Effect of Colloidal Silica Addition and Pre-Coating on the Microstructure Change of Cathode Copper Electrodeposited Film

2005 ◽  
Vol 475-479 ◽  
pp. 3931-3934
Author(s):  
Sang Baek Lee ◽  
Yung Keun Kim ◽  
Byung Il Kim
Keyword(s):  
Colloidal Silica ◽  
Pure Copper ◽  
Copper Deposit ◽  
Preferred Orientation ◽  
X Ray Diffraction ◽  
Sulfate Bath ◽  
Structure Surface ◽  
Cathode Substrate ◽  
Diffraction Patterns ◽  
Deposit Film

The crystal structure, surface morphology and preferred orientation of copper electro-deposit were investigated by using sulfate bath with SiO2 suspension and the cathode substrate Au-sputtered. By addition of colloidal silica in copper electrolytic bath and Au pre-coating on substrate, the grains of deposits became fined and uniform and the number of grains were increased. Hardness of copper electrodeposits with colloidal silica increased about 15% in comparison with that of pure copper deposit film. The (111), (200) and (311) planes in the X-ray diffraction patterns were almost swept away, so preferred orientation of copper deposits change from (111) to (110) plane by co-deposit SiO2 and pre-coating the substrate.

Sinterbility of (Bi4-xLax)Ti3O12 Ceramics

2008 ◽  
Vol 55-57 ◽  
pp. 841-844 ◽  
Author(s):  
Pasinee Siriprapa ◽  
Anucha Watcharapasorn ◽  
Sukanda Jiansirisomboon
Keyword(s):  
Grain Orientation ◽  
Sintering Temperature ◽  
Orthorhombic Phase ◽  
Preferred Orientation ◽  
Doping Content ◽  
X Ray Diffraction ◽  
Microstructural Investigation ◽  
X Ray ◽  
Lanthanum Titanate ◽  
Diffraction Patterns

This research studied the effects of sintering temperature and La3+ doping content on phase, microstructure and densification of bismuth lanthanum titanate (Bi4-xLaxTi3O12; BLT) ceramics when x = 0, 0.25, 0.5, 0.75 and 1.0, respectively. The BLT powders were prepared using a mixed-oxide method. The mixtures were calcined at 750°C for 4 h before being pressed and sintered at 1000-1150°C for 4 h. The result of phase analysis by X–ray diffraction (XRD) indicated the existence of orthorhombic phase for all sintering temperatures. The XRD peak intensities of the ceramics showed preferred orientation of a particular set of {00l}-type planes. The ceramics mainly composed of plate-like grains. Increasing the sintering temperature increased grain size and increased preferred grain orientation. The present of La3+ in BLT ceramics reduced preferred orientation especially at higher sintering temperature. Results of microstructural investigation agreed well with X-ray diffraction patterns.

X-ray diffraction patterns of LuNi2B2C and YNi2B2C

1996 ◽  
Vol 11 (2) ◽  
pp. 88-90 ◽  
Author(s):  
W. Wong-Ng ◽  
R. Cava ◽  
J. J. Krajewski ◽  
W. F. Peck
Keyword(s):  
Preferred Orientation ◽  
Specimen Preparation ◽  
X Ray Diffraction ◽  
Space Group ◽  
X Ray ◽  
Arc Melting ◽  
Melting Technique ◽  
Diffraction Patterns

Reference X-ray diffraction patterns for the quarternary intermetallic superconductor phases of compositions LuNi2B2C and YNi2B2C are reported. Both materials were synthesized by the arc-melting technique. The patterns of these metallic phases exhibit preferred orientation in an ordinarily pressed sample, which was minimized through special specimen preparation. The observed intensities and the calculated values for both phases agree reasonably well with each other. Both compounds were refined in the space group I4/mmm, with a=3.4647(1) Å and c=10.6330(4) Å for LuNi2B2C and a=3.5271(1) Å, c=10.5361(7) Å for YNi2B2C.

