High Reliability Poly-Oxide Grown on in-situ Phosphorus Doped Amorphous Si

1990 ◽  
Author(s):  
Takashi KOBAYASHI ◽  
Shinpei IIJIMA ◽  
Atsushi HIRAIWA
1995 ◽  
Vol 42 (7) ◽  
pp. 1247-1254 ◽  
Author(s):  
H. Watanabe ◽  
T. Tatsumi ◽  
S. Ohnishi ◽  
H. Kitajima ◽  
I. Honma ◽  
...  

Author(s):  
Meric Firat ◽  
Hariharsudan Sivaramakrishnan Radhakrishnan ◽  
Maria Recaman Payo ◽  
Filip Duerinckx ◽  
Rajiv Sharma ◽  
...  

Micromachines ◽  
2021 ◽  
Vol 12 (4) ◽  
pp. 385
Author(s):  
Qiao Wang ◽  
Donglin Zhang ◽  
Yulin Zhao ◽  
Chao Liu ◽  
Qiao Hu ◽  
...  

Ferroelectric capacitors (FeCAPs) with high process compatibility, high reliability, ultra-low programming current and fast operation speed are promising candidates to traditional volatile and nonvolatile memory. In addition, they have great potential in the fields of storage, computing, and memory logic. Nevertheless, effective methods to realize logic and memory in FeCAP devices are still lacking. This study proposes a 1T2C FeCAP-based in situ bitwise X(N)OR logic based on a charge-sharing function. First, using the 1T2C structure and a two-step write-back circuit, the nondestructive reading is realized with less complexity than the previous work. Second, a method of two-line activation is used during the operation of X(N)OR. The verification results show that the speed, area and power consumption of the proposed 1T2C FeCAP-based bitwise logic operations are significantly improved.


Author(s):  
Amitabh Kumar ◽  
Brian McShane ◽  
Mark McQueen

A large Oil and Gas pipeline gathering system is commonly used to transport processed oil and gas from an offshore platform to an onshore receiving facility. High reliability and integrity for continuous operation of these systems is crucial to ensure constant supply of hydrocarbon to the onshore processing facility and eventually to market. When such a system is exposed to a series of complex environmental loadings, it is often difficult to predict the response path, in-situ condition and therefore the system’s ability to withstand subsequent future loading scenarios. In order to continue to operate the pipeline after a significant environmental event, an overall approach needs to be developed to — (a) Understand the system loading and the associated integrity, (b) Develop a series of criteria staging the sequence of actions following an event that will verify the pipeline integrity and (c) Ensure that the integrity management solution is simple and easy to understand so that it can be implemented consistently. For a complex loading scenario, one of the main challenges is the ability to predict the controlling parameter(s) that drives the global integrity of these systems. In such scenarios, the presence of numerous parameters makes the technical modeling and prediction tasks arduous. To address such scenarios, first and foremost, it is crucial to understand the baseline environment data and other associated critical design input elements. If the “design environmental baseline” has transformed (due to large events e.g. storms etc.) from its original condition; it modifies the dynamics of the system. To address this problem, a thorough modeling and assessment of the in-situ condition is essential. Further, a robust calibration method is required to predict the future response path and therefore expected pipeline condition. The study further compares the planned integrity management solutions to the field data to validate the efficiency of the predicted scenarios. By the inclusion of real field-data feedback to the modeling method, balanced integrity solutions can be achieved and the ability to quantify the risks is made more practical and actionable.


RSC Advances ◽  
2016 ◽  
Vol 6 (56) ◽  
pp. 51387-51393 ◽  
Author(s):  
Z. Vlčková Živcová ◽  
O. Frank ◽  
S. Drijkoningen ◽  
K. Haenen ◽  
V. Mortet ◽  
...  

Electrochemical and in situ Raman spectroelectrochemical characterization of n-type phosphorus-doped nanocrystalline diamond (P-NCD) is carried out.


1990 ◽  
Vol 201 ◽  
Author(s):  
James S. Im ◽  
Jung H. Shin ◽  
Harry A. Atwater

AbstractIn situ electron microscopy has been used to observe crystal nucleation and growth in amorphous Si films. Results demonstrate that a repeated intermediate temperature ion irradiation/thermal annealing cycle can lead to suppression of nucleation in amorphous regions without inhibition of crystal growth of existing large crystals. Fundamentally, the experimental results indicate that the population of small crystal clusters near the critical cluster size is affected by intermediate temperature ion irradiation. Potential applications of the intermediate temperature irradiation/thermal anneal cycle to lateral solid epitaxy of Si and thin film device technology are discussed.


2022 ◽  
Vol 236 ◽  
pp. 111544
Author(s):  
Meriç Fırat ◽  
Hariharsudan Sivaramakrishnan Radhakrishnan ◽  
María Recamán Payo ◽  
Patrick Choulat ◽  
Hussein Badran ◽  
...  

2019 ◽  
Vol 21 (31) ◽  
pp. 17356-17365 ◽  
Author(s):  
Katie L. Browning ◽  
James F. Browning ◽  
Mathieu Doucet ◽  
Norifumi L. Yamada ◽  
Gao Liu ◽  
...  

With the use of in situ neutron reflectometry (NR) we show how the addition of an electronically conductive polymeric binder, PEFM, mediates the solid–electrolyte interphase (SEI) formation and composition on an amorphous Si (a-Si) electrode as a function of the state-of-charge.


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