Development of Silicon Carbide Coating on Al2O3 Ceramics from Precursor Polymers by Radiation Curing

2006 ◽  
Vol 317-318 ◽  
pp. 573-576 ◽  
Author(s):  
Radoslaw A. Wach ◽  
Masaki Sugimoto ◽  
Masahito Yoshikawa

Production of reinforced surface ceramic material was investigated by radiation curing-oxidation method. The originality of this research is to use along with polycarbosilane (PCS) an admixture of another preceramic polymer, polyvinylsilane (PVS). PCS, PVS or their combination in cyclohexane solution were spin-coated onto Al2O3 plates or deposited onto porous substrate by dipping method. After radiation oxidation step, used to preserve the coat on the substrate, a heat treatment was applied for crosslinking of the polymer. Thickness and quality of silicon carbide (SiC) film were investigated after pyrolysis.

1999 ◽  
Vol 82 (4) ◽  
pp. 1045-1051 ◽  
Author(s):  
Masaki Narisawa ◽  
Akira Idesaki ◽  
Shuhei Kitano ◽  
Kiyohito Okamura ◽  
Masaki Sugimoto ◽  
...  

2018 ◽  
Vol 38 (1) ◽  
pp. 67-74 ◽  
Author(s):  
Bo Tang ◽  
Mingchao Wang ◽  
Ruiming Liu ◽  
Jiachen Liu ◽  
Haiyan Du ◽  
...  

2018 ◽  
Vol 912 ◽  
pp. 141-146 ◽  
Author(s):  
Glauson Aparecido Ferreira Machado ◽  
Rosa Maria Rocha ◽  
Ana Helena Almeida Bressiani

Alumina-mullite composites with low shrinkage can be made by reaction bond using mixtures of alumina, aluminum and silicon carbide. In this work, an alternative route is used to produce alumina composites with low shrinkage. Here alumina samples containing additions of 10 and 20 wt% of a preceramic polymer were warm-pressed and treated in the range of 900 -1500°C to produce alumina based composites. The obtained composites were analyzed by linear shrinkage and compared to pure alumina samples sintered at the same temperature range. It were also evaluated the density variation and crystalline phases formed during heat treatment of alumina composites. Results showed that alumina-silicon oxycarbide and alumina-mullite composites were obtained with lower shrinkage than pure alumina samples.


2015 ◽  
Vol 2015 (HiTEN) ◽  
pp. 000033-000036 ◽  
Author(s):  
M.H. Weng ◽  
A.D. Murphy ◽  
D.T. Clark ◽  
D.A. Smith ◽  
R.F. Thompson ◽  
...  

The potential to thermally grow SiO2 on silicon carbide has resulted in it becoming the technology of choice to realise high temperature CMOS circuits. The challenge to achieve a high quality gate stack relies on engineering the metal-insulator-semiconductor interfaces to enable reliable high temperature functionality. Here we describe the effect of different process conditions for the formation of the dielectric layer on the characteristics of the resulting devices. The operating characteristics at elevated temperatures depend critically on the quality of the gate stack. Therefore a systematic evaluation of the intrinsic properties of the gate stack and data from reliability tests are needed.


2011 ◽  
Vol 276 ◽  
pp. 21-25
Author(s):  
S.O. Gordienko ◽  
A. Nazarov ◽  
A.V. Rusavsky ◽  
A.V. Vasin ◽  
N. Rymarenko ◽  
...  

This paper presents an analysis of the electrical characteristics of the amorphous silicon carbide films deposited on the SiO2/Si substrate. Aspects of RF plasma treatment on electrical and structural characteristics of a-SiC film are discussed. It is demonstrated that the dominant mechanism of current transport in the a-SiC thin film is determined by variable-range hopping conductivity at the Fermi level. Studies of the a-SiC film at temperatures from 300 K to 600 K also indicate that silicon carbide is a perspective material for fabrication of temperature sensor.


Refractories ◽  
1964 ◽  
Vol 5 (3-4) ◽  
pp. 140-144 ◽  
Author(s):  
I. Ya. Prokhorova ◽  
A. N. Novikov
Keyword(s):  

2009 ◽  
Vol 113 (2-3) ◽  
pp. 861-867 ◽  
Author(s):  
Andrew R. Maddocks ◽  
David J. Cassidy ◽  
Allan S. Jones ◽  
Andrew T. Harris

2013 ◽  
Vol 740-742 ◽  
pp. 295-300 ◽  
Author(s):  
Massimo Camarda ◽  
Antonino La Magna ◽  
Francesco La Via

We use three dimensional kinetic Monte Carlo simulations on super-lattices to study the hetero-polytypical growth of cubic silicon carbide polytype (3C-SiC) on misoriented hexagonal (4H and 6H) substrates finding that the growth on misoriented (4°-10° degree off) 6H substrates, with step bunched surfaces, can strongly improve the quality of the cubic epitaxial film promoting 3C single domain growths


Sign in / Sign up

Export Citation Format

Share Document