(s):  
B. Kashyout ◽  
Fathy ◽  
Gad ◽  
Badr ◽  
A. Bishara

In this study, we investigated an innovative method for the fabrication of nanostructure bulk alloys and thin films of indium gallium nitride (InxGa1-xN) as active, thin films for light-emitting diode (LED) devices using both crystal growth and thermal vacuum evaporation techniques, respectively. These methods resulted in some tangible improvements upon the usual techniques of InxGa1-xN systems. A cheap glass substrate was used for the fabrication of the LED devices instead of sapphire. Indium (In) and Gallium (Ga) metals, and ammonia (NH3) were the precursors for the alloy formation. The alloys were prepared at different growth temperatures with compositions ranging from 0.1≤x≤0.9. InxGa1-xN alloys at 0.1≤x≤0.9 had different crystallinities with respect to X-Ray diffraction (XRD) patterns where the energy bandgap that was measured by photoluminescence (PL) fell in the range between 1.3 and 2.5 eV. The bulk alloys were utilized to deposit the thin films onto the glass substrate using thermal vacuum evaporation (TVE). The XRD thin films that were prepared by TVE showed high crystallinity of cubic and hexagonal structures with high homogeneity. Using TVE, the InxGa1-xN phase separation of 0.1≤x≤0.9 was eliminated and highly detected by XRD and FESEM. Also, the Raman spectroscopy confirmed the structure that was detected by XRD. The FESEM showed a variance in the grain size of both alloys and thin films. The InxGa1-xN LED device with the structure of glass/GaN/n-In0.1Ga0.9N:n/In0.1Ga0.9N/p-In0.1Ga0.9N:Mg was checked by the light emitted by electroluminescence (EL). White light generation is a promising new direction for the fabrication of such devices based on InxGa1-xN LED devices with simple and low-cost techniques.


2018 ◽  
Vol 67 (6) ◽  
pp. 691-699 ◽  
Author(s):  
Bruno GAL Borges ◽  
Amanda G Veiga ◽  
Maria Gioti ◽  
Argiris Laskarakis ◽  
Lazaros Tzounis ◽  
...  

Open Physics ◽  
2011 ◽  
Vol 9 (4) ◽  
Author(s):  
Junli Huang ◽  
Liya Zhou ◽  
Yuwei Lan ◽  
Fuzhong Gong ◽  
Qunliang Li ◽  
...  

AbstractEu3+-doped CaZrO3 phosphor with perovskite-type structure was synthesized by the high temperature solid-state method. The samples were characterized by X-ray diffraction, scanning electron microscopy, fluorescence spectrophotometer and UV-vis spectrophotometer, respectively. XRD analysis showed that the formation of CaZrO3 was at the calcinations temperature of 1400°C. The average diameter of CaZrO3 with 4 mol% doped-Eu3+ was 2µm. The PL spectra demonstrated that CaZrO3:Eu3+ phosphor could be excited effectively in the near ultraviolet light region (397 nm) and emitted strong red-emission lines at 616 nm corresponding to the forced electric dipole 5 D 0 → 7 F 2 transitions of Eu3+. Meanwhile, the light-emitting diode was fabricated with the Ca0.96ZrO3:Eu0.043+ phosphor, which can efficiently absorb ∼ 400 nm irradiation and emit red light. Therefore Ca0.96ZrO3:Eu0.043+ may have applications for a near ultraviolet InGaN chip-based white light-emitting diode.


2007 ◽  
Vol 470 (1) ◽  
pp. 251-257 ◽  
Author(s):  
Myung Chan Kim ◽  
Sang Ho Sohn ◽  
Duck Kyu Park ◽  
Sang Kooun Jung ◽  
Eun Lyoung Kim ◽  
...  

2016 ◽  
Vol 18 (2) ◽  
pp. 1042-1049 ◽  
Author(s):  
Lae Ho Kim ◽  
Yong Jin Jeong ◽  
Tae Kyu An ◽  
Seonuk Park ◽  
Jin Hyuk Jang ◽  
...  

The shelf-life of the OLED devices passivated with and without PEALD-based films at 60 °C and 90% RH.


2018 ◽  
Vol 13 (1) ◽  
pp. 54-62 ◽  
Author(s):  
Nataliia Kariaka ◽  
Olena Litsis ◽  
Yuriy Kolomzarov ◽  
Paula Gawryszewska ◽  
Sergii Smola ◽  
...  

RSC Advances ◽  
2019 ◽  
Vol 9 (47) ◽  
pp. 27424-27431 ◽  
Author(s):  
Ningze Zhuo ◽  
Na Zhang ◽  
Teng Jiang ◽  
Peng Chen ◽  
Haibo Wang

Green phosphor thin films with different silica resin/phosphor mass ratios and phosphor particle sizes were prepared by the hot pressing method.


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