scholarly journals Development of Microfluidic Cell for Liquid Phase Layer Deposition Tracking

2020 ◽  
Vol 3 (2) ◽  
pp. 94-97
Author(s):  
József Bálint Renkó ◽  
Attila Bonyár ◽  
Péter János Szabó

AbstractThis paper shows how microfluidic tools can be used for up-to-date microstructural investigations based on thin film deposition. The construction and production methods of such measuring procedures are introduced, and their application in ellipsometric investigations is shown. By using these tools, the researchers provide the possibility to observe and document the effects of certain fine structural processes in the development of the final microstructure. This paper describes two specific application areas of such microfluidics cells. Microfluidics cells can be used together with both optical microscopy and spectroscopic ellipsometry to understand previously unexplored microstructural changes.

2010 ◽  
Vol 55 (3) ◽  
pp. 385-393 ◽  
Author(s):  
Dayene M. Carvalho ◽  
Jorge L. B. Maciel ◽  
Leandro P. Ravaro ◽  
Rogério E. Garcia ◽  
Valdemir G. Ferreira ◽  
...  

2021 ◽  
Author(s):  
Byeong Guk Ko ◽  
Chi Thang Nguyen ◽  
Bonwook Gu ◽  
Rizwan Khan ◽  
Kunwoo Park ◽  
...  

Atomic layer deposition (ALD) is a thin film deposition technique based on self-saturated reactions between a precursor and reactant vacuum conditions. A typical ALD reaction consists of the first half-reaction...


1987 ◽  
Vol 101 ◽  
Author(s):  
F. Ferrjeu ◽  
J.L. Stehle ◽  
F. Bernoux ◽  
O. Thomas

ABSTRACTSpectroscopie ellipsometry is a non-destructive tool for physical characterization without prior preparation of materials.Real time, in-situ measurements can be applied to analyze surface problems, to optimize thin film processing and even to monitor epitaxial growth or thin film deposition. Spectroscopie Eilipsometers built by SOPRA are described. A new instrument using Optical Multi-channel Analysis,(OMA), with a spectral range from 1.1 ev up to 4.8 ev which gives up to 11 ellipsometry spectra per second has been developed. Applications using Spectroscopie Ellipsometry are also discussed .


2017 ◽  
Vol 5 (16) ◽  
pp. 7433-7444 ◽  
Author(s):  
Cam-Anh Thieu ◽  
Jongsup Hong ◽  
Hyoungchul Kim ◽  
Kyung Joong Yoon ◽  
Jong-Ho Lee ◽  
...  

To reveal the reaction mechanism of low-temperature co-electrolysis (LT-Co-EC), insertion of Pd into the Ni–YSZ fuel electrode functional layer by multi-layer thin film deposition was studied.


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