Study of Structural and Optical Properties of Cu2ZnSnS4 and Cu2ZnGeS4 Thin Films Synthesized by Sulfurization of Stacked Metallic Layers

2015 ◽  
Vol 814 ◽  
pp. 44-48 ◽  
Author(s):  
Ling Huang ◽  
Hong Mei Deng ◽  
Jun He ◽  
Lei Lei Chen ◽  
Ping Xiong Yang ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Blue Shift ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
The Earth ◽  
Toxic Materials ◽  
Earth Abundant ◽  
Semiconducting Compounds

Cu2ZnSnS4and Cu2ZnGeS4thin films made from the earth abundant and non-toxic materials are quaternary semiconducting compounds which have received increasing interest for solar cells applications. Cu2ZnSnS4and Cu2ZnGeS4thin films have been synthesized by sulfurization of radio frequency magnetron sputtered precursors. The structural and optical properties of the thin films have been investigated and discussed. The result of X-ray diffraction demonstrates that the Cu2ZnSnS4and Cu2ZnGeS4thin films have kesterite (KS; space groupI) crystal structure. An obvious blue shift is observed in the Raman spectra as smaller Ge replaces Sn. It is due to the fact that the radius of Ge cation is smaller than that of Sn cation , which results in the shrink of the lattice. Further transmission spectra demonstrate that the values of band gap for CZTS and CZGS thin films are 1.54 eV and 1.98 eV, respectively.

Structural and optical properties of Tin Oxide and Indium doped SnO2 thin films deposited by thermal evaporation technique

2016 ◽  
Vol 12 (3) ◽  
pp. 4394-4399
Author(s):  
Sura Ali Noaman ◽  
Rashid Owaid Kadhim ◽  
Saleem Azara Hussain
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Tin Oxide ◽  
Thermal Evaporation ◽  
Pure Sno2 ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Evaporation Technique ◽  
Sno2 Thin Films

Tin Oxide and Indium doped Tin Oxide (SnO2:In) thin films were deposited on glass and Silicon  substrates  by  thermal evaporation technique.  X-ray diffraction pattern of  pure SnO2 and SnO2:In thin films annealed at 650oC and the results showed  that the structure have tetragonal phase with preferred orientation in (110) plane. AFM studies showed an inhibition of grain growth with increase in indium concentration. SEM studies of pure  SnO2 and  Indium doped tin oxide (SnO2:In) ) thin films showed that the films with regular distribution of particles and they have spherical shape.  Optical properties such as  Transmission , optical band-gap have been measured and calculated.

Effect of Deposition Time on Structural and Optical Properties of ZnO Thin Films Deposited by Spray Pyrolysis

2019 ◽  
Vol 397 ◽  
pp. 81-87 ◽  
Author(s):  
Farid Khediri ◽  
Abdelkader Hafdallah ◽  
Mouna Bouhelal
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Spray Pyrolysis ◽  
Deposition Time ◽  
Spray Pyrolysis Technique ◽  
Precursor Solution ◽  
Zno Thin Films ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray

In this work Zinc oxide thin films prepared by spray pyrolysis technique. A set of ZnO thin films were deposited with various deposition times, on glass substrate at 350 °C. The precursor solution is formed with zinc acetate in distilled methanol with 0.1 molarity. The deposition time was ranged from 2 to 8 min. The structural and optical properties of those films were examined by X-ray diffraction (XRD) and ultraviolet-visible spectrometer (UV). X-ray diffraction patterns of the ZnO thin films showed polycrystalline hexagonal wurtzite structure and the preferred orientation was along (002) plane when the grain size varied between 9.66 and 16.67nm. ZnO thin films were highly transparent in the visible with the maximum transmittance of 85% and the optical band gap was found between 3.25 and 3.28 eV.

