Motivation of New Generation Students for Learning Physics and Mathematics

2018 ◽  
Author(s):  
Palmira Pečiuliauskienė ◽  
Valdemaras Aleksa
Keyword(s):  
And Mathematics ◽  
New Generation

Women in science: the need for a global cultural change

2019 ◽  
Vol 15 (S367) ◽  
pp. 281-285
Author(s):  
Karen Hallberg
Keyword(s):  
Cultural Change ◽  
Current Situation ◽  
Women In Science ◽  
Cultural Aspect ◽  
Science Technology ◽  
Participation Of Women ◽  
And Mathematics ◽  
New Generation ◽  
Cultural Maturity ◽  
The Way

AbstractThis paper summarizes the talk given at this conference in which the cultural aspect of the low participation of women in science, mainly in STEM (Science, Technology, Engineering and Mathematics) areas, is emphazised. A few personal recollections will be presented and some some striking numbers to illustrate the current situation will be given. In addition, some thought provoking ideas on what is known as “neurosexism” are explicited and a tribute is made to three women that overcame the challenges posed to them in different times in history (including current times) and helped paved the way to the new generation. However, there is still a long way to go. The inclusion of women and of other relegated sectors of society in scientific and technological activities is an important pending issue which will be achieved when our society as a whole reaches the necessary cultural maturity.

scholarly journals Best IASL Conference 2017 Paper: Preparing Teacher Librarians to Support STEM Education

2017 ◽  
pp. 1-11
Author(s):  
Melissa P. Johnston
Keyword(s):  
Stem Education ◽  
Teaching And Learning ◽  
The United States ◽  
Stem Learning ◽  
Post Secondary ◽  
Integration Of Technology ◽  
And Mathematics ◽  
Teacher Librarians ◽  
New Generation ◽  
Pre Service Teacher

A current focus in schools in the United States is STEM education, which prepares students for successful employment and post-secondary studies that require unique and more-technically advanced skills through teaching and learning in the areas of science, technology, engineering, and mathematics (STEM). This approach is grounded in problem solving, discovery, and exploratory learning, which requires students to actively engage in a situation in order to find its solution. Students engage in STEM learning in many different ways, with technology and digital resources playing an important role. The prominence of technology in STEM education provides leadership opportunities for teacher librarians. Yet, teacher librarians must be prepared to lead in the integration of technology to support STEM education. This report presents identified needs of teacher librarians in regards to supporting STEM education and discusses implications for better preparing pre-service teacher librarians to lead in order to address the needs of a new generation of learners.

A new paradigm for graduate research and training in the biomedical sciences and engineering

2005 ◽  
Vol 29 (2) ◽  
pp. 98-102 ◽  
Author(s):  
J. D. Humphrey ◽  
G. L. Coté ◽  
J. R. Walton ◽  
G. A. Meininger ◽  
G. A. Laine
Keyword(s):  
Interdisciplinary Teams ◽  
Biomedical Sciences ◽  
New Paradigm ◽  
Graduate Research ◽  
Educational Paradigm ◽  
And Mathematics ◽  
The Individual ◽  
New Generation ◽  
Collaborative Efforts ◽  
And Training

98Emphasis on the individual investigator has fostered discovery for centuries, yet it is now recognized that the complexity of problems in the biomedical sciences and engineering requires collaborative efforts from individuals having diverse training and expertise. Various approaches can facilitate interdisciplinary interactions, but we submit that there is a critical need for a new educational paradigm for the way that we train biomedical engineers, life scientists, and mathematicians. We cannot continue to train graduate students in isolation within single disciplines, nor can we ask any one individual to learn all the essentials of biology, engineering, and mathematics. We must transform how students are trained and incorporate how real-world research and development are done–in diverse, interdisciplinary teams. Our fundamental vision is to create an innovative paradigm for graduate research and training that yields a new generation of biomedical engineers, life scientists, and mathematicians that is more diverse and that embraces and actively pursues a truly interdisciplinary, team-based approach to research based on a known benefit and mutual respect. In this paper, we describe our attempt to accomplish this via focused training in biomechanics, biomedical optics, mathematics, mechanobiology, and physiology. The overall approach is applicable, however, to most areas of biomedical research.

scholarly journals TECHNOLOGICAL TOOLS: FROM TECHNICAL AFFORDANCES TO EDUCATIONAL AFFORDANCES

