Mitigation of High Temperature Environments on Electrical Disconnects

2018 ◽  
Vol 2018 (HiTEC) ◽  
pp. 000148-000153
Author(s):  
Kenneth P. Dowhower

Abstract The electrical interconnect is an essential component of most electrical system configurations. The ability of the interconnect interface to reliably transmit power and / or data throughout the system is critical to its overall performance. Degradation of the mechanical or electrical properties of the interface can reduce the system performance or in severe cases, make it inoperable. There are several factors which can inhibit the performance of the interconnect, one of most severe is long term exposure to elevated temperatures. This effect can also be accelerated when combined with other severe environmental conditions such as high vibration and physical shock, which are often found in down hole oil and gas well drilling applications. This type of exposure can significantly degrade the essential properties of a reliable electrical interface such as contact resistance, mechanical stability, and electrical isolation. This paper will present options for design features and material properties that can be incorporated into an interconnect design that will mitigate these adverse effects. Specifically, this paper addresses the material properties of the contact interface and its surface treatment, the mechanical and electrical properties of the insulating material, the robustness of the mating features and the contact retention system. Two key features of the contact interface that are discussed are the stability of its electrical resistance and the robustness of its mechanical retention. Long term exposure to high temperatures typically induces stress relaxation in the compliant members of the contact interface that are required to produce a stable, low resistance interface, while allowing for a high level of mate / unmate durability. Stress relaxation can also reduce the mechanical stability of the contact interface where metal or plastic retention features are utilized. In the case of retention through epoxy bonding, imparting thermal stress at the bonding surface can result in loss of adhesion and / or retention. The surface treatment of the contact interface has also been shown to be a contributing factor in its electrical stability in high temperature applications. Typically, the interface is plated with a hard gold over nickel finish, which provides a noble interface that is corrosion resistant, but with the hardness required to withstand many mate / unmate cycles. A small percentage of nickel or cobalt are typically alloyed with the gold to produce the required hardness. In most applications, it has minimal impact on the overall resistance of the contact interface. In high temperature applications, however, it can tend to diffuse through the gold to the contact interface. Since these materials have a higher resistivity, they can negatively affect the resistance of the interface. The impact of this effect is reviewed in this paper. Finally, results of the evaluations on high temperature insulating materials and bonding epoxies are presented in this paper. The mechanical and dielectric stability of the insulating materials and the adhesion properties of the epoxy used for contact retention were the primary concerns for their evaluation. The verification tests that included at temperature exposure were conducted at +260°C to simulate extreme use cases for most down hole applications.

Author(s):  
R. E. Franck ◽  
J. A. Hawk ◽  
G. J. Shiflet

Rapid solidification processing (RSP) is one method of producing high strength aluminum alloys for elevated temperature applications. Allied-Signal, Inc. has produced an Al-12.4 Fe-1.2 V-2.3 Si (composition in wt pct) alloy which possesses good microstructural stability up to 425°C. This alloy contains a high volume fraction (37 v/o) of fine nearly spherical, α-Al12(Fe, V)3Si dispersoids. The improved elevated temperature strength and stability of this alloy is due to the slower dispersoid coarsening rate of the silicide particles. Additionally, the high v/o of second phase particles should inhibit recrystallization and grain growth, and thus reduce any loss in strength due to long term, high temperature annealing.The focus of this research is to investigate microstructural changes induced by long term, high temperature static annealing heat-treatments. Annealing treatments for up to 1000 hours were carried out on this alloy at 500°C, 550°C and 600°C. Particle coarsening and/or recrystallization and grain growth would be accelerated in these temperature regimes.


1991 ◽  
Vol 227 ◽  
Author(s):  
M. Haider ◽  
E. Chenevey ◽  
R. H. Vora ◽  
W. Cooper ◽  
M. Glick ◽  
...  

ABSTRACTTrifluoromethyl group-containing polyimides not only show extraordinary electrical properties, but they also exhibit excellent long-term thermo-oxidative stability. Among the most thermomechanically stable structural polyimides are those from 6F dianhydride (6FDA) and 6F diamines. The effects of substituting non-fluorine containing monomers such as BTDA, mPDA and 4,4′-DADPS for the hexafluoroisopropylidene monomers on the dielectric, thermo-oxidative, thermal and mechanical properties of the copolymers were studied.


Author(s):  
Carl E. Jaske

This paper reviews the metallurgy and behavior of centrifugally cast heat-resistant alloys for ammonia, methanol, and hydrogen reformer furnaces. The alloys include HK and HP, as well as proprietary versions of these materials produced by various foundries. Alloying and metallurgical factors that affect resistance to oxidation, carburization, and high temperature creep are discussed. Examples of the effects of environment and temperature on material behavior are provided. Finally, the use of material properties to predict the long-term performance of reformer furnace components is reviewed.


2010 ◽  
Vol 645-648 ◽  
pp. 745-748 ◽  
Author(s):  
M. Guziewicz ◽  
Ryszard Kisiel ◽  
Krystyna Gołaszewska ◽  
Marek Wzorek ◽  
Anna Stonert ◽  
...  

The stability of Au wire connections to n-SiC/Ti ohmic contacts and to n-SiC/Ni ohmic contacts with top Au or Pt layers has been investigated. Long-term tests of the connections are performed in air at 400oC. Evaluation of electrical parameters, morphology and structure of the metallization as well as the strength of Au joint show stable Au wire bonds to the metallization with Ti-ohmic contacts.


2012 ◽  
Vol 2012 (HITEC) ◽  
pp. 000082-000086
Author(s):  
Jeff Watson ◽  
Gustavo Castro

This paper discusses a very low noise instrumentation amplifier designed specifically for high temperature applications. The device uses a proprietary silicon-on-insulator process that minimizes parasitic leakage currents at elevated temperature. Variance in device parameters are managed to maintain high performance over a wide temperature range. Layout and packaging considerations that would affect long term reliability are addressed. The amplifier is well characterized above 200°C and attains much higher performance than amplifiers not optimized for high temperature operation. Comprehensive reliability testing over temperature has been completed.


Sign in / Sign up

Export Citation Format

Share Document