Structural and Optical Properties of ZnO Film Precursors for Multilayered Transparent Solar Cell Electrodes

2015 ◽  
Vol 1132 ◽  
pp. 217-223
Author(s):  
E.R. Rwenyagila ◽  
B. Agyei-Tuffour ◽  
M.G.Z. Kana ◽  
O. Akin-Ojo ◽  
W.O. Soboyejo
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Rf Magnetron Sputtering ◽  
Zno Thin Films ◽  
X Ray Diffraction ◽  
Zno Film ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Deposition Power ◽  
Different Temperatures

This work examines the modification of the structural and optical properties of ZnO thin films by control of deposition and post-treatment parameters. ZnO thin films were deposited by RF magnetron sputtering from a ceramic target locally made at SHESTCO in Abuja, Nigeria. X-ray diffraction measurements characterized the different films prior to thermal annealing as extremely amorphous with average UV-VIS transmittance spectra between 80 and 90%. Annealing at different temperatures and time spans influenced the formation of Wurtzite (002) oriented ZnO crystallites. Contrary to the crystallinity of the films, which was strongly influenced by the deposition power, the optical transmission of the films was only slightly influenced by the deposition power and it was less sensitive to the crystallinity of ZnO thin films.

scholarly journals Temperature effect on structural and optical properties of V2O5 thin films prepared by spray pyrolysis technique

2020 ◽  
Vol 307 ◽  
pp. 01033
Author(s):  
Asmaa Mrigal ◽  
Lahocine El Gana ◽  
Mouhamed Addou ◽  
Khadija Bahedi ◽  
Rajae Temsamani ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Energy Gap ◽  
Spray Pyrolysis Technique ◽  
Three Dimensional ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Glass Substrates ◽  
Optical Dielectric Constant

In this work, the effect of substrate temperature on structural and optical properties of V2O5 thin films has been characterized by X-ray diffraction (XRD); SEM and transmission. The films mince has been prepared by Reactive Chemical Spraying technology in Liquid Phase (RCSLP) on glass substrates preheated at (350, 400, 450 and 500 °C). The X-ray diffraction analysis confirms that all layers are polycrystalline, and the preferred orientation of V2O5 is the (001) plane. The morphology of V2O5 thin films are porous nature and their particle’s shape is three-dimensional. The transmittance and absorbance of thin film were measured from which the optical constants (Energy gap, Refractive index, Absorption coefficient, Extinction coefficient and Optical dielectric constant) were determined.

Structural and Optical Properties of Pulse Laser Deposited TiO2 Thin Films

2013 ◽  
Vol 537 ◽  
pp. 224-228
Author(s):  
Yi Liu ◽  
Hong Mo Huang ◽  
Xiao Dong Lin
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Substrate Temperature ◽  
Crystalline Structure ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Tio2 Thin Films ◽  
X Ray ◽  
Quartz Glasses

TiO2 thin films were prepared on quartz glasses by pulsed laser deposition (PLD) using a KrF laser excimer. The crystalline structure was characterized by X-ray diffraction, and the optical properties of the films were investigated using spectroscopic ellipsometry and UV-vis spectra respectively. The effects of the PLD conditions, including substrate temperature and O2 pressure on the crystalline structure and the optical properties of the films were investigated. The results indicated that there are a suitable substrate temperature and an O2 pressure which is favorable for the synthesis of anatase-type TiO2.

Structural and Optical Properties of Nebulized Nickel Oxide Thin Films

2014 ◽  
Vol 938 ◽  
pp. 103-107
Author(s):  
V. Gowthami ◽  
M. Meenakshi ◽  
N. Anandhan ◽  
Chinnappanadar Sanjeeviraja
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Nickel Oxide ◽  
Band Gap ◽  
X Ray Diffraction ◽  
Oxide Thin Films ◽  
Structural And Optical Properties ◽  
Functional Layer ◽  
X Ray ◽  
Nickel Oxide Thin Films

Nickel oxide has been widely used as material for antiferromagnetic, electrochromic display and functional layer for chemical sensors. Nickel oxide thin films of various molarities were deposited using a simple nebulizer technique and the substrate temperature was fixed at 350C. The effect of the molarity of precursor solution on structural and optical properties was studied using X-ray diffraction (XRD) and UV-Vis-NIR spectrometer techniques respectively. The band gap of the material was confirmed by photoluminescence spectrometer. It is found that increase in the molarity of 10ml volume of the sprayed solution leads to the increasing in film thickness. X-ray diffraction studies indicated cubic structure and the crystallites are preferentially oriented along (1 1 1) plane. It is also found that as the concentration of the solution increases the transmittance decreases, consequently the band-gap energy wanes from 4.0 eV to 3.2 eV.