2018 ◽  
Vol 76 (2) ◽  
pp. 116-120 ◽  
Author(s):  
Nicos Valanides
Keyword(s):  
Programming Languages ◽  
Visual Programming ◽  
Modern Technology ◽  
Robotics Education ◽  
Science Technology ◽  
Educational Environments ◽  
Programming Tools ◽  
Technological Tools ◽  
And Mathematics ◽  
New Generation

Modern technology is transforming in an accelerating rate our physical, economic, cultural and educational environments. The new generation of learners, both adults and students of all ages, is surrounded by a multitude of technological tools, and these tools (computers, robots, software, internet etc.) are used ubiquitously not only in learning environments, but in daily life as well. Today’s children are furthermore characterized as “digital natives” and are clearly distinguished from their teachers and adults who constitute the generation of “digital immigrants” (Prensky, 2001). Visual programming languages, specifically designed for young learners, provide additional programming tools that are integrated in robotics education as well, while additional advances provide support to the idea of following the STEM (Science, Technology and Engineering and Mathematics) approach.

Projects: UTeach: Secondary Science and Mathematics Teacher Preparation Program

2001 ◽  
Vol 94 (9) ◽  
pp. 797
Author(s):  
Gina Foletta
Keyword(s):  
Science Teachers ◽  
The United States ◽  
College Of Education ◽  
Teacher Preparation Program ◽  
Independent School District ◽  
Austin Independent School District ◽  
And Mathematics ◽  
New Generation ◽  
Mathematics And Science Teachers ◽  
Mathematics And Science

The UTeach program, funded by the National Science Foundation, constitutes a joint effort of the College of Natural Sciences, the College of Education, and the Austin Independent School District to recruit, prepare, and support a new generation of mathematics and science teachers for Texas and for the United States.

Finding the Right Problems: Some HREM Applications to Interfaces

1984 ◽  
Vol 42 ◽  
pp. 376-379
Author(s):  
D. Cherns
Keyword(s):  
Grain Boundaries ◽  
High Resolution Electron Microscopy ◽  
Boundary Structure ◽  
Atomic Structures ◽  
Grain Boundary Structure ◽  
Resolution Electron ◽  
Point To Point ◽  
The Right ◽  
New Generation ◽  
Better Than

The use of high resolution electron microscopy (HREM) to determine the atomic structure of grain boundaries and interfaces is a topic of great current interest. Grain boundary structure has been considered for many years as central to an understanding of the mechanical and transport properties of materials. Some more recent attention has focussed on the atomic structures of metalsemiconductor interfaces which are believed to control electrical properties of contacts. The atomic structures of interfaces in semiconductor or metal multilayers is an area of growing interest for understanding the unusual electrical or mechanical properties which these new materials possess. However, although the point-to-point resolutions of currently available HREMs, ∼2-3Å, appear sufficient to solve many of these problems, few atomic models of grain boundaries and interfaces have been derived. Moreover, with a new generation of 300-400kV instruments promising resolutions in the 1.6-2.0 Å range, and resolutions better than 1.5Å expected from specialist instruments, it is an appropriate time to consider the usefulness of HREM for interface studies.

Total etch dentin bonding systems: scanning electron microscopy of the resin-dentin hybrid layer

1992 ◽  
Vol 50 (2) ◽  
pp. 1092-1093
Author(s):  
Jorge Perdigao
Keyword(s):  
Composite Resin ◽  
Mechanical Interlocking ◽  
Hybrid Layer ◽  
Agent Based ◽  
Dentin Bonding ◽  
Acid Agent ◽  
Bond Strengths ◽  
Main Component ◽  
Bonding Systems ◽  
New Generation

In 1955, Buonocore introduced the etching of enamel with phosphoric acid. Bonding to enamel was created by mechanical interlocking of resin tags with enamel prisms. Enamel is an inert tissue whose main component is hydroxyapatite (98% by weight). Conversely, dentin is a wet living tissue crossed by tubules containing cellular extensions of the dental pulp. Dentin consists of 18% of organic material, primarily collagen. Several generations of dentin bonding systems (DBS) have been studied in the last 20 years. The dentin bond strengths associated with these DBS have been constantly lower than the enamel bond strengths. Recently, a new generation of DBS has been described. They are applied in three steps: an acid agent on enamel and dentin (total etch technique), two mixed primers and a bonding agent based on a methacrylate resin. They are supposed to bond composite resin to wet dentin through dentin organic component, forming a peculiar blended structure that is part tooth and part resin: the hybrid layer.

