scholarly journals Worth a Closer Look: Raman Spectra of Lead-Pipe Scale

Minerals ◽  
2021 ◽  
Vol 11 (10) ◽  
pp. 1047
Author(s):  
Jill Dill Pasteris ◽  
Yeunook Bae ◽  
Daniel E. Giammar ◽  
Sydney N. Dybing ◽  
Claude H. Yoder ◽  
...  
Keyword(s):  
Cross Sections ◽  
Water System ◽  
Analytical Techniques ◽  
Real Time Analysis ◽  
Fiber Optic Probes ◽  
Lead Pipe ◽  
Lead Pipes ◽  
Non Destructive

The identification and characterization of lead-bearing and associated minerals in scales on lead pipes are essential to understanding and predicting the mobilization of lead into drinking water. Despite its long-recognized usefulness in the unambiguous identification of crystalline and amorphous solids, distinguishing between polymorphic phases, and rapid and non-destructive analysis on the micrometer spatial scale, the Raman spectroscopy (RS) technique has been applied only occasionally in the analysis of scales in lead service lines (LSLs). This article illustrates multiple applications of RS not just for the identification of phases, but also compositional and structural characterization of scale materials in harvested lead pipes and experimental pipe-loop/recirculation systems. RS is shown to be a sensitive monitor of these characteristics through analyses on cross-sections of lead pipes, raw interior pipe walls, particulates captured in filters, and scrapings from pipes. RS proves to be especially sensitive to the state of crystallinity of scale phases (important to their solubility) and to the specific chemistry of phases precipitated upon the introduction of orthophosphate to the water system. It can be used effectively alone as well as in conjunction with more standard analytical techniques. By means of fiber-optic probes, RS has potential for in situ, real-time analysis within water-filled pipes.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

A very rapid in situ Kikuchi technique to determine relative crystal misorientation

1988 ◽  
Vol 46 ◽  
pp. 830-831
Author(s):  
J. I. Bennetch
Keyword(s):  
Electron Beam ◽  
Analytical Techniques ◽  
Superplastic Forming ◽  
The Other ◽  
Kikuchi Pattern ◽  
Kikuchi Line ◽  
Line Analysis

In a recent study of the superplastic forming (SPF) behavior of certain Al-Li-X alloys, the relative misorientation between adjacent (sub)grains proved to be an important parameter. It is well established that the most accurate way to determine misorientation across boundaries is by Kikuchi line analysis. However, the SPF study required the characterization of a large number of (sub)grains in each sample to be statistically meaningful, a very time-consuming task even for comparatively rapid Kikuchi analytical techniques.In order to circumvent this problem, an alternate, even more rapid in-situ Kikuchi technique was devised, eliminating the need for the developing of negatives and any subsequent measurements on photographic plates. All that is required is a double tilt low backlash goniometer capable of tilting ± 45° in one axis and ± 30° in the other axis. The procedure is as follows. While viewing the microscope screen, one merely tilts the specimen until a standard recognizable reference Kikuchi pattern is centered, making sure, at the same time, that the focused electron beam remains on the (sub)grain in question.

Flamanville EPR RPV’s Heads Carbon Segregation: Characterization of the Segregation in the Heads

2018 ◽  
Author(s):  
Philippe Fichot ◽  
Olivier Calonne ◽  
Mathieu Segond ◽  
Stéphane Marie ◽  
Yvon Desnoyers ◽  
...  
Keyword(s):  
Carbon Content ◽  
Residual Carbon ◽  
Testing Program ◽  
Specific Strategy ◽  
Carbon Segregation ◽  
Geostatistical Approach ◽  
Short Time ◽  
Non Destructive

To characterize the mechanical properties of the residual carbon segregation of the Flamanville EPR RPV heads, a testing program has been defined by Framatome using three sacrificial representative heads. The first step of this program was a 3D characterization of the carbon content inside each piece. A specific strategy has been defined using two methods for the carbon measuring: - In situ measurements using a mobile arc spark spectrometer. This device allows a higher number of non-destructive measurements in a particularly constrained environment and in a short time, - Conventional spectrometry performed on chips sampled from the pieces. This technique is more accurate but is destructive and more time consuming. Also, to consolidate the representativeness of the sacrificial vessels heads, the results were analysed using a geostatistical approach. This paper presents how these two techniques have been used to characterize the carbon content in the segregated part of the pieces and the conclusion of the geostatistical analyses.

scholarly journals Polychromy on the Antonine Wall Distance Sculptures: Non-destructive Identification of Pigments on Roman Reliefs

Britannia ◽  
2020 ◽  
Vol 51 ◽  
pp. 175-201
Author(s):  
Louisa Campbell
Keyword(s):  
Material Culture ◽  
Materials Science ◽  
Analytical Techniques ◽  
Composition Analysis ◽  
Raman Spectrometry ◽  
X Ray ◽  
Wall Distance ◽  
Depositional Processes ◽  
Non Destructive

ABSTRACTNon-destructive analytical techniques are now widely and successfully employed in the fields of materials science and conservation. Portable X-ray fluorescence (pXRF) and portable Raman spectrometry have proven particularly valuable for the rapid in-situ analysis of samples, but their applicability for the analysis of archaeological artefacts for which survival of surface treatments can be negatively impacted by post-depositional processes has been underexplored. Roman relief-sculpted monumental inscriptions from the Antonine Wall, commonly referred to as ‘Distance Slabs’, have offered an excellent opportunity to deploy these non-destructive techniques to determine whether they were originally adorned with pigments and, if so, to identify the colours used. This is a revolutionary approach to identifying colours on ancient sandstone sculpture that transforms our understanding of these unique monuments. Elemental composition analysis by pXRF has confirmed evidence for pigments and this is supported by the Raman results, making it possible to develop and reconstruct a palette of colours that originally brought these monuments to life in vibrant polychrome. The research offers a new methodology for identifying pigments on sandstone sculpture and opens new avenues for investigating other classes of material culture alongside the development of bespoke analytical equipment.