Effects of Fe and Ni Co-Doping on the Optical Properties of TiO2 Thin Films

2019 ◽  
Vol 19 (01) ◽  
pp. 1850046
Author(s):  
Mahboubeh Yeganeh ◽  
Maliheh Mousavi
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Oxygen Vacancies ◽  
Visible Region ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Tio2 Thin Films ◽  
X Ray ◽  
Co Doping ◽  
Uv Visible

In this work, the effects of Fe/Ni co-doping on structural and optical properties of TiO2 thin films were investigated by the X-ray diffraction, scanning electron microscope and UV-visible spectroscopy. The optical properties of transmittance, extinction coefficient, refractive index, real and imaginary parts of dielectric constant of the thin films, prepared by spray pyrolysis, revealed that the absorption in visible region increases due to the influence of Fe/Ni co-doping. The widening of the gap energies is observed as a result of doping. The increased optical gap as a consequence of doping can be explained by decreasing the size of nanoparticles, as confirmed by SEM and increasing the formation of oxygen vacancies as a result of Ni[Formula: see text] substitution to Ti[Formula: see text] and appearance of the Burstein–Moss effect.

Effects of Vapor CdCl2 Treatment on the Properties of CdS Thin Films Prepared by R.F. Magnetron Sputtering

2011 ◽  
Vol 347-353 ◽  
pp. 3477-3480
Author(s):  
Liang Min Cai ◽  
Jian Huang ◽  
Jia Wei Jiang ◽  
Jun Le ◽  
Wei Min Shi ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Optical Properties ◽  
Magnetron Sputtering ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Solar Cell Application ◽  
X Ray ◽  
Cds Thin Films ◽  
Cds Films

CdS films were prepared by R.F. magnetron sputtering method. The effects of vapor CdCl2treatment on the properties of CdS films were studied. The vapor CdCl2thermal treatment at different temperature was employed in a CSS device, using CdCl2powder as evaporant. The structural and optical properties of CdS films were investigated by x-ray diffraction (XRD), PL spectra, and transmittance spectra, respectively. The results revealed that the CdS films had a structure of hexagonal wurtzite with a preferential orientation of the (002) plane. A better crystal quality and larger grain size, which are good for the solar cell application, were observed in the CdS samples annealed with CdCl2Subscript text.

scholarly journals Structural And Optical Properties Of VOx Thin Films

2015 ◽  
Vol 60 (2) ◽  
pp. 957-961 ◽  
Author(s):  
K. Schneider
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Optical Transmittance ◽  
Fused Silica ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Corning Glass ◽  
Oxygen Gas ◽  
Deposited Films

Abstract VOx thin films were deposited on Corning glass, fused silica and Ti foils by means of rf reactive sputtering from a metallic vanadium target. Argon-oxygen gas mixtures of different compositions controlled by the flow rates were used for sputtering. Influence of the oxygen partial pressure in the sputtering chamber on the structural and optical properties of thin films has been investigated. Structural properties of as-sputtered thin films were studied by X-ray diffraction at glancing incidence, GIXD. Optical transmittance and reflectance spectra were recordedwith a Lambda 19 Perkin-Elmer double spectrophotometer. Thickness of the films was determined from the profilometry. It has been confirmed by XRD that the deposited films are composed mainly of V2O5 phase. The estimated optical band gap of 2.5 eV corresponds to V2O5.

Structural and Optical Properties of (Al, Co) Codoped-ZnO Thin Film

2014 ◽  
Vol 941-944 ◽  
pp. 1302-1305
Author(s):  
Ping Cao ◽  
Yue Bai ◽  
Zhi Qu
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Optical Properties ◽  
Sol Gel ◽  
Zno Thin Film ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Al Doping ◽  
X Ray ◽  
Uv Emission

Zn0.99-xCo0.01AlxO (x=0, 0.01,) thin films have been prepared by a sol-gel method. The structural and optical properties of the samples were investigated. X-ray diffraction and EDX spectrum indicate that Al3+ and Co2+ substitute for Zn2+ without changing the wurtzite structure. With the Al doping,the intensity ratio of the visible to UV emission increases, which is attributed to the increase of O vacancies and Zn interstitials .

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