High-density Off-limb Flare Loops Observed by SDO

We report on EUV observations of a solar limb flare obtained by the SUMER spectrometer. A time series was taken with fixed slit position and several spectral windows that covered a wide temperature range (104-107 K), preceded and followed by contextual raster scans in a He I line. During the time series, a C4.6 flare occurred in the region, also imaged in the EUV by SOHO/EIT and in soft X rays by YOHKOH/SXT. The temporal evolution seen in the SUMER spectra reveals a close spatial relationship and a correlated dynamical behaviour of the hot (T ≈ 107 K) and cool (T ≈ 104 K) material, which are difficult to reconcile with the notion (based on the Kopp-Pneuman flare model) that cool loops form at a lower height than the hot flare loops.

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Fe XXIV Emission in Solar Flares Observed with the NRL/ATM XUV Slitless Spectrograph

Symposium - International Astronomical Union ◽

10.1017/s0074180900071643 ◽

1975 ◽

Vol 68 ◽

pp. 153-163 ◽

Cited By ~ 5

Author(s):

Kenneth G. Widing

Keyword(s):

Electron Density ◽

Solar Flares ◽

Neutral Line ◽

Opposite Polarity ◽

High Temperature Region ◽

X Ray ◽

Surface Magnetic Field ◽

Flare Loops ◽

Limb Flare ◽

Low Altitude

During the Skylab Mission, the NRL slitless spectrograph photographed a number of flares in the 170–600 Å region with a spatial resolution approaching 2″. At flare maximum the 2s2S1/2— — 2p2P1/2, 3/2transitions of Fe XXIV are present, and show the location of the (approx.) 20 × 106deg plasma with respect to the surface magnetic field and chromospheric (He iiemissions. Three examples are discussed (two only briefly).In the small, intense disk flare of 1973, August 9 the high temperature region appears at the foot of a low altitude arch. The estimated electron density is 5 × 1011cm–3.In the limb flare of 1974, January 15 the hot X-ray emitting component is at a very low altitude compared to the flare loops.In the impulsive double ribbon flare of 1973, June 15 the Fe XXIV emission is centered over the neutral line, forming a bridge-like structure between magnetic regions of opposite polarity. The estimated electron density is 5 × 1010cm–3.The Fe XXIV emission was visible 8 to 10 min as compared with a calculated cooling time by conduction of only 5 min. The lengthened life of the emission may be associated with the observed ‘turbulence’, which inhibits the heat conduction, or alternatively, with a slower energy release prolonged beyond the end of the burst phase.

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X-ray observations of limb flare loops and post-flare coronal arch

Solar Physics ◽

10.1007/bf00159162 ◽

1992 ◽

Vol 139 (2) ◽

pp. 405-408 ◽

Cited By ~ 1

Author(s):

Zdenék Švestka ◽

Kermit L. Smith ◽

Keith T. Strong

Keyword(s):

X Ray ◽

Flare Loops ◽

Limb Flare

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Space and Time Distribution of Hard X-Ray Emission in a Loop at the Beginning of a Flare

International Astronomical Union Colloquium ◽

10.1017/s0252921100025446 ◽

1994 ◽

Vol 144 ◽

pp. 275-277

Author(s):

M. Karlický ◽

J. C. Hénoux

Keyword(s):

Time Distribution ◽

Electron Bombardment ◽

Spatial Evolution ◽

Superthermal Electrons ◽

Flare Loop ◽

X Ray ◽

Superthermal Electron ◽

Flare Loops ◽

Chromospheric Evaporation ◽

Temporal And Spatial

AbstractUsing a new ID hybrid model of the electron bombardment in flare loops, we study not only the evolution of densities, plasma velocities and temperatures in the loop, but also the temporal and spatial evolution of hard X-ray emission. In the present paper a continuous bombardment by electrons isotropically accelerated at the top of flare loop with a power-law injection distribution function is considered. The computations include the effects of the return-current that reduces significantly the depth of the chromospheric layer which is evaporated. The present modelling is made with superthermal electron parameters corresponding to the classical resistivity regime for an input energy flux of superthermal electrons of 109erg cm−2s−1. It was found that due to the electron bombardment the two chromospheric evaporation waves are generated at both feet of the loop and they propagate up to the top, where they collide and cause temporary density and hard X-ray enhancements.

