Using Parameter Deviation Function for Estimating the Calibration Life of Micrometers
The paper presents the results of an experimental study performed on specific measuring devices micrometers, study aimed at determining the calibration life of these measuring devices as a function of the metrological reliability, due to the internal parameter deviation. The experimental study conducted is aimed at determining the calibration life of external micrometers for 0 - 25 mm. The experimental data is obtained in the laboratory conditions and it is represented by the measuring errors, obtained for the same nominal size, experimental data being grouped in samples produced at a certain interval of time, by measuring the same dimension with a set of micrometers.The research performed on the considered set of micrometers can lead to the conclusion that the appropriate moment for performing the calibration for a specific set of measuring devices can be estimated by determining the calibration life based on parameter deviation functions, these being obtained by means of regression analysis. The algorithm for estimation of the calibration life of the measuring devices as a function of the metrological reliability can be used for determining the calibration life of the analysed measuring devices, such as to compare the estimated calibration life with the requirements set in the appropriate standards. In the case of the set of micrometers analysed, the pre-set calibration life proved to be earlier than necessary and the estimation of the calibration life by means of parameter deviation would reduce the total costs of the appropriate operation.