The Uncertainties of the Calculated Optical Basicity from the Optical Band Gap and the Refractive Index for Some Oxide Glass Systems

2005 ◽  
Vol 5 (10) ◽  
pp. 1867-1870 ◽  
Author(s):  
El-Sayed Mostafa
Polymers ◽  
2021 ◽  
Vol 13 (8) ◽  
pp. 1316
Author(s):  
Shujahadeen B. Aziz ◽  
Muaffaq M. Nofal ◽  
Hewa O. Ghareeb ◽  
Elham M. A. Dannoun ◽  
Sarkawt A. Hussen ◽  
...  

The influence of dispersing Al-metal complex on the optical properties of PVA was investigated using UV–visible spectroscopy. Polymer composite films with various Al3+-complex amounts in the PVA matrix were arranged by solution casting technique by means of distilled water as a widespread solvent. The formation of Al3+-metal complex was verified through Ultraviolet–visible (UV-Vis) and Fourier-transform infrared spectroscopy (FTIR) examinations. The addition of Al-complex into the polymer matrix led to the recovery of the optical parameters such as dielectric constant (εr and εi) and refractive index (n). The variations of real and imaginary parts of complex dielectric constant as a function of photon wavelength were studied to calculate localized charge density values (N/m*), high-frequency dielectric constant, relaxation time, optical mobility, optical resistivity, and plasma angular frequency (ωp) of electrons. In proportion with Al3+-complex content, the N/m* values were amplified from 3.68 × 1055 kg−1 m−3 to 109 × 1055 kg−1 m−3. The study of optical parameters may find applications within optical instrument manufacturing. The optical band gap was determined from Tauc’s equation, and the type of electronic transition was specified. A remarkable drop in the optical band gap was observed. The dispersion of static refractive index (no) of the prepared composites was analyzed using the theoretical Wemple–DiDomenico single oscillator model. The average oscillator energy (Eo) and oscillator dispersion energy (Ed) parameters were estimated.


2021 ◽  
Vol 317 ◽  
pp. 95-99
Author(s):  
Muhammad Noorazlan Abd Azis ◽  
Halimah Mohamed Kamari ◽  
Suriani Abu Bakar ◽  
Azlina Yahya ◽  
Umar Saad Aliyu

Borotellurite glass had been widely applied in the field of optical communications and devices. In this work, holmium oxides doped borotellurite glass had been successfully fabricated via conventional melt-quenched technique. The structural properties of holmium doped tellurite glass were found using x-ray diffraction (XRD) method. The nonexistence of sharp peaks in XRD pattern shows that the inclusion of holmium tellurite glass leads to the formation long range of disorderness. The optical properties of the glass system such as refractive index and optical band gap energy are investigated using UV-Vis spectrophotometer. The value of refractive index is found in nonlinear trend along with holmium oxides concentration. It is found that the refractive index is more than 2 at 0.01, 0.03 and 0.04 of holmium concentrations. The optical band gap energy was found in similar trend with refractive index which is in nonlinear pattern.


2013 ◽  
Vol 37 (1) ◽  
pp. 83-91 ◽  
Author(s):  
Chitra Das ◽  
Jahanara Begum ◽  
Tahmina Begum ◽  
Shamima Choudhury

Effect of thickness on the optical and electrical properties of gallium arsenide (GaAs) thin films were studied. The films of different thicknesses were prepared by vacuum evaporation method (~10-4 Pa) on glass substrates at a substrate temperature of 323 K. The film thickness was measured in situ by a frequency shift of quartz crystal. The thicknesses were 250, 300 and 500 nm. Absorption spectrum of this thin film had been recorded using UV-VIS-NIR spectrophotometer in the photon wavelength range of 300 - 2500 nm. The values of some important optical parameters of the studied films (absorption coefficient, optical band gap energy and refractive index; extinction co-efficient and real and imaginary parts of dielectric constant) were determined using these spectra. Transmittance peak was observed in the visible region of the solar spectrum. Here transmittance showed better result when thicknesses were being increased. The optical band gap energy was decreased by the increase of thickness. The refractive index increased by increasing thickness while extinction co-efficient and real and imaginary part of dielectric constant decreased. DOI: http://dx.doi.org/10.3329/jbas.v37i1.15684 Journal of Bangladesh Academy of Sciences, Vol. 37, No. 1, 83-91, 2013


2012 ◽  
Vol 710 ◽  
pp. 739-744 ◽  
Author(s):  
Anup Kumar ◽  
Pawan Heera ◽  
P. B Baraman ◽  
Raman Sharma

The optical constants, like absorption coefficient (α), optical band gap (Eg) and refractive index (n), in Se80.5Bi1.5Te18-yAgy (y= 0, 1.0 and1.5) thin films are calculated using well known Swanepoel’s method in the spectral range of 600-2000 nm. The optical band gap has been estimated by using Tauc’s extrapolation method and is found to increase with increase in Ag content. The present results shows that the large value of nonlinear refractive index and good transparency of these thin films will make them a very promising materials for optical integrated circuits in the optical communication systems.


