Modification of Polymer Materials by Electron Beam Treatment

2015 ◽  
Vol 670 ◽  
pp. 118-125 ◽  
Author(s):  
Irina V. Puhova ◽  
Konstantin V. Rubtsov ◽  
Irina Kurzina ◽  
Andrei V. Kazakov ◽  
Aleksandr V. Medovnik
Keyword(s):  
Electron Beam ◽  
Photoelectron Spectroscopy ◽  
Electron Beam Irradiation ◽  
Polymeric Materials ◽  
Pulse Number ◽  
Polymer Materials ◽  
X Ray ◽  
Force Microscopy ◽  
Electron Beam Processing ◽  
Atomic Force

Electron beam processing is one of the effective methods for modification of surface material properties. Influence of electron beam irradiation on the structure of polymeric materials such as polyvinyl alcohol and polylactic acid was investigated. Electron beam processing was carried out at 8 kV accelerating voltage and a pressure of 3 x 10-2 Torr, the emission current was from 25 to 40 A, the pulse duration was from 150 to 300 μs and the pulse number was from 1 to 10. The elemental composition and the structural state of the surface of irradiated polymer materials were studied by infrared spectroscopy (IR-spectroscopy), X-ray photoelectron spectroscopy (XPS), scanning-electron microscopy (SEM) and atomic-force microscopy (AFM) methods. It was established that certain chemical processes take place and some physicochemical properties change under electron treatment.

Processing of Polypropylene by Low-Energy Pulsed Electron Beam from Forevacuum Plasma Source

2016 ◽  
Vol 683 ◽  
pp. 95-99 ◽  
Author(s):  
Victor Burdovitsin ◽  
Andrey Kazakov ◽  
Alexandr Medovnik ◽  
Efim Oks ◽  
Irina Puhova ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Plasma Source ◽  
Beam Current ◽  
Beam Current Density ◽  
Pulsed Electron Beam ◽  
Force Microscopy ◽  
Electron Beam Processing ◽  
Atomic Force ◽  
Energy Flux Density

Influence of electron beam irradiation on the morphology and contact angle of polypropylene was investigated. Electron beam processing was carried out at 8 – 10 kV accelerating voltage and a pressure of 5 – 10 Pa. Beam current density was up to 4.5 A/cm2, and the pulse duration - from 150 to 300 μs. The morphology of irradiated polymer material was studied by scanning-electron and atomic-force microscopy methods. It was established formation of extended equally oriented “hills” divided by “valleys”. The height of hills increases with the growth of energy flux density per pulse.

Investigation of the Effect of Uv-Assisted Oxidation and Nitridation of Hafnium Metal Films

2003 ◽  
Vol 780 ◽  
Author(s):  
C. Essary ◽  
V. Craciun ◽  
J. M. Howard ◽  
R. K. Singh
Keyword(s):  
Uv Radiation ◽  
Photoelectron Spectroscopy ◽  
Grazing Angle ◽  
X Ray Diffraction ◽  
Metal Thin Films ◽  
X Ray ◽  
Force Microscopy ◽  
Si Substrates ◽  
Atomic Force ◽  
Silicon Interface

AbstractHf metal thin films were deposited on Si substrates using a pulsed laser deposition technique in vacuum and in ammonia ambients. The films were then oxidized at 400 °C in 300 Torr of O2. Half the samples were oxidized in the presence of ultraviolet (UV) radiation from a Hg lamp array. X-ray photoelectron spectroscopy, atomic force microscopy, and grazing angle X-ray diffraction were used to compare the crystallinity, roughness, and composition of the films. It has been found that UV radiation causes roughening of the films and also promotes crystallization at lower temperatures.Furthermore, increased silicon oxidation at the interface was noted with the UVirradiated samples and was shown to be in the form of a mixed layer using angle-resolved X-ray photoelectron spectroscopy. Incorporation of nitrogen into the film reduces the oxidation of the silicon interface.