Low-voltage, high-resolution scanning electron microscopy of polymers

1987 ◽  
Vol 45 ◽  
pp. 466-467 ◽  
Author(s):  
S. J. Krause ◽  
W.W. Adams ◽  
S. Kumar ◽  
T. Reilly ◽  
T. Suziki
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Low Voltage ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Resolution Limit ◽  
Crossover Point ◽  
New Generation ◽  
Beam Damage ◽  
Scanning Electron

Scanning electron microscopy (SEM) of polymers at routine operating voltages of 15 to 25 keV can lead to beam damage and sample image distortion due to charging. Imaging polymer samples with low accelerating voltages (0.1 to 2.0 keV), at or near the “crossover point”, can reduce beam damage, eliminate charging, and improve contrast of surface detail. However, at low voltage, beam brightness is reduced and image resolution is degraded due to chromatic aberration. A new generation of instruments has improved brightness at low voltages, but a typical SEM with a tungsten hairpin filament will have a resolution limit of about 100nm at 1keV. Recently, a new field emission gun (FEG) SEM, the Hitachi S900, was introduced with a reported resolution of 0.8nm at 30keV and 5nm at 1keV. In this research we are reporting the results of imaging coated and uncoated polymer samples at accelerating voltages between 1keV and 30keV in a tungsten hairpin SEM and in the Hitachi S900 FEG SEM.

3-Dimensional immunolabeling and in situ hybridization detection using fluorescence photooxidation and intermediate-voltage Electron Microscopy

1994 ◽  
Vol 52 ◽  
pp. 164-165
Author(s):  
Thomas J. Deerinck ◽  
Maryann E. Martone ◽  
Varda Lev-Ram ◽  
David P. L. Green ◽  
Roger Y. Tsien ◽  
...  
Keyword(s):  
Laser Scanning ◽  
Reactive Oxygen ◽  
Confocal Laser Scanning Microscope ◽  
Fluorescent Dye ◽  
Confocal Laser ◽  
3 Dimensional ◽  
Voltage Electron ◽  
Dimensional Distribution ◽  
Electron Microscopes ◽  
New Generation

The confocal laser scanning microscope has become a powerful tool in the study of the 3-dimensional distribution of proteins and specific nucleic acid sequences in cells and tissues. This is also proving to be true for a new generation of high contrast intermediate voltage electron microscopes (IVEM). Until recently, the number of labeling techniques that could be employed to allow examination of the same sample with both confocal and IVEM was rather limited. One method that can be used to take full advantage of these two technologies is fluorescence photooxidation. Specimens are labeled by a fluorescent dye and viewed with confocal microscopy followed by fluorescence photooxidation of diaminobenzidine (DAB). In this technique, a fluorescent dye is used to photooxidize DAB into an osmiophilic reaction product that can be subsequently visualized with the electron microscope. The precise reaction mechanism by which the photooxidation occurs is not known but evidence suggests that the radiationless transfer of energy from the excited-state dye molecule undergoing the phenomenon of intersystem crossing leads to the formation of reactive oxygen species such as singlet oxygen. It is this reactive oxygen that is likely crucial in the photooxidation of DAB.

Recent developments in low-voltage SEM of polymers

1993 ◽  
Vol 51 ◽  
pp. 866-867
Author(s):  
S.J. Krause ◽  
W.W. Adams
Keyword(s):  
Low Voltage ◽  
Chromatic Aberration ◽  
Thermal Electron ◽  
Analytical Technique ◽  
Recent Developments ◽  
Beam Currents ◽  
New Generation ◽  
First Time ◽  
Voltage Scanning ◽  
Beam Damage

Over the past decade low voltage scanning electron microscopy (LVSEM) of polymers has evolved from an interesting curiosity to a powerful analytical technique. This development has been driven by improved instrumentation and in particular, reliable field emission gun (FEG) SEMs. The usefulness of LVSEM has also grown because of an improved theoretical and experimental understanding of sample-beam interactions and by advances in sample preparation and operating techniques. This paper will review progress in polymer LVSEM and present recent results and developments in the field.In the early 1980s a new generation of SEMs produced beam currents that were sufficient to allow imaging at low voltages from 5keV to 0.5 keV. Thus, for the first time, it became possible to routinely image uncoated polymers at voltages below their negative charging threshold, the "second crossover", E2 (Fig. 1). LVSEM also improved contrast and reduced beam damage in sputter metal coated polymers. Unfortunately, resolution was limited to a few tenths of a micron due to the low brightness and chromatic aberration of thermal electron emission sources.

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