MBE Growth and Characterization of Single Crystal and Bicrystal Permalloy (110) Thin Films

Superconducting YBaCuO thin films have been fabricated on single-crystal MgO by the spray-pyrolysis of nitrate precursors. The effects on the superconductive behavior of processing parameters such as time and temperature of heat treatment and film thickness were investigated. The superconductive behavior was found to be strongly dependent on film thickness. Films of thickness 1 μm were found to have a Tc of 67 K while thinner films showed appreciably degraded properties. Transmission electron microscopy studies have shown that the heat treatments necessary for the formation of the superconductive phase (for example, 950 °C for 30 min) also cause a substantial degree of film-substrate interdiffusion. Diffusion distances for Cu in the MgO substrate and Mg in the film were found to be sufficient to explain the degradation of the superconductive behavior in films of thickness 0.5 μm and 0.2 μm. From the concentration profiles obtained by EDS analysis diffusion coefficients at 950 °C for Mg into the YBaCuO thin film and for Cu into the MgO substrate were evaluated as 3 × 10−19 m2/s and 1 × 10−17 m2/s, respectively.

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REALIZATION AND CHARACTERIZATION OF e-BEAM COMPLETELY EVAPORATED BSCCO THIN FILMS

Modern Physics Letters B ◽

10.1142/s0217984991001477 ◽

1991 ◽

Vol 05 (18) ◽

pp. 1203-1211 ◽

Cited By ~ 10

Author(s):

C. ATTANASIO ◽

L. MARITATO ◽

A. NIGRO ◽

S. PRISHEPA ◽

R. SCAFURO

Keyword(s):

Thin Films ◽

Electron Beam ◽

Single Crystal ◽

Critical Current ◽

Ex Situ ◽

X Ray Diffraction ◽

Reliable Technique ◽

X Ray ◽

Eds Analysis

BSCCO thin films with T c (R = 0) higher than 80 K have been routinely prepared using a simple and reliable technique in which we completely electron beam evaporated weighted amounts of bulk pellets. The films were grown on MgO single crystal (100) substrates and showed, after an ex-situ annealing at high temperatures (840–880° C) for several hours, a strong preferential orientation with the c-axis perpendicular to the plane of the substrate. The films were characterized by Θ − 2Θ X-ray diffraction and EDS analysis and by paraconductivity and critical current measurements.

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Structural and compositional characterization of single crystal uranium dioxide thin films deposited on different substrates

Thin Solid Films ◽

10.1016/j.tsf.2017.07.020 ◽

2017 ◽

Vol 636 ◽

pp. 658-663 ◽

Cited By ~ 1

Author(s):

Mohamed S. Elbakhshwan ◽

Brent J. Heuser

Keyword(s):

Thin Films ◽

Single Crystal ◽

Uranium Dioxide ◽

Compositional Characterization

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Magnetron sputtering growth and characterization of high quality single crystal Ga-doped n-ZnO thin films

Semiconductor Science and Technology ◽

10.1088/0268-1242/20/9/l01 ◽

2005 ◽

Vol 20 (9) ◽

pp. L43-L46 ◽

Cited By ~ 14

Author(s):

Tae-hwan Kim ◽

Sang-Hun Jeong ◽

Il-Soo Kim ◽

Sang Sub Kim ◽

Byung-Teak Lee

Keyword(s):

Thin Films ◽

Magnetron Sputtering ◽

Single Crystal ◽

Zno Thin Films ◽

High Quality ◽

High Quality Single Crystal

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Preparation and characterization of organic superlattice thin films grown on hydrogenated silicon single-crystal substrates

Surface and Interface Analysis ◽

10.1002/sia.740210606 ◽

1994 ◽

Vol 21 (6-7) ◽

pp. 356-364 ◽

Cited By ~ 3

Author(s):

A. Ishitani ◽

T. Nonaka

Keyword(s):

Thin Films ◽

Single Crystal ◽

Silicon Single Crystal ◽

Hydrogenated Silicon

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Preparation and characterization of epitxial Co-alloy magnetic thin films on oxide single-crystal substrates

Scripta Materialia ◽

10.1016/s1359-6462(02)00608-5 ◽

2003 ◽

Vol 48 (7) ◽

pp. 929-935 ◽

Cited By ~ 14

Author(s):

Masaaki Futamoto ◽

Kouta Terayama ◽

Katsuaki Sato ◽

Yoshiyuki Hirayama

Keyword(s):

Thin Films ◽

Single Crystal ◽

Magnetic Thin Films

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Two interferometric methods for the mechanical characterization of thin films by bulging tests. Application to single crystal of silicon

Journal of Materials Research ◽

10.1557/jmr.1997.0299 ◽

1997 ◽

Vol 12 (9) ◽

pp. 2234-2248 ◽

Cited By ~ 55

Author(s):

E. Bonnotte ◽

P. Delobelle ◽

L. Bornier ◽

B. Trolard ◽

G. Tribillon

Keyword(s):

Thin Films ◽

Single Crystal ◽

Mechanical Characterization ◽

Optical Methods ◽

Fringe Projection ◽

Phase Measurements ◽

Experimental Apparatus ◽

Theory And Experiments ◽

Good Agreement

Two optical methods are presented for the mechanical characterization of thin films, namely real time holographic interferometry and a fringe projection method called “contouring.” These two methods are coupled to the interferometry by the phase measurements, thus allowing the displacement field to be measured at all points on the membrane. We discuss the solutions retained in terms of their precision and sensitivity. These methods are then applied to membrane bulging tests, a type of test that is widely used in micro-mechanical studies. The measurements are performed on silicon single crystal and the results are compared to the solutions calculated by finite element methods. In both cases, the good agreement between theory and experiments allows the experimental apparatus to be validated.

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