Curcumin delivery by modified biosourced carbon-based nanoparticles

Nanomedicine ◽  
2022 ◽  
Author(s):  
Hossein Danafar ◽  
Marziyeh Salehiabar ◽  
Murat Barsbay ◽  
Hossein Rahimi ◽  
Mohammadreza Ghaffarlou ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Free System ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Good Biocompatibility ◽  
Drug Free ◽  
Mcf 7 ◽  
Carbon Based

Aim: To prepare a novel hybrid system for the controlled release and delivery of curcumin (CUR). Methods: A method for the ultrasound-assisted fabrication of protein-modified nanosized graphene oxide-like carbon-based nanoparticles (CBNPs) was developed. After being modified with bovine serum albumin (BSA), CUR was loaded onto the synthesized hybrid (labeled CBNPs@BSA–CUR). The structure and properties of the synthesized nanoparticles were elucidated using transmission electron microscopy (TEM), atomic force microscopy (AFM), ultraviolet-visible spectroscopy (UV-Vis), Fourier-transform infrared spectroscopy (FTIR) and x-ray photoelectron spectroscopy (XPS) methods. Results: CBNPs@BSA–CUR showed pH sensitivity and were calculated as controlled CUR release behavior. The drug-free system exhibited good biocompatibility and was nontoxic. However, CBNPs@BSA–CUR showed acceptable antiproliferative ability against MCF-7 breast cancer cells. Conclusion: CBNPs@BSA–CUR could be considered a highly promising nontoxic nanocarrier for the delivery of CUR with good biosafety.

Effect of Surface Chemistry on Ruthenium Wet Etching

2021 ◽  
Vol 314 ◽  
pp. 302-306
Author(s):  
Quoc Toan Le ◽  
E. Kesters ◽  
M. Doms ◽  
Efrain Altamirano Sánchez
Keyword(s):  
Surface Roughness ◽  
Photoelectron Spectroscopy ◽  
Etching Rate ◽  
Wet Etching ◽  
X Ray ◽  
Force Microscopy ◽  
Metal Free ◽  
Atomic Force ◽  
Different Types ◽  
Effect Of Surface

Different types of ALD Ru films, including as-deposited, annealed Ru, without and with a subsequent CMP step, were used for wet etching study. With respect to the as-deposited Ru, the etching rate of the annealed Ru film in metal-free chemical mixtures (pH = 7-9) was found to decrease substantially. X-ray photoelectron spectroscopy characterization indicated that this behavior could be explained by the presence of the formation of RuOx (x = 2,3) caused by the anneal. A short CMP step applied to the annealed Ru wafer removed the surface RuOx, at least partially, resulting in a significant increase of the etching rate. The change in surface roughness was quantified using atomic force microscopy.

Surface structure, nanocrystallite and defects in (ZrTi)CN nanocomposite irradiated by electron beam

2021 ◽  
pp. 2150111
Author(s):  
M. Yu. Tashmetov ◽  
I. I. Yuldashova ◽  
N. B. Ismatov
Keyword(s):  
Electron Beam ◽  
Surface Structure ◽  
Electron Beam Irradiation ◽  
Rietveld Method ◽  
Nanocomposite Coating ◽  
Beam Irradiation ◽  
X Ray ◽  
Nanocrystallite Size ◽  
Atomic Force ◽  
Cubic Structure

Effect of 2 MeV electron beam at the current density 0.09 nA/cm2 on surface structure, nanocrystallite size of (ZrTi)CN nanocomposite coating on steel was investigated at Scanning Electron and Atomic Force microscopes, and also X-ray diffractometer. Using the Rietveld method, two structure phases were indentified in the pristine samples: (ZrTi)(CN)-cubic (space group Fm-3m) and TiC — trigonal (sp.gr.R-3m). Electron beam irradiation to the fluency of [Formula: see text] electron/cm2 resulted in the phase transition of TiC from trigonal (sp.gr.R-3m) to cubic structure (sp.gr.Fm-3m). Besides, nanocrystallite size and shape have changed after the fluency [Formula: see text] electron/cm2. The lattice parameters have increased up to [Formula: see text] electron/cm2 fluence and the nanorcrystallite size of nanocomposite was enlarged 26%, which was attributed to generation of defects.

Investigation of Ti/CuO interface by X-ray photoelectron spectroscopy and atomic force microscopy

2018 ◽  
Vol 51 (2) ◽  
pp. 246-253
Author(s):  
Dev Raj Chopra ◽  
Justin Seth Pearson ◽  
Darius Durant ◽  
Ritesh Bhakta ◽  
Anil R. Chourasia
Keyword(s):  
Atomic Force Microscopy ◽  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Characterization of X-ray irradiated graphene oxide coatings using X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy

2013 ◽  
Vol 28 (2) ◽  
pp. 68-71 ◽  
Author(s):  
Thomas N. Blanton ◽  
Debasis Majumdar
Keyword(s):  
Atomic Force Microscopy ◽  
Graphene Oxide ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
X Ray Diffraction ◽  
Carbon Phase ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After

In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive.

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