Interdiffusion in Co/Ta Multilayer Thin Films

2005 ◽  
Vol 237-240 ◽  
pp. 554-559 ◽  
Author(s):  
Hui Myeong Lee ◽  
Byeong Seon Lee ◽  
Chan Gyu Lee ◽  
Yasunori Hayashi ◽  
Bon Heun Koo
Keyword(s):  
Structural Relaxation ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
Stress Release ◽  
X Ray ◽  
Angle Measurements ◽  
Peak Intensity ◽  
Straight Line ◽  
Initial Stage ◽  
Interdiffusion Coefficients

We will discuss the stress release phenomena, structural relaxation and interdiffusion processes during annealing. The [Co(4nm)/Ta(4nm)]38 multilayers were prepared by dc magnetron sputtering on Si substrate. The multilayers were annealed at various temperatures (523 - 673K) in vacuum (under 10-5 torr) furnace. The effective interdiffusion coefficients were determined from the slope of the best straight line fit of the first peak intensity versus annealing time [d ln(I(t)/I(0)) /dt] by X-ray diffraction (XRD) low angle measurements. The drastic decrease of the relative intensity in the initial stage shown due to the structural relaxation was excluded in the calculation of effective interdiffusion coefficients. The temperature dependence of interdiffusion in the range of 523 - 673K is described by D = 3.2×10-19 exp(-0.51±0.11 eV/kT) m2s-1.

Interdiffusion in Fe/Pt Multilayer Thin Films

2006 ◽  
Vol 258-260 ◽  
pp. 199-206 ◽  
Author(s):  
Se Young O ◽  
Dan Phuong Nguyen ◽  
Chan Gyu Lee ◽  
Bon Heun Koo ◽  
Byeong Seon Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Annealing Time ◽  
Composition Gradient ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
Multilayer Systems ◽  
X Ray ◽  
Peak Intensity ◽  
Straight Line ◽  
Interdiffusion Coefficients

Interdiffusion in Fe/Pt multilayer thin films has been studied. [Fe(1nm)/Pt(1.5nm)]20 multilayers were prepared by DC magnetron sputtering technique and subsequently annealed at temperatures of 543 - 633K in vacuum lower than 10-6 torr. X-ray diffraction (XRD) studies on these multilayer systems revealed the interdiffusion coefficients from slope of the best straight line fit of first peak intensity versus annealing time. The temperature dependence of interdiffusion in the range of 543 - 633K can be described by D=4.98×10-24 exp (0.88eV/kT) m2S-1. The coercivity, measured by Vibrating Sample Magnetometer, of the multilayer with annealing time at 603K increased, which is believed to the increase of surface roughness by interdiffusion at the interfaces of Fe and Pt multilayers, enhancement of composition gradient; and/or formation of Fe-Pt reaction phase at the interface of Fe and Pt.

Anomalies in Measurement of Residual Stress by X-Ray Diffraction

1974 ◽  
Vol 18 ◽  
pp. 466-501 ◽  
Author(s):  
R. H. Marion ◽  
J. B. Cohen
Keyword(s):  
Residual Stress ◽  
Linear Dependence ◽  
Interplanar Spacing ◽  
Stress Determination ◽  
X Ray Diffraction ◽  
X Ray ◽  
Multiphase Materials ◽  
Peak Intensity ◽  
Straight Line ◽  
Extensive Plastic Deformation

AbstractResidual stresses are expected to lead to a linear dependence of the interplanar spacing, d, on sin2ψ (where ψ is the sample tilt) and the stress can be obtained from the slope of this line, As a result of the linear dependence a two-tilt method is often employed to obtain the stress. However, when a specimen is subjected to extensive plastic deformation large deviations from a straight line can occur and a two-point method can lead to an erroneous stress determination. The results reported here show that: (1) this is more likely to occur in homogeneous materials than in multiphase materials (2) the oscillations follow closely the variation in peak intensity due to texture (3) the oscillations are caused by microstresses which are due to an "orientation" effect as suggested by Weidemann,A simple, easy-to-use procedure has been developed and tested to correct the data and obtain the correct macrostress.