Electron Channeling Contrast Imaging for Beyond Silicon Materials Characterization

2018 ◽  
Author(s):  
Libor Strakos ◽  
Ondrej Machek ◽  
Tomas Vystavel ◽  
Andreas Schulze ◽  
Han Han ◽  
...  
Keyword(s):  
Lattice Mismatch ◽  
Defect Density ◽  
Analytical Techniques ◽  
Device Performance ◽  
Contrast Imaging ◽  
Large Area ◽  
Electron Channeling ◽  
Silicon Materials ◽  
Non Destructive

Abstract As semiconductor devices continue to shrink, novel materials (e.g. (Si)Ge, III/V) are being tested and incorporated to boost device performance. Such materials are difficult to grow on Si wafers without forming crystalline defects due to lattice mismatch. Such defects can decrease or compromise device performance. For this reason, non-destructive, high throughput and reliable analytical techniques are required. In this paper Electron Channeling Contrast Imaging (ECCI), large area mapping and defect detection using deep learning are combined in an analytical workflow for the characterization of the defectivity of “beyond Silicon” materials. Such a workflow addresses the requirements for large areas 10-4 cm2 with defect density down to 104 cm-2.

scholarly journals An in situ Raman spectroscopy-based microfluidic “lab-on-a-chip” platform for non-destructive and continuous characterization of Pseudomonas aeruginosa biofilms

2015 ◽  
Vol 51 (43) ◽  
pp. 8966-8969 ◽  
Author(s):  
Jinsong Feng ◽  
César de la Fuente-Núñez ◽  
Michael J. Trimble ◽  
Jie Xu ◽  
Robert E. W. Hancock ◽  
...  
Keyword(s):  
Pseudomonas Aeruginosa ◽  
Raman Spectroscopy ◽  
Lab On A Chip ◽  
Confocal Raman Microscopy ◽  
In Situ Raman Spectroscopy ◽  
In Situ Raman ◽  
Confocal Raman ◽  
Non Destructive

Pseudomonas aeruginosabiofilm was cultivated and characterized in a microfluidic “lab-on-a-chip” platform coupled with confocal Raman microscopy in a non-destructive manner.

Quantitative Analysis of Raman Spectra from Diamond Like Carbon: Calibration Transfer

1998 ◽  
Vol 555 ◽  
Author(s):  
S. S. Rosenblum ◽  
Kevin L. Davis ◽  
James M. Tedesco
Keyword(s):  
Raman Spectroscopy ◽  
Hard Disk Drives ◽  
Diamond Like Carbon ◽  
Disk Drives ◽  
Calibration Transfer ◽  
Carbon Coatings ◽  
Protective Layers ◽  
Non Destructive

AbstractWe report on Raman studies of diamond-like carbon (DLC) films; in particular, we report on the instrumentation and methodology required for comparing Raman measurements taken on different Raman analyzers. Raman spectroscopy has taken on an increasingly important role in materials processing because of its capability of performing non-destructive, in situ characterization of thin films. In particular, noncrystalline carbon coatings have become ubiquitous as protective layers on everything from machine tools to hard disk drives. As tolerances on coating properties begin to play an important part in determining device failure, Raman spectroscopy has found ever greater application as a quality control/quality assurance tool. However, use of Raman as an analytical tool has been hampered by the inability to quantitatively compare spectra obtained with different Raman analyzers. By using automated, robust calibration protocols on both the wavelength and intensity axes, we have demonstrated cross-instrument calibration transfer of DLC films.

scholarly journals Chemistry for Audio Heritage Preservation: A Review of Analytical Techniques for Audio Magnetic Tapes

Heritage ◽  
2019 ◽  
Vol 2 (2) ◽  
pp. 1551-1587
Author(s):  
Federica Bressan ◽  
Richard L. Hess ◽  
Paolo Sgarbossa ◽  
Roberta Bertani
Keyword(s):  
Analytical Techniques ◽  
Video Data ◽  
Cultural Resources ◽  
Chemical Identification ◽  
Heritage Preservation ◽  
The World ◽  
Instrumental Approaches ◽  
The Impact ◽  
Non Destructive

Vast and important cultural resources are entrusted to magnetic tape around the world, but they are susceptible to degradation, which may lead to severe replay problems. Audio magnetic tapes are complex and multicomponent devices containing organic compounds and metal systems, which can be potential catalysts for many degradative reactions in the presence of water, light, or heating. The aim of this review is to collect the literature concerning the analytical determinations and instrumental approaches that can achieve the chemical identification of the components in the tape and the degradation state. Thus, a combination of destructive (such as acetone extraction) and non-destructive techniques (such as ATR FTIR spectroscopy) have been proposed, together with SEM, ESEM, XRD and TGA analyses to assess the chemical and physical characterization of the tape with the purpose to individualize restoration treatments and optimize conditions for preservation. The impact of the studies reviewed in this paper may go beyond audio, being potentially relevant to video, data, instrumentation, and logging tapes.

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