Micro X-ray diffraction on capillary powder samples: a novel and effective technique for overcoming preferred orientation

2001 ◽  
Vol 34 (5) ◽  
pp. 663-665 ◽  
Author(s):  
P. Bergese ◽  
E. Bontempi ◽  
I. Colombo ◽  
L. E. Depero
Keyword(s):  
Structural Parameters ◽  
Preferred Orientation ◽  
X Ray Diffraction ◽  
Rapid Preparation ◽  
X Ray ◽  
Polymeric Carriers ◽  
Powder Samples ◽  
Promising Solution ◽  
Diffraction Patterns ◽  
Analytical Approaches

In past years, both experimental and analytical approaches have been developed for eliminating preferred orientation effects on powder X-ray diffraction patterns. The state of the art does not allow one to face the problem without difficult sample treatments, mechanical randomization, pole-figure study or pattern fitting based on the Rietveld approach. These methods are time consuming or need the knowledge of all the structural parameters, and, moreover, must be managed by specialized operators. Besides, none of the above techniques can be applied to powder samples of drugs loaded into polymeric carriers, the diffraction patterns of which present a structured amorphous halo from which the crystalline drug peaks rise up. In this paper, it is shown that micro X-ray diffraction on capillary powder samples, combined with a two-dimensional detector, is a promising solution to preferred orientation problems, since it provides easy and rapid preparation of randomly oriented powder samples, fast measurements (acquisition times of a few minutes) and correct powder diffraction patterns.

scholarly journals Quantitative analysis of turbostratically disordered nontronite with a supercell model calibrated by the PONKCS method

2012 ◽  
Vol 45 (6) ◽  
pp. 1295-1302 ◽  
Author(s):  
Xiaodong Wang ◽  
Robert D. Hart ◽  
Jian Li ◽  
Robbie G. McDonald ◽  
Arie van Riessen
Keyword(s):  
Structural Model ◽  
Preferred Orientation ◽  
Quantitative Phase Analysis ◽  
X Ray Diffraction ◽  
Orientation Effects ◽  
Physically Based ◽  
Quantitative Results ◽  
Diffraction Patterns ◽  
Xrd Patterns ◽  
Supercell Model

Two calibration-based quantitative X-ray diffraction (XRD) models for turbostratically disordered Bulong nontronite, the PONKCS (partial or no known crystal structure) approach and the supercell structural model, were compared in terms of the accuracy and refinement error from Rietveld quantitative phase analysis. The PONKCS approach achieved improved nontronite quantitative results with synchrotron diffraction patterns compared with those achieved with laboratory XRD data as a result of better data quality and the use of Debye–Scherrer geometry with significantly reduced preferred orientation effects. The introduction of a peak shape modifier (spherical harmonics) to correct the quantification result is mainly useful for laboratory XRD patterns containing nontronite collected from Bragg–Brentano geometry with appreciable preferred orientation effects. A novel calibration approach for the nontronite supercell model was developed, based on the Rietveld quantitative formula in theTOPASsymbolic computation system. The calibrated supercell model achieved better accuracy (deviation within 1 wt%) and lower refinement error than the PONKCS approach because the physically based description of turbostratic disorder requires fewer refinable parameters than the PONKCS approach. The drawbacks and limitations of the supercell approach are also discussed.

A Study of Cuban Todorokite

1961 ◽  
Vol 5 ◽  
pp. 117-126
Author(s):  
G. M. Faulring
Keyword(s):  
Preferred Orientation ◽  
Optical Data ◽  
X Ray Diffraction ◽  
Random Orientation ◽  
Sodium Potassium ◽  
X Ray ◽  
Cell Dimensions ◽  
Diffraction Patterns ◽  
High Degree ◽  
Manganese Oxide Mineral

AbstractTodorokite is a hydrated manganese oxide mineral containing small amounts of sodium, potassium, calcium, barium, magnesium, iron, and aluminum. From the reports of other investigators and observations in our laboratories, todorokite appears to be a more widely occurring mineral than generally recognized.It was found by X-ray diffraction that a sample of todorokite from Charco Redondo, Cuba, had a high degree of preferred orientation and that milling for a prolonged period of time was necessary to obtain random orientation in a mounted specimen. The position of the preferred orientation direction with respect to the X-ray beam is the principal factor determining the relative intensities on an X-ray diffraction pattern. Based on fiber data, the unit cell of todorokite is considered to be pseudo-orthorhombic or triclinic with α, β, and γ angles varying slightly from 90° and cell dimensions of a0 = 9.65A, b0 = 10.29A, and c0 = 2.84A, This deviation from orthogonality may account for the diffuse and distinct reflections typical of X-ray diffraction patterns of todorokite. Optical data and a hypothesized paragenesis of Cuban todorokite are also included.

scholarly journals Silicon in Fe-Si Alloys: Correction of X-Ray Intensities for Preferred Orientation

1997 ◽  
Vol 29 (1-2) ◽  
pp. 77-87
Author(s):  
M. O. Figueiredo ◽  
F. Margarido
Keyword(s):  
Preferred Orientation ◽  
Correction Procedure ◽  
X Ray Diffraction ◽  
Silicon Phase ◽  
X Ray ◽  
Orientation Effects ◽  
Profile Fitting ◽  
Previous Algorithm ◽  
Texture Effect ◽  
Diffraction Patterns

A texture effect in the silicon phase of industrial Fe-Si alloys was noticed in the X-ray diffraction patterns through the reinforcement of the 111 reflection. A similar effect was also apparent in a commercial silicon standard pellet used as reference material and supposed to be texture-free.A quick correction procedure to account for preferred orientation effects was developed, based on a previous algorithm currently applied for the automatic profile fitting of powder diffractometer data. “Modified Wilson plots” are established for visualizing the efficiency of texture correction according to the proposed method.