Polymers ◽  
2020 ◽  
Vol 12 (10) ◽  
pp. 2320 ◽  
Author(s):  
Ahang M. Hussein ◽  
Elham M. A. Dannoun ◽  
Shujahadeen B. Aziz ◽  
Mohamad A. Brza ◽  
Rebar T. Abdulwahid ◽  
...  

In the current study, the film fabrication of polystyrene (PS) based polymer nanocomposites (NCs) with tuned refractive index and absorption edge was carried out using the solution cast method. X-ray diffraction (XRD) and ultraviolet-visible (UV-Vis) light characterization techniques were performed. The structural and optical properties of the prepared films were specified. The hump of PS decreased significantly when SnTiO3 nanoparticles (NPs) were introduced. Sharp and high intense peaks of SnTiO3 NPs at a high filler ratio were observed. The crystalline size was determined for SnTiO3 NPs from the sharp crystalline peaks using Debye-Scherrer’s equation and was found to be 25.179 nm, which is close enough to that described by the supplier. Several optical parameters, such as absorption coefficient (α), refractive index (n), and optical dielectric properties, were investigated. The absorption spectra were tuned with increasing SnTiO3NPs. Upon the addition of the NPs to the PS host polymer, the absorption edge undergoes shifting to lesser photon energy sides. The optical dielectric constant (ε′) was correlated to the refractive index. The study of the optical band gap was conducted in detail using both Tauc’s model and the optical dielectric loss (ε″) parameter. The results showed that the ε″ parameter is noteworthy to be measured in the optical band gap study of materials.


2012 ◽  
Vol 616-618 ◽  
pp. 1773-1777
Author(s):  
Xi Lian Sun ◽  
Hong Tao Cao

In depositing nitrogen doped tungsten oxide thin films by using reactive dc pulsed magnetron sputtering process, nitrous oxide gas (N2O) was employed instead of nitrogen (N2) as the nitrogen dopant source. The nitrogen doping effect on the structural and optical properties of WO3 thin films was investigated by X-ray diffraction, transmission electron microscopy and UV-Vis spectroscopy. The thickness, refractive index and optical band gap energy of these films have been determined by analyzing the SE spectra using parameterized dispersion model. Morphological images reveal that the films are characterized by a hybrid structure comprising nanoparticles embeded in amorphous matrix and open channels between the agglomerated nanoparticles. Increasing nitrogen doping concentration is found to decrease the optical band gap energy and the refractive index. The reduced band gaps are associated with the N 2p orbital in the N-doped tungsten oxide films.


2015 ◽  
Vol 68 ◽  
pp. 27-34 ◽  
Author(s):  
Saisudha B. Mallur ◽  
Tyler Czarnecki ◽  
Ashish Adhikari ◽  
Panakkattu K. Babu

2018 ◽  
Vol 14 (2) ◽  
pp. 5624-5637
Author(s):  
A.A. Attia ◽  
M.M. Saadeldin ◽  
K. Sawaby

Para-quaterphenyl thin films were deposited onto glass and quartz substrates by thermal evaporation method. p-quaterphenyl thin films wereexposed to gamma radiation of Cobat-60 radioactive source at room temperature with a dose of 50 kGy to study the effect of ?-irradiation onthe structure and the surface morphology as well as the optical properties of the prepared films. The crystalline structure and the surface morphology of the as-deposited and ?-irradiated films were examined using the X-ray diffraction and the field emission scanning electron microscope. The optical constants (n & k) of the as-deposited and ?-irradiated films were obtained using the transmittance and reflectance measurements, in the wavelength range starting from 250 up to 2500 nm. The analysis of the absorption coefficient data revealed an allowed direct transition with optical band gap of 2.2 eV for the as-deposited films, which decreased to 2.06 eV after exposing film to gamma irradiation. It was observed that the Urbach energy values change inversely with the values of the optical band gap. The dispersion of the refractive index was interpreted using the single oscillator model. The nonlinear absorption coefficient spectra for the as-deposited and ?-irradiated p-quaterphenyl thin films were obtained using the linear refractive index.


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