scholarly journals Electron-Beam Irradiation Induced Regulation of Surface Defects in Lead Halide Perovskite Thin Films

Research ◽  
2021 ◽  
Vol 2021 ◽  
pp. 1-11
Author(s):  
Binbin Jin ◽  
Ding Zhao ◽  
Fei Liang ◽  
Lufang Liu ◽  
Dongli Liu ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Surface Defects ◽  
Threshold Energy ◽  
Dose Interval ◽  
Structure Property ◽  
Beam Irradiation ◽  
Displacement Threshold ◽  
Pl Emission ◽  
Beam Dose

Organic-inorganic hybrid perovskites (OIHPs) have been intensively studied due to their fascinating optoelectronic performance. Electron microscopy and related characterization techniques are powerful to figure out their structure-property relationships at the nanoscale. However, electron beam irradiation usually causes damage to these beam-sensitive materials and thus deteriorates the associated devices. Taking a widely used CH3NH3PbI3 film as an example, here, we carry out a comprehensive study on how electron beam irradiation affects its properties. Interestingly, our results reveal that photoluminescence (PL) intensity of the film can be significantly improved along with blue-shift of emission peak at a specific electron beam dose interval. This improvement stems from the reduction of trap density at the CH3NH3PbI3 surface. The knock-on effect helps expose a fresh surface assisted by the surface defect-induced lowering of displacement threshold energy. Meanwhile, the radiolysis process consistently degrades the crystal structure and weaken the PL emission with the increase of electron beam dose. Consequently, the final PL emission comes from a balance between knock-on and radiolysis effects. Taking advantage of the defect regulation, we successfully demonstrate a patterned CH3NH3PbI3 film with controllable PL emission and a photodetector with enhanced photocurrent. This work will trigger the application of electron beam irradiation as a powerful tool for perovskite materials processing in micro-LEDs and other optoelectronic applications.

scholarly journals Study on Wear and Morphological Behavior of Electron Beam Dose Irradiated Polyoxymethylene Copolymer (POM-C)

2016 ◽  
Vol 44 ◽  
pp. 19-28
Author(s):  
Md. Shahinur Rahman ◽  
Heon-Ju Lee ◽  
Jong-Keun Yang ◽  
Konstantin Lyakhov ◽  
Muhammad Athar Uddin
Keyword(s):  
Electron Beam ◽  
Wear Rate ◽  
Electron Beam Irradiation ◽  
Surface Hardness ◽  
Morphological Properties ◽  
Irradiation Condition ◽  
Cross Linking ◽  
Physical Factors ◽  
Beam Irradiation ◽  
Beam Dose

Polyoxymethylene copolymer (POM-C) is the most prominent engineering thermoplastic consisting of repeating carbon-oxygen bonds in the form of oxymethylene groups (OCH2). It is widely used to make small gear wheels, ball bearings, precision parts, automotive and consumer electronics. In this study, the POM-C round blocks were irradiated with 165 KeV electron beam energy in five doses (100, 200, 300, 500 and 700 kGy) in vacuum condition at room temperature. The wear rate, surface hardness and morphological properties of electron beam dose irradiated POM-C blocks surfaces have been analyzed using pin on disk tribometer, optical microscopy, nano-indenter, Raman spectroscopy, 3D nano surface profiler and scanning electron microscopy (SEM). The electron beam irradiation transferred the wear phenomena of unirradiated POM-C sample from the abrasive wear (plough and cracks), adhesive wear  (grooving/striation, micropitting) and scraping to mild scraping and striation for the 100 kGy dose irradiated POM-C sample due to cross-linking (macroscopic networks), chemical free radicals formations and partial physical modification (smoothness), which can be concluded from tribometer, optical microscopic, SEM and Raman spectroscopic observations. It also reduced the surface wear rate and average surface roughness with increasing microsurface hardness at threshold value of cross-linking among all unirradiated and others doses irradiated POM-C blocks. The level of tribological (wear and morphology) attribute improvement relies on the electron beam irradiation condition (energy and dose rate) depending on chemical and physical factors of polymeric materials.

EFFECT OF ELECTRON BEAM IRRADIATION ON THE STRUCTURE–PROPERTY RELATIONSHIP OF ETHYLENE OCTENE COPOLYMER AND POLYDIMETHYL SILOXANE RUBBER BLENDS

2016 ◽  
Vol 89 (3) ◽  
pp. 477-498 ◽  
Author(s):  
Padmanabhan Ramachandran ◽  
Kinsuk Naskar ◽  
Golok B. Nando
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Physicomechanical Properties ◽  
Cross Linking ◽  
Structure Property ◽  
Beam Irradiation ◽  
Polydimethyl Siloxane ◽  
Structure Property Relationship ◽  
Ethylene Octene Copolymer ◽  
Relationship Of

ABSTRACT The effects of electron beam irradiation on the structure–property relationship of blends can be studied based on ethylene octene copolymer (EOC) and polydimethyl siloxane (PDMS) rubber at three different blend ratios prepared with a melt mixing technique. Irradiation with 2.5 MeV electron beam accelerating energy, over a radiation dose varying from 25 to 150 kGy, causes cross-linking in both the EOC and the PDMS phases. However, cross-linking of the EOC phase without affecting the crystallinity of the EOC polymer leads to tremendous improvement in the physicomechanical properties, including the tensile strength, which improves by nearly 35% for 70:30 EOC:PDMS blends. Morphology of the blends before and after irradiation can be analyzed by scanning electron microscopy and atomic force microscopy and correlated with the physicomechanical properties. The physicomechanical properties of the individual polymer components after irradiation show that radiation cross-linking is more effective for PDMS rubber than it is for EOC. However, at higher radiation doses, chain scissions are possible in both EOC and PDMS rubber, which affect the physicomechanical properties. Through blending and subsequent radiation cross-linking, the maximum degradation temperature of EOC can be increased from 488.6 to 512.8 °C.

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

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