Effect of Heat Treatment on the Microstructures and Electrical Properties of Insb Thin Films

1990 ◽  
Vol 202 ◽  
Author(s):  
P. W. Wang ◽  
S. Yeh ◽  
L. Chang
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Preferred Orientation ◽  
Electrical Mobility ◽  
X Ray Diffraction ◽  
Cross Sectional ◽  
Thermal Evaporation Method ◽  
Insb Thin Films ◽  
Diffraction Patterns ◽  
Deposited Film

ABSTRACTPolycrystalline InSb thin films have been prepared by two-source thermal evaporation method. The as-deposited randomly oriented thin films develop (111) preferred orientation upon heat treatment of different maximum setting temperatures, T(max)s. Under different T(max)s, the elongate (111) grains rotate gradually the direction of the elongation respect to the thermally oxidized Si(100) substrate.The (111) preferred orientation has been seen from both cross-sectional TEM and X-ray diffraction patterns. The electrical mobility value of the thin film has been measured by the Van der Pauw′s method. A dramatic increase in the electrical mobility from few thousands, for the as-deposited film, to intermediate values of 15,000-30,000 cm2/v-s and the highest value of 36,000 cm2/v-s for thin films subjected to different T(max)s, can be correlated well to the corresponding microstruetures.

scholarly journals Structure and Optical Properties of CdTe and CdS Thin Films after Hard Ultraviolet Irradiation

2019 ◽  
Vol 20 (2) ◽  
pp. 165-170
Author(s):  
G.I. Kopach ◽  
A.I. Dobrozhan ◽  
G.S. Khrypunov ◽  
R.P. Mygushchenko ◽  
О.Y. Kropachek ◽  
...  
Keyword(s):  
Crystalline Structure ◽  
Ultraviolet Irradiation ◽  
Coherent Scattering ◽  
Optical Characteristics ◽  
X Ray Diffraction ◽  
Surface Layers ◽  
Near Surface ◽  
Structure Surface ◽  
Cds Thin Films ◽  
Diffraction Patterns

The influence of hard ultraviolet radiation on the crystalline structure, surface morphology and optical characteristics of CdS and CdTe semiconductor layers obtained by direct current magnetron sputtering are investigated. It was established that the optical characteristics of the studied films CdS and CdTe are insensitive to hard ultraviolet irradiation. The crystalline structure of the CdS and CdTe layers is changed after irradiation. The period of the lattice for cadmium sulfide films increases from c = 6.77(01) Å to c = 6.78(88) Å, which may be due to the formation of point defects and defective complexes. Decrease the integral FWHM of the peaks on the X-ray diffraction patterns of the layers of CdS and CdTe was observed, due to the increase of the coherent scattering regions as a result in the process of near-surface layers partial recrystallization of the investigated films.

Evaluation of Freezing Methods by Low Temperature X-Ray Diffraction

1977 ◽  
Vol 35 ◽  
pp. 330-333
Author(s):  
T. Gulik-Krzywicki ◽  
M.J. Costello
Keyword(s):  
Biological Materials ◽  
Molecular Organization ◽  
X Ray Diffraction ◽  
Glass Capillary ◽  
X Ray ◽  
Rate Dependent ◽  
Before And After ◽  
Freeze Etching ◽  
Diffraction Patterns ◽  
Set Up

Freeze-etching electron microscopy is currently one of the best methods for studying molecular organization of biological materials. Its application, however, is still limited by our imprecise knowledge about the perturbations of the original organization which may occur during quenching and fracturing of the samples and during the replication of fractured surfaces. Although it is well known that the preservation of the molecular organization of biological materials is critically dependent on the rate of freezing of the samples, little information is presently available concerning the nature and the extent of freezing-rate dependent perturbations of the original organizations. In order to obtain this information, we have developed a method based on the comparison of x-ray diffraction patterns of samples before and after freezing, prior to fracturing and replication.Our experimental set-up is shown in Fig. 1. The sample to be quenched is placed on its holder which is then mounted on a small metal holder (O) fixed on a glass capillary (p), whose position is controlled by a micromanipulator.

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