TEM studies of solid-state reactions in sputter-deposited Nb/Al multilayer thin films

1996 ◽  
Vol 54 ◽  
pp. 1020-1021
Author(s):  
F. Ma ◽  
S. Vivekanand ◽  
K. Barmak ◽  
C. Michaelsen
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Stoichiometric Composition ◽  
Analytical Electron Microscopy ◽  
Grain Structure ◽  
Solid State Reactions ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited

Solid state reactions in sputter-deposited Nb/Al multilayer thin films have been studied by transmission and analytical electron microscopy (TEM/AEM), differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The Nb/Al multilayer thin films for TEM studies were sputter-deposited on (1102)sapphire substrates. The periodicity of the films is in the range 10-500 nm. The overall composition of the films are 1/3, 2/1, and 3/1 Nb/Al, corresponding to the stoichiometric composition of the three intermetallic phases in this system.Figure 1 is a TEM micrograph of an as-deposited film with periodicity A = dA1 + dNb = 72 nm, where d's are layer thicknesses. The polycrystalline nature of the Al and Nb layers with their columnar grain structure is evident in the figure. Both Nb and Al layers exhibit crystallographic texture, with the electron diffraction pattern for this film showing stronger diffraction spots in the direction normal to the multilayer. The X-ray diffraction patterns of all films are dominated by the Al(l 11) and Nb(l 10) peaks and show a merging of these two peaks with decreasing periodicity.

Study of Structural Relaxation in Amorphous Ni-Pd-P Alloys by Means of X-Ray Diffraction*

1988 ◽  
Vol 157 (Part_1) ◽  
pp. 91-95 ◽  
Author(s):  
Eugen Bühler ◽  
Peter Lamparter ◽  
Siegfried Steeb
Keyword(s):  
Structural Relaxation ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Heterogeneity of the Dendrite Array Created in the Root of Cored SX Turbine Blades during Initial Stage of Crystallization

Materials ◽  
2020 ◽  
Vol 14 (1) ◽  
pp. 80
Author(s):  
Robert Paszkowski ◽  
Jacek Krawczyk ◽  
Włodzimierz Bogdanowicz ◽  
Dariusz Szeliga ◽  
Jan Sieniawski
Keyword(s):  
Transverse Section ◽  
Turbine Blades ◽  
Lateral Growth ◽  
X Ray Diffraction ◽  
Dendrite Branching ◽  
X Ray ◽  
Initial Stage ◽  
Vertical Bridgman ◽  
Lateral Dendrite ◽  
Root Connection

The roots of cored single-crystalline turbine blades made of a nickel-based CMSX-4 superalloy were studied. The casts were solidified by the vertical Bridgman method in an industrial ALD furnace using the spiral selector and selector continuer situated asymmetrically in the blade root transverse section. Scanning electron microscopy, the Laue diffraction and X-ray diffraction topography were used to visualize the dendrite array and the local crystal misorientation of the roots. It has been stated that heterogeneity of the dendrite array and creation of low-angle boundaries (LABs) are mostly related to the lateral dendrite branching and rapid growth of the secondary and tertiary dendrites near the surface of the continuer–root connection. These processes have an unsteady character. Additionally, the influence of the mould walls on the dendrite array heterogeneity was studied. The processes of the lateral growth of the secondary dendrites and competitive longitudinal growth of the tertiary dendrites are discussed and a method of reducing the heterogeneity of the root dendrite array is proposed.

