Nematic Ordering Driven by Atomic-scale Multipoles

2021 ◽  
Vol 1 ◽  
Author(s):  
Satoru Hayami

We found a beautiful empirical rule (α ∝ <em>η</em><sup>-0.4</sup>) between the electrochemical Seebeck coefficient <em>α</em> for Fe<sup>2+</sup>/Fe<sup>3+</sup> redox pair and viscosity coefficient <em>η</em> of the organic solvent.

2021 ◽  

We found a beautiful empirical rule (α ∝ <em>η</em><sup>-0.4</sup>) between the electrochemical Seebeck coefficient <em>α</em> for Fe<sup>2+</sup>/Fe<sup>3+</sup> redox pair and viscosity coefficient <em>η</em> of the organic solvent.


2019 ◽  
Vol 72 (9) ◽  
pp. 709 ◽  
Author(s):  
Abuzar Taheri ◽  
Douglas R. MacFarlane ◽  
Cristina Pozo-Gonzalo ◽  
Jennifer M. Pringle

The conversion of thermal energy to electricity using thermoelectrochemical cells (thermocells) is a developing approach to harvesting waste heat. The performance of a thermocell is highly dependent on the solvent used in the electrolyte, but the interplay of the various solvent effects is not yet well understood. Here, using the redox couples [Co(bpy)3][BF4]2/3 (bpy=2,2′-bipyridyl) and (Et4N)3/(NH4)4Fe(CN)6, which have been designed to allow dissolution in different solvent systems (aqueous, non-aqueous, and mixed solvent), the effect of solvent on the Seebeck coefficient (Se) and cell performance was studied. The highest Se for a cobalt-based redox couple measured thus far is reported. Different trends in the Seebeck coefficients of the two redox couples as a function of the ratio of organic solvent to water were observed. The cobalt redox couple produced a more positive Se in organic solvent than in water, whereas addition of water to organic solvent resulted in a more negative Se for Fe(CN)6 3−/4−. UV-vis and IR investigations of the redox couples indicate that Se is affected by changes in solvent–ligand interactions in the different solvent systems.


2021 ◽  
Vol 90 (3) ◽  
pp. 033602
Author(s):  
Dai Inoue ◽  
Hideharu Niwa ◽  
Hiroaki Nitani ◽  
Yutaka Moritomo

Nanoscale ◽  
2020 ◽  
Vol 12 (3) ◽  
pp. 1580-1588
Author(s):  
Shuankui Li ◽  
Mihai Chu ◽  
Weiming Zhu ◽  
Rui Wang ◽  
Qi Wang ◽  
...  

The simultaneous enhancement of the Seebeck coefficient and electrical conductivity is achieved in Bi2Te2.7Se0.3 using an ALD-based strategy.


Author(s):  
H. Hashimoto ◽  
Y. Sugimoto ◽  
Y. Takai ◽  
H. Endoh

As was demonstrated by the present authors that atomic structure of simple crystal can be photographed by the conventional 100 kV electron microscope adjusted at “aberration free focus (AFF)” condition. In order to operate the microscope at AFF condition effectively, highly stabilized electron beams with small energy spread and small beam divergence are necessary. In the present observation, a 120 kV electron microscope with LaB6 electron gun was used. The most of the images were taken with the direct electron optical magnification of 1.3 million times and then magnified photographically.1. Twist boundary of ZnSFig. 1 is the image of wurtzite single crystal with twist boundary grown on the surface of zinc crystal by the reaction of sulphur vapour of 1540 Torr at 500°C. Crystal surface is parallel to (00.1) plane and electron beam is incident along the axis normal to the crystal surface. In the twist boundary there is a dislocation net work between two perfect crystals with a certain rotation angle.


Author(s):  
R. J. Wilson ◽  
D. D. Chambliss ◽  
S. Chiang ◽  
V. M. Hallmark

Scanning tunneling microscopy (STM) has been used for many atomic scale observations of metal and semiconductor surfaces. The fundamental principle of the microscope involves the tunneling of evanescent electrons through a 10Å gap between a sharp tip and a reasonably conductive sample at energies in the eV range. Lateral and vertical resolution are used to define the minimum detectable width and height of observed features. Theoretical analyses first discussed lateral resolution in idealized cases, and recent work includes more general considerations. In all cases it is concluded that lateral resolution in STM depends upon the spatial profile of electronic states of both the sample and tip at energies near the Fermi level. Vertical resolution is typically limited by mechanical and electronic noise.


Author(s):  
Alexis T. Bell

Heterogeneous catalysts, used in industry for the production of fuels and chemicals, are microporous solids characterized by a high internal surface area. The catalyticly active sites may occur at the surface of the bulk solid or of small crystallites deposited on a porous support. An example of the former case would be a zeolite, and of the latter, a supported metal catalyst. Since the activity and selectivity of a catalyst are known to be a function of surface composition and structure, it is highly desirable to characterize catalyst surfaces with atomic scale resolution. Where the active phase is dispersed on a support, it is also important to know the dispersion of the deposited phase, as well as its structural and compositional uniformity, the latter characteristics being particularly important in the case of multicomponent catalysts. Knowledge of the pore size and shape is also important, since these can influence the transport of reactants and products through a catalyst and the dynamics of catalyst deactivation.


Author(s):  
A. K. Datye ◽  
D. S. Kalakkad ◽  
L. F. Allard ◽  
E. Völkl

The active phase in heterogeneous catalysts consists of nanometer-sized metal or oxide particles dispersed within the tortuous pore structure of a high surface area matrix. Such catalysts are extensively used for controlling emissions from automobile exhausts or in industrial processes such as the refining of crude oil to produce gasoline. The morphology of these nano-particles is of great interest to catalytic chemists since it affects the activity and selectivity for a class of reactions known as structure-sensitive reactions. In this paper, we describe some of the challenges in the study of heterogeneous catalysts, and provide examples of how electron holography can help in extracting details of particle structure and morphology on an atomic scale.Conventional high-resolution TEM imaging methods permit the image intensity to be recorded, but the phase information in the complex image wave is lost. However, it is the phase information which is sensitive at the atomic scale to changes in specimen thickness and composition, and thus analysis of the phase image can yield important information on morphological details at the nanometer level.


Author(s):  
David J. Smith

The era of atomic-resolution electron microscopy has finally arrived. In virtually all inorganic materials, including oxides, metals, semiconductors and ceramics, it is possible to image individual atomic columns in low-index zone-axis projections. A whole host of important materials’ problems involving defects and departures from nonstoichiometry on the atomic scale are waiting to be tackled by the new generation of intermediate voltage (300-400keV) electron microscopes. In this review, some existing problems and limitations associated with imaging inorganic materials are briefly discussed. The more immediate problems encountered with organic and biological materials are considered elsewhere.Microscope resolution. It is less than a decade since the state-of-the-art, commercially available TEM was a 200kV instrument with a spherical aberration coefficient of 1.2mm, and an interpretable resolution limit (ie. first zero crossover of the contrast transfer function) of 2.5A.


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