Microstructural Characterisation of RF Magnetron Sputtered ZnO Thin Films on SiC
2004 ◽
Vol 99-100
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pp. 123-126
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Keyword(s):
The microstructural characterization of r.f. magnetron sputtered ZnO thin films deposited on 6H-SiC is presented with a comprehensive investigation of their properties as a function of annealing temperature and film thickness. These structures, with some modifications, are utilised as Schottky diode hydrogen gas sensors and Surface Acoustic Wave (SAW) devices.
Keyword(s):
Keyword(s):
2004 ◽
Vol 103
(1-2)
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pp. 129-135
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Keyword(s):
Keyword(s):
2006 ◽
Vol 127
(1)
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pp. 49-55
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Keyword(s):
2016 ◽
Vol 389
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pp. 1023-1032
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