A high-energy triple-axis X-ray diffractometer for the study of the structure of bulk crystals

2004 ◽  
Vol 37 (6) ◽  
pp. 901-910 ◽  
Author(s):  
C. Seitz ◽  
M. Weisser ◽  
M. Gomm ◽  
R. Hock ◽  
A. Magerl
Keyword(s):  
High Energy ◽  
X Rays ◽  
Bulk Crystals ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Intensity ◽  
High Penetration ◽  
Massive Sample ◽  
Laue Geometry ◽  
The Ideal

A triple-axis diffractometer for high-energy X-ray diffraction is described. A 450 kV/4.5 kW stationary tungsten X-ray tube serves as the X-ray source. Normally, 220 reflections of thermally annealed Czochralski Si are employed for the monochromator and analyser. Their integrated reflectivity is about ten times higher than the ideal crystal value. With the same material as the sample, and working with the WKα line at 60 keV in symmetric Laue geometry for all axes, the full width at half-maximum (FWHM) values for the longitudinal and transversal resolution are 2.5 × 10−3and 1.1 × 10−4for ΔQ/Q, respectively, and the peak intensity for a non-dispersive setting is 3000 counts s−1. In particular, for a double-axis mode, an energy well above 100 keV from theBremsstrahlungspectrum can be used readily. High-energy X-rays are distinguished by a high penetration power and materials of several centimetre thickness can be analysed. The feasibility of performing experiments with massive sample environments is demonstrated.

Synthesis of Photodefinable RuO2 Precursors For Electrode Contacts

1997 ◽  
Vol 493 ◽  
Author(s):  
K. J. Law ◽  
Y. H. Spooner
Keyword(s):  
Chemical Process ◽  
Ruthenium Complexes ◽  
Ferroelectric Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ruthenium Compounds ◽  
Straight Line ◽  
Wet Chemical ◽  
Pattern Forming ◽  
Pattern Resolution

ABSTRACTA wet-chemical process for depositing and patterning RuO2 contacts for use in ferroelectric thin film capacitive devices is described. Three new ruthenium compounds containing photocrosslinkable organic groups have been synthesized which polymerize upon UV exposure. Preliminary pattern forming ability of the new precursors has been tested with the use of a simple straight line contact mask. The exposed portions of the precursor films are resistant to ethanol, acetone, and light abrasion. The formation of crystalline RuO2 upon organic pyrolysis was confirmed by x-ray diffraction. Synthesized ruthenium complexes were compared to commercially available ruthenium acetylacetonate. The synthesized organo-ruthenium complexes showed improvement in pattern resolution and clarity.

Superconductivity and Magnetic Ordering of Pr in CaLa1-xPrxBaCu3O7 System

1997 ◽  
Vol 11 (07) ◽  
pp. 323-331 ◽  
Author(s):  
V. P. S. Awana ◽  
Rajvir Singh ◽  
D. A. Landinez Tellez ◽  
J. M. Ferreira ◽  
J. Albino Aguiar ◽  
...  
Keyword(s):  
Magnetic Susceptibility ◽  
Normal State ◽  
Ac Susceptibility ◽  
Magnetic Ordering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Antiferromagnetic Ordering ◽  
Peak Intensity ◽  
Heat Capacity Measurements ◽  
A Minor

We present the results of superconductivity, normal state magnetic susceptibility and heat capacity measurements on the tetragonal CaLa 1-x Pr x BaCu 3 O 7 compound. Ac susceptibility measurements show that the transition temperature T c of the unsubstituted sample decreases with an increase in the Pr concentration. Normal state dc magnetic susceptibility measurements performed in an applied field of 0.5 T show a Curie–Weiss behaviour in terms of the paramagnetic moment of Pr. The effective paramagnetic moment of Pr appears to be intermediate between those of the free Pr 3+ and Pr 4+ ions. For the nonsuperconducting samples i.e., x = 0.70 and 1.0, we observe an antiferromagnetic ordering temperature T N of nearly 4 K and 8 K respectively. The X-ray diffraction results show that the CaPrBaCu 3 O 7 compound is free from other phases, having a minor (less than 8%, in terms of peak intensity) impurity phase. The lower T N (8 K) of PrBaCaCu 3 O 7 as compared to the known antiferromagnetic ordering temperature of 17 K for PrBa 2 Cu 3 O 7 indicates a less deleterious effect of Pr in the present case.

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