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Prominences and Solar Activity

International Astronomical Union Colloquium ◽

10.1017/s0252921100065817 ◽

1979 ◽

Vol 44 ◽

pp. 357-372

Author(s):

Z. Švestka

Keyword(s):

Solar Activity ◽

Solar Cycle ◽

List Type ◽

Type Number ◽

Flare Loops ◽

Filament Activation

The following subjects were discussed:(1)Filament activation(2)Post-flare loops.(3)Surges and sprays.(4)Coronal transients.(5)Disk vs. limb observations.(6)Solar cycle variations of prominence occurrence.(7)Active prominences patrol service.Of all these items, (1) and (2) were discussed in most detail and we also pay most attention to them in this report. Items (3) and (4) did not bring anything new when compared with the earlier invited presentations given by RUST and ZIRIN and therefore, we omit them.

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Planar defects in ordered (Ga,In)P

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100106570 ◽

1988 ◽

Vol 46 ◽

pp. 902-903

Author(s):

S. McKernan ◽

C. B. Carter ◽

D. Bour ◽

J. R. Shealy

Keyword(s):

Electron Diffraction ◽

Vapor Phase ◽

Growth Direction ◽

High Density ◽

Ordered Structure ◽

Planar Defects ◽

Diffraction Patterns ◽

Ternary Semiconductors ◽

Anion Species ◽

Metallic Vapor

The growth of ternary III-V semiconductors by organo-metallic vapor phase epitaxy (OMVPE) is widely practiced. It has been generally assumed that the resulting structure is the same as that of the corresponding binary semiconductors, but with the two different cation or anion species randomly distributed on their appropriate sublattice sites. Recently several different ternary semiconductors including AlxGa1-xAs, Gaxln-1-xAs and Gaxln1-xP1-6 have been observed in ordered states. A common feature of these ordered compounds is that they contain a relatively high density of defects. This is evident in electron diffraction patterns from these materials where streaks, which are typically parallel to the growth direction, are associated with the extra reflections arising from the ordering. However, where the (Ga,ln)P epilayer is reasonably well ordered the streaking is extremely faint, and the intensity of the ordered spot at 1/2(111) is much greater than that at 1/2(111). In these cases it is possible to image relatively clearly many of the defects found in the ordered structure.

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Quantitative defect studies in semiconductor TEM samples prepared by low angle ion milling

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100138932 ◽

1995 ◽

Vol 53 ◽

pp. 512-513

Author(s):

L. Mulestagno ◽

J.C. Holzer ◽

P. Fraundorf

Keyword(s):

Sample Preparation ◽

Milling Time ◽

High Density ◽

Low Density ◽

Ion Milling ◽

High Quality ◽

Variable Angle ◽

Major Disadvantage ◽

Induced Defects

Due to the wealth of information, both analytical and structural that can be obtained from it TEM always has been a favorite tool for the analysis of process-induced defects in semiconductor wafers. The only major disadvantage has always been, that the volume under study in the TEM is relatively small, making it difficult to locate low density defects, and sample preparation is a somewhat lengthy procedure. This problem has been somewhat alleviated by the availability of efficient low angle milling.Using a PIPS® variable angle ion -mill, manufactured by Gatan, we have been consistently obtaining planar specimens with a high quality thin area in excess of 5 × 104 μm2 in about half an hour (milling time), which has made it possible to locate defects at lower densities, or, for defects of relatively high density, obtain information which is statistically more significant (table 1).

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Using the scanning electron microscope for failure analysis of high density magnetic media

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100126755 ◽

1987 ◽

Vol 45 ◽

pp. 392-393

Author(s):

Evelyn R. Ackerman ◽

Gary D. Burnett

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Failure Analysis ◽

High Density ◽

Magnetic Media ◽

Specific Data ◽

Retrieval Systems ◽

Operating Environments ◽

The Media ◽

Scanning Electron

Advancements in state of the art high density Head/Disk retrieval systems has increased the demand for sophisticated failure analysis methods. From 1968 to 1974 the emphasis was on the number of tracks per inch. (TPI) ranging from 100 to 400 as summarized in Table 1. This emphasis shifted with the increase in densities to include the number of bits per inch (BPI). A bit is formed by magnetizing the Fe203 particles of the media in one direction and allowing magnetic heads to recognize specific data patterns. From 1977 to 1986 the tracks per inch increased from 470 to 1400 corresponding to an increase from 6300 to 10,800 bits per inch respectively. Due to the reduction in the bit and track sizes, build and operating environments of systems have become critical factors in media reliability.Using the Ferrofluid pattern developing technique, the scanning electron microscope can be a valuable diagnostic tool in the examination of failure sites on disks.

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