Electrical Performance of Through-Silicon Vias (TSVs) for High-Frequency 3D IC Integration Applications
2012 ◽
Vol 2012
(1)
◽
pp. 001221-001228
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Keyword(s):
3D Ic
◽
In this study, the electrical performance of a general TSV structure for high-frequency 3D IC integration applications is investigated. Emphasis is placed on the proposal of an analytical model and the analytical equations of a TSV with all its key parameters. Also, the model and equations are verified, both in the frequency and time domains, by more detailed finite element analyses. Finally, a TSV electrical design guideline is proposed.
2012 ◽
Vol 2012
(1)
◽
pp. 000239-000243
2019 ◽
Vol 106
(5)
◽
pp. 785-798
Keyword(s):
2015 ◽
Vol 74
◽
pp. 87-93
◽
Keyword(s):
2015 ◽
Vol 5
(1)
◽
pp. 21-27
◽
Keyword(s):
1998 ◽
Vol 1626
(1)
◽
pp. 85-92
◽
Keyword(s):