Elemental depth profiles and plasma etching rates of positive-tone electron beam resists after sequential infiltration synthesis of alumina

2018 ◽  
Vol 57 (6S1) ◽  
pp. 06HG01 ◽  
Author(s):  
Yuki Ozaki ◽  
Shunya Ito ◽  
Nobuya Hiroshiba ◽  
Takahiro Nakamura ◽  
Masaru Nakagawa
2001 ◽  
Vol 386 (2) ◽  
pp. 142-146 ◽  
Author(s):  
Shinzo Morita ◽  
Girish J Phatak ◽  
Yuki Mori
Keyword(s):  

1984 ◽  
Vol 35 ◽  
Author(s):  
M.S. Doghmane ◽  
D. Barbier ◽  
A. Laugier

ABSTRACTAu/Si Schottky contacts have been used as test structures to investigate defects induced in virgin C.Z (100) N-type silicon after irradiation with a 12 to 20 KeV mean energy electron beam pulse. A thin and highly damaged surface layer was observed from a fluence threshold of 1 J/cm2. In addition electron traps were detected in the PEBA induced melting layer with concentrations in the 1012-1013 cm-3 range. Their depth profiles have been related to the PEBA induced melting layer thickness. Quenching of multidefect complexes is the most probable mechanism for electron trap generation in the processed layer.


1985 ◽  
Vol 54 ◽  
Author(s):  
S. Ingrey ◽  
J.P.D. Cook

A dual ion gun system has been proposed (D.E. Sykes et al, Appl. Surf. Sci. 5(1980)103) to reduce texturing and improve depth resolution during Auger sputter depth profiling. We have evaluated this ion gun configuration by profiling a variety of multilayer structures. With careful alignment of the guns, we have obtained a dramatic decrease in ion-induced texturing often seen when a single ion gun is used. This effect was particularly pronounced for polycrystalline Al films on Si where an order of magnitude improvement in depth resolution was achieved. Further refinements of the technique include the use of low energy (IkeV) grazing incidence xenon ions and a small electron beam probe area. Depth profiles obtained from Ni/Cr, W/Si, and GaAs/GaAlAs multilayer structures will also be discussed.


2020 ◽  
Vol 96 (3s) ◽  
pp. 494-497
Author(s):  
А.Н. Алексеев ◽  
С.И. Петров

Показаны результаты применения отечественного оборудования (ЗАО «НТО») для разработки и проведения ключевых технологических операций при изготовлении мощных полевых транзисторов и МИС СВЧ-диапазона на основе GaN и GaAs. Обсуждаются особенности и результаты оптимизации технологических установок для таких операций, как выращивание гетероструктур методом МЛЭ, нанесение контактной и затворной металлизации при помощи электронно-лучевого напыления, отжиг омических контактов, травление меза-изоляции и нанесение диэлектрика при помощи плазмохимических методов. Кроме того, представлены особенности установок и технологических процессов глубокого плазмохимического травления для формирования сквозных металлизированных отверстий в SiC и GaAs, а также прецизионного травления GaN и GaAs. Продемонстрированы технологические результаты использования оборудования ЗАО «НТО» в производственном цикле АО «Светлана-Рост». The paper highlights the results of using domestic equipment (SemiTEq JSC) for the development and implementation of key technological operations for producing GaN and GaAs based power microwave transistors. Features and results of optimization of the technological equipment have also been discussed for such operations as: MBE growth of heterosructures, deposition of the contacts and gate metallization using electron beam evaporation and ohmic contacts annealing, plasma etching of mesa isolation and PECVD of the dielectric. In addition, the features of systems for deep plasma etching of SiC and GaAs as well as GaN and GaAs precision etching have been presented. The technological results of using SemiTEq equipment in the production cycle of Svetlana-Rost JSC have been demonstrated.


2013 ◽  
Vol 28 (1) ◽  
pp. 150-155 ◽  
Author(s):  
Igor S. Molchan ◽  
Sundar Marimuthu ◽  
Abdeslam Mhich ◽  
Zhu Liu ◽  
Teruo Hashimoto ◽  
...  

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